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    • 21. 发明授权
    • Sense amplifier bias circuit for a memory having at least two distinct resistance states
    • 用于具有至少两个不同电阻状态的存储器的感测放大器偏置电路
    • US06700814B1
    • 2004-03-02
    • US10283622
    • 2002-10-30
    • Joseph J. NahasThomas W. AndreBradley J. Garni
    • Joseph J. NahasThomas W. AndreBradley J. Garni
    • G11C1100
    • G11C7/06G11C2207/063
    • In a memory, a bias circuit (112, 212, 312, 412) uses a current reference (108) for providing a reference current and control circuitry (106, 120) to bias a sense amplifier (114) with a varying voltage (VB). The varying voltage maintains current through MRAM bit cells (177-179) at a value proportional to the reference current over variations in average bit cell resistance with immunity to variations in process, supply voltage and temperature. In one form, a mock sense amplifier (122, 126, 132, 134) and mock array of bit cells (130, 136) are used to establish internal steady state voltages equivalent to a steady state condition of the sense amplifier with equalized outputs and to generate the varying bias voltage. Matching diode-connected transistors in each of the control circuitry and either the mock sense amplifier or the sense amplifier is used to generate the varying bias voltage.
    • 在存储器中,偏置电路(112,212,312,412)使用电流参考(108)来提供参考电流和控制电路(106,120)以使具有变化电压(VB)的读出放大器(114)偏置 )。 变化的电压通过MRAM位单元(177-179)保持与参考电流成比例的值,与平均位单元电阻的变化相反,具有对工艺,电源电压和温度变化的抗扰性。 在一种形式中,使用模拟读出放大器(122,126,132,134)和位单元(130,136)的模拟阵列来建立与具有均衡输出的读出放大器的稳态条件相当的内部稳态电压, 以产生变化的偏置电压。 每个控制电路和模拟读出放大器或读出放大器中的匹配二极管连接的晶体管用于产生变化的偏置电压。
    • 22. 发明授权
    • Method and circuitry for identifying weak bits in an MRAM
    • 用于识别MRAM中弱位的方法和电路
    • US06538940B1
    • 2003-03-25
    • US10255303
    • 2002-09-26
    • Joseph J. NahasThomas W. AndreBradley J. Garni
    • Joseph J. NahasThomas W. AndreBradley J. Garni
    • G11C700
    • G11C29/12005G11C11/16G11C29/12
    • A memory (10, 60) having at least two resistance states is tested. In one form, the memory includes a first transistor (16, 68) having a current electrode coupled to a memory cell (14, 64) and a second transistor (26, 66) having a current electrode coupled to a reference memory cell (28, 74). The control electrode of the first transistor receives either a first reference voltage or a second reference voltage based on a test control signal, and the control electrode of a second transistor receives the first reference voltage. In a test mode, after the memory cell is programmed with a resistance state, the second reference voltage (different from the first reference voltage) is provided to the first transistor. The memory cell is then read to determine whether the memory can sense the previously programmed resistance state. In one embodiment, this test mode can be used to identify weak bits in the memory.
    • 测试具有至少两个电阻状态的存储器(10,60)。 在一种形式中,存储器包括具有耦合到存储器单元(14,64)的电流电极的第一晶体管(16,68)和具有耦合到参考存储器单元(28)的电流电极的第二晶体管(26,66) ,74)。 第一晶体管的控制电极基于测试控制信号接收第一参考电压或第二参考电压,并且第二晶体管的控制电极接收第一参考电压。 在测试模式中,在存储单元被编程为电阻状态之后,将第二参考电压(不同于第一参考电压)提供给第一晶体管。 然后读取存储器单元以确定存储器是否可以感测到先前编程的电阻状态。 在一个实施例中,该测试模式可用于识别存储器中的弱位。
    • 23. 发明授权
    • Accelerated life test of MRAM cells
    • MRAM细胞加速寿命试验
    • US06894937B2
    • 2005-05-17
    • US10672959
    • 2003-09-26
    • Bradley J. GarniThomas W. AndreJoseph J. Nahas
    • Bradley J. GarniThomas W. AndreJoseph J. Nahas
    • G11C11/15G11C29/50G11C29/00
    • G11C29/50G11C11/16G11C2029/5002
    • A circuit provides a stress voltage to magnetic tunnel junctions (MTJs), which comprise the storage elements of a magnetoresitive random access memory (MRAM), during an accelerated life test of the MRAM. The stress voltage is selected to provide a predetermined acceleration of aging compared to normal operation. A source follower circuit is used to apply a stress voltage to a subset of the memory cells at given point in time during the life test. The stress voltage is maintained at the desired voltage by a circuit that mocks the loading characteristics of the portion of the memory array being stressed. The result is a closely defined voltage applied to the MTJs so that the magnitude of the acceleration is well defined for all of the memory cells.
