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21. 发明申请

US20060259264A1 Test apparatus, diagnosing program and diagnosing method therefor 失效
标题翻译：测试仪器，诊断程序及其诊断方法
公开(公告)号：US20060259264A1
公开(公告)日：2006-11-16
申请号：US11137861
申请日：2005-05-25
申请人： Satoshi Iwamoto
发明人： Satoshi Iwamoto
IPC分类号： G01R27/28 , G01R31/00
CPC分类号： G01R31/31901
摘要： There is provided a test apparatus having a plurality of test modules. The test apparatus stores object diagnosing programs for controlling diagnosis of the object test module to be diagnosed of a certain type per type of the test module to be diagnosed and stores, separately from it, a set of identification information of diagnostic performance board to be mounted on a test head to diagnose the object test module to be diagnosed by the respective object diagnosing programs per type of the object test modules to be diagnosed. When the diagnostic performance board is mounted on the test head, the test apparatus obtains identification information of the diagnostic performance board and executes the object diagnosing program corresponding to that type under the condition that the identification information coincides with the identification information stored correlatively with the type of the designated object test module to be diagnosed.
摘要翻译：提供了具有多个测试模块的测试装置。测试装置存储用于控制待诊断的对象测试模块的诊断对象诊断程序，每个类型的待诊断的测试模块的类型与其分开存储要安装的诊断性能板的识别信息的集合在测试头上诊断由要诊断的对象测试模块的每个对象诊断程序诊断的对象测试模块。当诊断性能板安装在测试头上时，测试设备获得诊断性能板的识别信息，并且在识别信息与与类型相关的存储的识别信息一致的条件下执行与该类型相对应的对象诊断程序的被指定对象测试模块进行诊断。

22. 发明授权

US08405415B2 Test apparatus synchronous module and synchronous method 有权
标题翻译：测试仪器同步模块和同步方式
公开(公告)号：US08405415B2
公开(公告)日：2013-03-26
申请号：US12557478
申请日：2009-09-10
申请人： Satoshi Iwamoto , Koichi Yatsuka
发明人： Satoshi Iwamoto , Koichi Yatsuka
IPC分类号： G01R31/26
CPC分类号： G01R31/31907
摘要： Provided is a test apparatus that tests a device under test, comprising a plurality of test modules that test the device under test; a synchronization module that is connected to each of the plurality of test modules, and that synchronizes the plurality of test modules; and a test control section that is connected to the plurality of test modules and the synchronization module, and that controls the test modules and the synchronization module. The synchronization module includes a receiving section that receives, from each of the plurality of test modules, a state signal indicating a state of the test module; an aggregating section that generates an aggregate state signal by calculating an aggregate of the state signals received by the receiving section; and a transmitting section that transmits, to the plurality of test modules, a control signal ordering an operation corresponding to the aggregate state signal.
摘要翻译：提供了一种测试被测设备的测试设备，包括测试被测设备的多个测试模块; 同步模块，其连接到所述多个测试模块中的每一个，并且使所述多个测试模块同步; 以及连接到所述多个测试模块和所述同步模块并且控制所述测试模块和所述同步模块的测试控制部分。所述同步模块包括从所述多个测试模块中的每一个接收指示所述测试模块的状态的状态信号的接收部分; 聚合部分，其通过计算由所述接收部分接收的所述状态信号的聚合来生成聚合状态信号; 以及发送部，其向所述多个测试模块发送排序对应于所述聚合状态信号的操作的控制信号。

23. 发明授权

US08362791B2 Test apparatus additional module and test method 有权
标题翻译：测试仪附加模块和测试方法
公开(公告)号：US08362791B2
公开(公告)日：2013-01-29
申请号：US12557468
申请日：2009-09-10
申请人： Motoo Ueda , Satoshi Iwamoto , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
发明人： Motoo Ueda , Satoshi Iwamoto , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
IPC分类号： G01R31/28 , G01R31/00
CPC分类号： G01R31/31907 , G01R31/31905
摘要： A test apparatus includes: test modules that communicate with the device under test to test the device under test; additional modules connected between the device under test and the test modules, each additional module performing a communication with the device under test, the communication being at least one of a communication performed at a higher speed and a communication performed with a lower latency, in comparison with a communication performed by the test modules; a test head having a plurality of connectors that connect the test modules and the additional modules, respectively, the test modules and the additional modules are mounted on the test head; a performance board placed on the test head that connects between at least a part of terminals of the plurality of connectors and the device under test. The test modules are connected to the additional modules without through the performance board.
摘要翻译：测试装置包括：与被测设备通信的测试模块，以测试被测设备; 连接在被测设备和测试模块之间的附加模块，每个附加模块与被测设备进行通信，所述通信是以较高速度执行的通信和以较低延迟执行的通信中的至少一个，相比之下与测试模块进行通信; 测试头具有分别连接测试模块和附加模块的多个连接器，测试模块和附加模块安装在测试头上; 放置在测试头上的性能板，其连接在多个连接器的至少一部分端子和被测设备之间。测试模块通过性能板连接到附加模块。

