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    • 22. 发明授权
    • Scanning type exposure apparatus
    • 扫描型曝光装置
    • US06259511B1
    • 2001-07-10
    • US09450566
    • 1999-11-30
    • Susumu MakinouchiToshio Ueda
    • Susumu MakinouchiToshio Ueda
    • G03B2742
    • G03F7/70358G03F7/70725G03F7/70775
    • A scanning type exposure apparatus includes a mask stage which can move a mask along a predetermined scanning direction; a substrate stage which can move a substrate, onto which a pattern on the mask is to be transferred, along the scanning direction; a fine movement stage which is arranged on one of the mask stage and the substrate stage, and is movable along the scanning direction relative to the one stage; a first measuring device for detecting the position, along the scanning direction, of the fine movement stage; a second measuring device for detecting the position, along the scanning direction, of the other one of the mask stage and the substrate stage; a speed controller for controlling the ratio between the speeds of the mask stage and the substrate stage to a predetermined value while the pattern on the mask is scanning-exposed on the substrate; and a control device for controlling the position of the fine movement stage in accordance with the difference between the position measured by the first measuring device and the position measured by the second measuring device during the scanning exposure.
    • 扫描型曝光装置包括可沿着预定扫描方向移动掩模的掩模台; 可以沿扫描方向移动掩模上的图案要被转印的基板的基板台; 配置在掩模载台和基板台之一上的细移动台,能够相对于一个台沿着扫描方向移动; 第一测量装置,用于沿着扫描方向检测微动台的位置; 第二测量装置,用于检测掩模台和衬底台中另一个沿着扫描方向的位置; 速度控制器,用于在掩模上的图案在基板上扫描曝光时,将掩模载物台和基板载物台的速度之比控制为预定值; 以及控制装置,用于根据在扫描曝光期间由第一测量装置测量的位置与由第二测量装置测量的位置之间的差异来控制微动载台的位置。
    • 23. 发明授权
    • Exposure apparatus
    • 曝光装置
    • US06188464B1
    • 2001-02-13
    • US09289614
    • 1999-04-12
    • Susumu Makinouchi
    • Susumu Makinouchi
    • G03B2742
    • G03F7/70358G03B27/42G03F7/70725G03F7/70775
    • A scanning type exposure apparatus comprises a mask stage position-measuring unit, a substrate stage position-measuring unit, an arithmetic processing unit, and a control unit. The arithmetic processing unit multiplies results of measurement (WX, WY, W&thgr;) by the substrate position-measuring unit by a conversion vector comprising components containing a magnification of a projection optical system and an angle of rotation between a mask and a substrate to determine a target vector quantity (RX*, RY*, R&thgr;*) of a mask stage. An error vector is determined by subtracting, from the target vector quantity, results of measurement (RX, RY, R&thgr;) by the mask stage position-measuring unit. The controller controls the mask stage so that the error vector becomes zero. The exposure apparatus includes correcting sections for correcting time lags in measurement by the respective position-measuring units. The arithmetic processing unit uses corrected positional information. The mask stage can accurately follow a substrate stage.
    • 扫描型曝光装置包括掩模台位置测量单元,基板台位置测量单元,运算处理单元和控制单元。 算术处理单元将基片位置测量单元的测量结果(WX,WY,Wtheta)乘以包含投影光学系统的放大倍率和掩模与基板之间的旋转角度的分量的转换矢量,以确定 掩模阶段的目标矢量数量(RX *,RY *,Rθ* *)。 通过从掩模台位置测量单元从目标矢量量减去测量结果(RX,RY,Rθ)来确定误差向量。 控制器控制掩模级,使得误差向量变为零。 曝光装置包括用于通过各个位置测量单元来校正测量中的时间滞后的校正部分。 算术处理单元使用校正的位置信息。 掩模阶段可以准确地跟随衬底阶段。
    • 27. 发明授权
    • Movable-body apparatus, exposure apparatus, exposure method, and device manufacturing method
    • 移动体装置,曝光装置,曝光方法以及装置的制造方法
    • US08390780B2
    • 2013-03-05
    • US12330119
    • 2008-12-08
    • Susumu MakinouchiToru ImaiAkihiro Watanabe
    • Susumu MakinouchiToru ImaiAkihiro Watanabe
    • G03B27/42
    • G01D5/38G01D5/266G03F7/70716G03F7/70775
    • A moving grating is arranged on a side of a wafer stage, a light source irradiates a light to the moving grating, diffracted lights generated from the moving grating are interfered by fixed scales and an index scale of which positional relation with the light source is fixed, and a detection instrument detects the interfered light. In this case, since the moving grating is arranged on a side of the wafer stage, upsizing of the entire wafer stage can be suppressed. Further, since interference occurs between a plurality of diffracted lights (e.g., the ±1st-order diffracted light) passing extremely close optical paths, influence caused by a fluctuation of ambient atmosphere becomes less in comparison to conventional interferometers, and thus, a high-precision measurement of positional information of the movable body is possible.