    • 在MRAM的加速寿命测试期间,电路向包括磁阻随机存取存储器(MRAM)的存储元件的磁隧道结(MTJ)提供应力电压。 选择应力电压以提供与正常操作相比预定的老化加速度。 源极跟随器电路用于在寿命测试期间的给定时间点将应力电压施加到存储器单元的子集。 应力电压通过嘲笑存储器阵列部分的负载特性受到应力的电路保持在所需电压。 结果是施加到MTJ的紧密定义的电压,使得对于所有存储器单元良好地限定加速度的大小。
    • 25. 发明授权
    • Low voltage reference circuit and method of operation
    • 低电压参考电路和操作方法
    • US5614816A
    • 1997-03-25
    • US560876
    • 1995-11-20
    • Joseph J. Nahas
    • Joseph J. Nahas
    • G05F3/30G05F3/24H03F1/30G05F3/16
    • G05F3/245Y10S323/907
    • A voltage reference generator circuit (600) that operates at low voltages may be obtained by using a summation circuit (618) to combine a divided bipolar junction voltage signal (616) and a multiplied voltage signal (622) that is proportional to absolute temperature. The voltage reference generator circuit (600) generates a voltage reference which is divided by a divide circuit (620) which produces the divided signal (616), and a voltage reference which is multiplied by a multiply circuit (630) which produces the multiplied signal (622). In another form, a bipolar junction voltage and a voltage that is proportional to absolute temperature may be converted to currents and summed to provide a current which is converted into the reference voltage output.
    • 可以通过使用求和电路(618)来组合分压双极结电压信号(616)和与绝对温度成正比的倍增电压信号(622)来获得在低电压下工作的电压参考发生器电路(600)。 电压基准发生器电路(600)生成由产生分频信号(616)的除法电路(620)分压的电压基准,以及乘以产生相乘信号的乘法电路(630)的电压基准 (622)。 在另一种形式中,双极结电压和与绝对温度成比例的电压可以转换为电流并相加以提供转换为参考电压输出的电流。
    • 27. 发明授权
    • Method and apparatus for simulating a magnetoresistive random access memory (MRAM)
    • 用于模拟磁阻随机存取存储器(MRAM)的方法和装置
    • US07082389B2
    • 2006-07-25
    • US10302203
    • 2002-11-22
    • Joseph J. Nahas
    • Joseph J. Nahas
    • G06F17/50
    • G06F17/5036
    • A method and apparatus (500) for simulating a magnetoresistive random access memory (MRAM) (102) uses non-linear functions to model both non-linear magnetic tunnel junction (MTJ) effects and non-linear state switching effects. The method includes calculating a high threshold (THI) and a low threshold (TLO) based on a function of the hard axis current (IH). The easy axis current (IE) is compared to the high threshold (THI). If the easy axis current is greater than the high threshold, the MTJ resistance (RHI) is set to represent a stored high value. The easy axis current is compared to the low threshold. If the easy axis current is less than the low threshold, the MTJ resistance (RLO) is set to represent a stored low value. By using non-linear functions to model the MTJ effects and switching effects, the behavior of an MRAM (102) can be more accurately simulated.