24. 发明申请

US20100102840A1 TEST APPARATUS ADDITIONAL MODULE AND TEST METHOD 有权
标题翻译：测试装置附加模块和测试方法
公开(公告)号：US20100102840A1
公开(公告)日：2010-04-29
申请号：US12557468
申请日：2009-09-10
申请人： Motoo UEDA , Satoshi Iwamoto , Masaru Goishi , Hiryoyasu Nakayama , Masaru Tsuto
发明人： Motoo UEDA , Satoshi Iwamoto , Masaru Goishi , Hiryoyasu Nakayama , Masaru Tsuto
IPC分类号： G01R31/02
CPC分类号： G01R31/31907 , G01R31/31905
摘要： A test apparatus includes: test modules that communicate with the device under test to test the device under test; additional modules connected between the device under test and the test modules, each additional module performing a communication with the device under test; the communication being at least one of a communication performed at a higher speed and a communication performed with a lower latency, in comparison with a communication performed by the test modules; a test head having a plurality of connectors that connect the test modules and the additional modules, respectively, the test modules and the additional modules are mounted on the test head; a performance board placed on the test head that connects between at least a part of terminals of the plurality of connectors and the device under test. The test modules are connected to the additional modules without through the performance board.
摘要翻译：测试装置包括：与被测设备通信的测试模块，以测试被测设备; 连接在被测设备和测试模块之间的附加模块，每个附加模块与被测设备进行通信; 所述通信是与由所述测试模块执行的通信相比较，以较高速度执行的通信和以较低延迟执行的通信中的至少一个通信; 测试头具有分别连接测试模块和附加模块的多个连接器，测试模块和附加模块安装在测试头上; 放置在测试头上的性能板，其连接在多个连接器的至少一部分端子和被测设备之间。测试模块通过性能板连接到附加模块。

25. 发明授权

US07158908B2 Test apparatus, diagnosing program and diagnosing method therefor 失效
标题翻译：测试仪器，诊断程序及其诊断方法
公开(公告)号：US07158908B2
公开(公告)日：2007-01-02
申请号：US11137861
申请日：2005-05-25
申请人： Satoshi Iwamoto
发明人： Satoshi Iwamoto
IPC分类号： G06F19/00
CPC分类号： G01R31/31901
摘要： There is provided a test apparatus having a plurality of test modules. The test apparatus stores object diagnosing programs for controlling diagnosis of the object test module to be diagnosed of a certain type per type of the test module to be diagnosed and stores, separately from it, a set of identification information of diagnostic performance board to be mounted on a test head to diagnose the object test module to be diagnosed by the respective object diagnosing programs per type of the object test modules to be diagnosed. When the diagnostic performance board is mounted on the test head, the test apparatus obtains identification information of the diagnostic performance board and executes the object diagnosing program corresponding to that type under the condition that the identification information coincides with the identification information stored correlatively with the type of the designated object test module to be diagnosed.
摘要翻译：提供了具有多个测试模块的测试装置。测试装置存储用于控制待诊断的对象测试模块的诊断对象诊断程序，每个类型的待诊断的测试模块的类型与其分开存储要安装的诊断性能板的识别信息的集合在测试头上诊断由要诊断的对象测试模块的每个对象诊断程序诊断的对象测试模块。当诊断性能板安装在测试头上时，测试设备获得诊断性能板的识别信息，并且在识别信息与与该类型相关的存储的识别信息一致的条件下执行与该类型相对应的对象诊断程序的被指定对象测试模块进行诊断。