    • 移动光栅布置在晶片台的一侧,光源将光照射到移动光栅,由移动光栅产生的衍射光被固定的刻度干扰,并且与光源的位置关系固定的折射率 并且检测仪器检测被干扰的光。 在这种情况下,由于移动光栅布置在晶片台的一侧,因此可以抑制整个晶片台的大型化。 此外,由于在通过非常接近的光路的多个衍射光(例如±1级衍射光)之间发生干涉,所以与常规干涉仪相比,由环境大气的波动引起的影响变小, 移动体的位置信息的精度测量是可能的。
    • 29. 发明申请
    • Encoder
    • 编码器
    • US20070267571A1
    • 2007-11-22
    • US11798255
    • 2007-05-11
    • Susumu MakinouchiToru ImaiAkihiro Watanabe
    • Susumu MakinouchiToru ImaiAkihiro Watanabe
    • G01D5/34
    • G01D5/38
    • When an incident light is obliquely incident on an index scale, the optical path length of light A becomes longer than the optical path length of light B and an optical path length difference occurs, which causes a phase difference in both of the diffracted lights incident on a photodetection element. According to the phase difference, intensity of a photoelectric detection signal output from the photodetection element changes. That is, due to a periodic change in the incident angle of the incident light, the phase difference between light A and light B is modulated, and the interference signal becomes greatly modulated.
    • 当入射光倾斜地入射到指数刻度上时,光A的光程长度比光B的光路长度长,并且产生光程长度差,导致入射到的两个衍射光的相位差 光电检测元件。 根据相位差,从光检测元件输出的光电检测信号的强度变化。 也就是说,由于入射光的入射角度的周期性变化,光A和光B之间的相位差被调制,并且干扰信号变得很大地被调制。
    • 30. 发明授权
    • Scanning exposure apparatus and method
    • 扫描曝光装置和方法
    • US06633363B1
    • 2003-10-14
    • US09662340
    • 2000-09-14
    • Susumu Makinouchi
    • Susumu Makinouchi
    • G03B2742
    • G03F7/70691G03F7/70358G03F7/70725G03F9/70
    • A scanning exposure apparatus and method for synchronously moving a mask and a substrate with respect to an exposing radiation flux to project an image of a mask pattern on the mask onto the substrate, includes an alignment sensor detecting the initial rotational angle of the mask relative to the substrate, a mask position detector, a substrate position detector, a calculation unit processing the position signals of the mask and the substrate in accordance with the projection ratio of the projection optical system and the initial rotational angle of the mask relative to the substrate to derive a positional deviation of the mask stage relative to the substrate stage, and a controller controlling the mask stage movement and the substrate stage movement to eliminate the positional deviation.
    • 一种扫描曝光装置和方法,用于相对于曝光辐射通量同步移动掩模和衬底,以将掩模上的掩模图案的图像投影到衬底上,包括对准传感器,其检测掩模相对于掩模的初始旋转角度 基板,掩模位置检测器,基板位置检测器,计算单元,根据投影光学系统的投影比和掩模相对于基板的初始旋转角度对掩模和基板的位置信号进行处理, 导出掩模台相对于基板台的位置偏移,以及控制掩模台移动和基板台移动以消除位置偏差的控制器。