    • 用于模拟磁阻随机存取存储器(MRAM)(102)的方法和装置(500)使用非线性函数来模拟非线性磁隧道结(MTJ)效应和非线性状态切换效应。 该方法包括基于硬轴电流(I H H)的函数来计算高阈值(T HI)和低阈值(T LO) SUB>)。 将易轴电流(I E E)与高阈值(T HI)进行比较。 如果容易轴电流大于高阈值,则将MTJ电阻(R SUB HI)设置为表示存储的高值。 将易轴电流与低阈值进行比较。 如果容易轴电流小于低阈值,则将MTJ电阻(R LO LO)设置为表示存储的低值。 通过使用非线性函数来建模MTJ效应和切换效果,可以更精确地模拟MRAM(102)的行为。
    • 28. 发明授权
    • Fraud prevention in an electronic coin telephone set
    • 电子硬币电话机中的欺诈预防
    • US4674114A
    • 1987-06-16
    • US882348
    • 1986-07-07
    • Paul E. CrouchJoseph J. NahasHoward Ng
    • Paul E. CrouchJoseph J. NahasHoward Ng
    • G07F1/04H04M17/02H04M17/00
    • G07F1/04H04M17/023
    • In an electronic coin telephone set, a fraud prevention arrangement prevents fraudulent coin tones originating at a telephone transmitter from being provided to a central office over a coin subscriber loop. The arrangement comprises a first and second transmission channel for alternately connecting the transmitter to the central office and also a fraud filter disposed in the second transmission channel. The fraud filter attenuates a selected frequency originating at the transmitter that is indicative of coin deposits. When coin deposits are not required by the central office, the transmitter is connected to the central office through the first transmission channel. When coin deposits are required by the central office, however, the arrangement connects the transmitter to the central office through the second transmission channel thereby avoiding the fraudulent generating of coin tones through the telephone transmitter.
    • 在电子硬币电话机中,防欺诈装置可以防止在电话发送器发起的欺诈性硬币通过硬币用户回路提供给中心局。 该装置包括用于将发射机交替地连接到中心局的第一和第二传输信道,以及布置在第二传输信道中的欺诈过滤器。 欺诈滤波器衰减起始于指示硬币存储的发射机的选定频率。 当中央办公室不需要硬币存款时,发送器通过第一个传输通道连接到中心局。 然而,当中心局需要硬币存款时,该装置通过第二传输信道将发射机连接到中心局,从而避免通过电话发射机欺骗性地产生硬币音。
    • 29. 发明授权
    • Keypad logic interface circuit
    • 键盘逻辑接口电路
    • US4357496A
    • 1982-11-02
    • US202950
    • 1980-11-30
    • Joseph J. Nahas
    • Joseph J. Nahas
    • H04M1/50
    • H04M1/505
    • A keypad logic interface circuit (200) provides a switch closure output signal representative of a selected one of a plurality of digits on a crosspoint contact array keypad (100). The selected one of the plurality of digits provides the switch closure signal by diverting a source current (225) from a first to a second direction. The circuit encodes each one of four column outputs from the keypad into a two-bit code. An output signal from two or more columns at the same time causes the circuit to produce an inhibit output signal reflecting a multiple button-push condition. The circuit also encodes each of four row outputs from the keypad into a two-bit code and produces an inhibit output signal when multiple row output signals are received.
    • 键盘逻辑接口电路(200)提供代表交叉点触点阵列键盘(100)上的多个数字中选定的一个的开关闭合输出信号。 通过将源电流(225)从第一方向转移到第二方向,所述多个数字中的所选择的一个提供开关闭合信号。 电路将键盘中四列输出中的每一列编码为两位代码。 来自两个或更多个列的输出信号同时导致电路产生反映多个按钮推送状态的禁止输出信号。 该电路还将从键盘的四行输出中的每一行编码为两位代码,并在接收到多行输出信号时产生禁止输出信号。