26. 发明授权

US07906981B1 Test apparatus and test method 失效
标题翻译：试验装置及试验方法
公开(公告)号：US07906981B1
公开(公告)日：2011-03-15
申请号：US12557483
申请日：2009-09-10
申请人： Satoshi Iwamoto , Koichi Yatsuka
发明人： Satoshi Iwamoto , Koichi Yatsuka
IPC分类号： G01R31/02
CPC分类号： G01R31/3193 , G01R31/31726
摘要： There is provided a test apparatus for testing a device under test, including: a plurality of test sections; and a first synchronization section and a second synchronization section that, for each of a plurality of domains that respectively include one or more of the plurality of test sections, synchronize the one or more test sections included in the domain, where each of the first synchronization section and the second synchronization section includes: a local collection section that collects, for each domain, synchronization requests from the test sections connected to the corresponding synchronization section; an exchange section that exchanges, for a discrete domain of that includes test sections connected to the first synchronization section and test sections connected to the second synchronization section, synchronization requests collected in the corresponding synchronization section with synchronization requests collected in the other synchronization section; a global collection section that collects, the synchronization requests collected in the corresponding synchronization section and the synchronization requests collected in the other synchronization section; and a distribution section that distributes the collected synchronization requests to each of the test sections connected to the corresponding synchronization section.
摘要翻译：提供了一种用于测试被测设备的测试装置，包括：多个测试部分; 以及第一同步部分和第二同步部分，对于分别包括所述多个测试部分中的一个或多个的多个域中的每个，同步所述域中包括的一个或多个测试部分，其中每个所述第一同步并且所述第二同步部分包括：本地收集部分，用于针对每个域收集来自连接到相应同步部分的测试部分的同步请求; 交换部分，对于其离散域，其交换包括连接到第一同步部分的测试部分和连接到第二同步部分的测试部分，在相应的同步部分中收集的同步请求中收集的同步请求; 收集相应同步部分中收集的同步请求的全局收集部分和在另一同步部分中收集的同步请求; 以及分配部，其将收集的同步请求分发到连接到对应的同步部的每个测试部。

27. 发明授权

US07552028B2 Recording medium, test apparatus and diagnostic method 失效
标题翻译：记录介质，测试仪器和诊断方法
公开(公告)号：US07552028B2
公开(公告)日：2009-06-23
申请号：US11607824
申请日：2006-12-01
申请人： Satoshi Iwamoto
发明人： Satoshi Iwamoto
IPC分类号： G06F11/30
CPC分类号： G01R31/31907
摘要： A test apparatus that tests a device under test is provided. The test apparatus includes a test module that provides a test signal to the device under test. The test apparatus includes: a test module that provides a test signal to the device under test; a measuring instrument that measures a reference parameter including at least one of a reference voltage, a reference resistance and a reference current included in the test module; and a control device that controls the test module and the measuring instrument. By executing a diagnostic program that diagnose the plurality of test modules by using the measuring instruments, the control device to function as: a target diagnostic section that diagnoses a target test module; an acquirement section that acquires measuring instrument identification information indicative of the kind of the measuring instrument provided in the test apparatus; a measurement processing section provided for each kind of the measuring instruments and executed on the control device that issues a command to cause the measuring instrument to measure the value of the reference parameter of the test module to the measuring instrument and receives a measurement result of the reference parameter from the measuring instrument; and a switching section that calls the measurement processing section corresponding to the measuring instrument identified by the measuring instrument identification information in response to receiving the call to instruct to measure the value of a reference parameter included in the test module, executes the same and returns the measurement result of the reference parameter to the target diagnostic section.
摘要翻译：提供测试被测设备的测试设备。测试装置包括向被测设备提供测试信号的测试模块。该测试装置包括：向被测设备提供测试信号的测试模块; 测量仪器，其测量包括在所述测试模块中的参考电压，参考电阻和参考电流中的至少一个的参考参数; 以及控制测试模块和测量仪器的控制装置。通过执行通过使用测量仪器诊断多个测试模块的诊断程序，控制装置用作诊断目标测试模块的目标诊断部分; 获取部，其获取表示设置在所述测试装置中的所述测量仪器的种类的测量仪器识别信息; 测量处理部分，用于各种测量仪器，并在控制装置上执行，该控制装置发出使测量仪器测量测试模块的参考参数的值的指令，并接收测量仪器的测量结果来自测量仪器的参考参数; 以及切换部，其响应于接收到用于指示测量包括在所述测试模块中的参考参数的值的呼叫的呼叫，调用与由所述测量仪器识别信息识别的所述测量仪器相对应的所述测量处理部分，执行所述测量处理部分，并执行所述切换部分参考参数的测量结果到目标诊断部分。

28. 发明授权

US07398169B2 Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device 有权
标题翻译：测量仪器，测量方法，测试仪器，测试方法和电子设备
公开(公告)号：US07398169B2
公开(公告)日：2008-07-08
申请号：US11362536
申请日：2006-02-27
申请人： Takahiro Yamaguchi , Satoshi Iwamoto , Masakatsu Suda , Masahiro Ishida
发明人： Takahiro Yamaguchi , Satoshi Iwamoto , Masakatsu Suda , Masahiro Ishida
IPC分类号： G06F19/00
CPC分类号： G01R31/31709
摘要： There is provided a measuring apparatus for measuring a signal-under-test, having a comparator for sequentially comparing voltage values of the signal-under-test with a reference voltage value fed thereto at timing of strobe signals sequentially fed thereto, a strobe timing generator for sequentially generating the strobe signals placed almost at equal time intervals, a capture memory for storing the comparison result of the comparator and a digital signal processing section for calculating jitter of the signal-under-test based on the comparison result stored in the capture memory.
摘要翻译：提供了一种用于测量被测信号的测量装置，具有一个比较器，用于在顺序地馈送到其中的选通信号的定时顺序地比较被测信号的电压值与馈送给它的基准电压值，选通定时发生器用于顺序地产生几乎以相等的时间间隔放置的选通信号，用于存储比较器的比较结果的捕获存储器和用于基于存储在捕获存储器中的比较结果来计算待测信号的抖动的数字信号处理部分。

29. 发明授权

US07141355B2 Radiation-sensitive resin composition 有权
标题翻译：辐射敏感树脂组合物
公开(公告)号：US07141355B2
公开(公告)日：2006-11-28
申请号：US10477207
申请日：2002-12-13
申请人： Shin-ichiro Iwanaga , Satoshi Iwamoto , Tooru Kimura , Hiroko Nishimura , Koji Nishikawa
发明人： Shin-ichiro Iwanaga , Satoshi Iwamoto , Tooru Kimura , Hiroko Nishimura , Koji Nishikawa
IPC分类号： G03F7/038 , G03F7/30
CPC分类号： G03F7/033 , G03F7/405
摘要： A radiation-sensitive resin composition comprising (A) an alkali-soluble resin having an unsaturated group, (B) a compound having at least one ethylenically unsaturated double bond, and (C) a radiation-induced radical polymerization initiator, wherein: the alkali-soluble resin having an unsaturated group (A) is obtained by reacting: 100 parts by weight of a copolymer comprising 1 to 40 wt % structural units derived from (a) a radically polymerizable compound having a carboxyl group; 1 to 50 wt % structural units having a phenolic hydroxyl group which are derived from (b-1) a radically polymerizable compound having a phenolic hydroxyl group or (b-2) a radically polymerizable compound having a functional group convertible into a phenolic hydroxyl group after the copolymerization, other structural units of said copolymer being derived from (c) another radically polymerizable compound; with 0.1 to 20 parts by weight of (d) a radically polymerizable compound having an epoxy group. The resin composition can form a radiation-sensitive film in a thickness greater than a deposit thickness and has a high resolution.
摘要翻译：一种辐射敏感性树脂组合物，其包含（A）具有不饱和基团的碱溶性树脂，（B）具有至少一个烯键式不饱和双键的化合物和（C）辐射诱导的自由基聚合引发剂，其中：所述碱通过使100重量份的由（a）具有羧基的自由基聚合性化合物衍生的1〜40重量％结构单元的共聚物反应得到具有不饱和基团（A）的可溶性树脂; （b-1）具有酚羟基的自由基聚合性化合物或（b-2）具有可转化为酚羟基的官能团的自由基聚合性化合物的酚羟基的1〜50重量％结构单元共聚后，所述共聚物的其它结构单元衍生自（c）另一种可自由基聚合的化合物; （d）具有环氧基的自由基聚合性化合物为0.1〜20重量份。树脂组合物可以形成厚度大于沉积物厚度的辐射敏感膜并具有高分辨率。

30. 发明申请

US20060086971A1 Semiconductor device and method for fabricating the same 有权
标题翻译：半导体装置及其制造方法
公开(公告)号：US20060086971A1
公开(公告)日：2006-04-27
申请号：US11152114
申请日：2005-06-15
申请人： Nobuyoshi Takahashi , Satoshi Iwamoto , Fumihiko Noro , Masatoshi Arai
发明人： Nobuyoshi Takahashi , Satoshi Iwamoto , Fumihiko Noro , Masatoshi Arai
IPC分类号： H01L29/792 , H01L21/336
CPC分类号： H01L27/11568 , H01L21/823878 , H01L27/105 , H01L27/1052 , H01L27/11573 , H01L29/792 , Y10S438/954
摘要： A semiconductor device includes a memory section formed at a semiconductor substrate and including a first transistor having an ONO film that can store charges between the semiconductor substrate and a memory electrode and a first STI region for isolating the first transistor, and a CMOS section formed at the semiconductor substrate and including a second transistor having a CMOS electrode and a gate dielectric and a second STI region for isolating the second transistor. The height of the top surface of the first STI region is set equal to or smaller than the height of the top surface of the second STI region.
摘要翻译：一种半导体器件包括形成在半导体衬底上的存储器部分，并且包括具有可存储半导体衬底和存储电极之间的电荷的ONO膜的第一晶体管和用于隔离第一晶体管的第一STI区域和形成在半导体衬底并且包括具有CMOS电极和栅极电介质的第二晶体管和用于隔离第二晶体管的第二STI区域。第一STI区域的顶表面的高度被设定为等于或小于第二STI区域的顶表面的高度。

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