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    • 23. 发明授权
    • Stage device and exposure apparatus using the same
    • 舞台装置和使用其的曝光装置
    • US06177978B1
    • 2001-01-23
    • US08901792
    • 1997-07-28
    • Nobushige Korenaga
    • Nobushige Korenaga
    • G03B2742
    • G03F7/70358G03F7/70716G03F7/70725G03F7/70825G03F7/70833G03F7/709H01L21/682
    • A scanning exposure apparatus having a stage device. The apparatus includes a reticle stage for moving a reticle having a pattern, a wafer stage for moving a wafer in a timed relation with the movement of the reticle stage and an optical system for projecting the pattern of the reticle onto the wafer. At least one of the reticle stage and the wafer stage includes (i) a movable stage movable along a path having a constant speed movement region and an acceleration region, (ii) a first thrust producing device for moving, with acceleration, the movable stage in the acceleration region of the paths and (iii) a second thrust producing device, separate from the first thrust producing device, for moving the movable stage at a constant speed in the constant speed movement region of the path. The second thrust producing device includes a linear motor.
    • 一种具有舞台装置的扫描曝光装置。 该装置包括用于移动具有图案的掩模版的掩模版平台,用于与刻线台的移动以定时关系移动晶片的晶片台和用于将掩模版图案投影到晶片上的光学系统。 标线片台和晶片台中的至少一个包括(i)沿着具有恒定速度运动区域和加速度区域的路径可移动的可移动台,(ii)第一推力产生装置,用于加速地移动可移动台 在所述路径的加速区域中,和(iii)与所述第一推力产生装置分离的第二推力产生装置,用于在所述路径的恒定速度运动区域中以恒定速度移动所述可移动台。 第二推力产生装置包括线性马达。
    • 24. 发明授权
    • Stage mechanism for exposure apparatus
    • 曝光装置的舞台机构
    • US6128069A
    • 2000-10-03
    • US41103
    • 1998-03-12
    • Nobushige Korenaga
    • Nobushige Korenaga
    • G03B27/42G03F7/20G03B27/58G03B27/62
    • G03F7/70691G03B27/42G03F7/70358
    • A stage mechanism includes a first stage being movable in a first direction and along a base table, a second stage being movable in a second direction, intersecting the first direction, and along the base table, while being guided by a guide provided on the first stage, first and second fluid static pressure applying devices for supporting, with fluid, the first and second stages, respectively, upon the base table, and first and second preloading magnet units provided on the first and second stages, respectively, for attracting the first and second stages toward the base table, respectively. At least one of the first and second preloading magnet units includes a plurality of rectangular magnet pieces.
    • 舞台机构包括第一舞台,其可沿第一方向移动并且沿底座移动,第二舞台可沿与第一方向交叉的第二方向和沿着底座平台移动,同时由设置在第一方向上的导轨 第一和第二流体静压施加装置,用于分别在基台上分别支撑第一和第二级的流体,以及分别设置在第一和第二级上的第一和第二预加载磁体单元,以吸引第一和第二级 和分别朝基地台的第二阶段。 第一和第二预加载磁体单元中的至少一个包括多个矩形磁体块。
    • 28. 发明申请
    • EXPOSURE APPARATUS AND ARTICLE MANUFACTURING METHOD
    • 曝光装置和制品制造方法
    • US20110310366A1
    • 2011-12-22
    • US13157618
    • 2011-06-10
    • Yuji MaeharaNobushige Korenaga
    • Yuji MaeharaNobushige Korenaga
    • G03B27/52G03B27/32
    • G03F7/70875B82Y10/00B82Y40/00H01J37/20H01J37/3174H01J2237/2001H01J2237/2482
    • An apparatus for exposing a substrate to an energy in a vacuum includes a substrate stage having a mirror surface; a mirror configured to deflect a light into a Z axis direction; a measuring device configured to measure the stage position in the Z axis direction with the light in which the mirror surface is irradiated; a driving device configured to move the measuring device so that the mirror surface is irradiated with the light; an optical system configured to project the energy onto the substrate; and a cooling device including a radiation plate (arranged between the optical system and the stage in the Z axis direction and having a first opening which the energy passes and a second opening which the light passes), including a cooler configured to cool the first radiation plate, and configured to perform radiation cooling of the substrate.
    • 用于将衬底暴露于真空中的能量的装置包括具有镜面的衬底台; 配置为将光偏转到Z轴方向的反射镜; 测量装置,被配置为用照射所述镜面的光来测量所述Z轴方向上的所述平台位置; 驱动装置,其构造成使所述测量装置移动,使得所述镜面被所述光照射; 配置成将能量投射到基板上的光学系统; 以及冷却装置,其包括辐射板(布置在所述光学系统和所述台架之间的Z轴方向上并且具有所述能量通过的第一开口和所述光通过的第二开口),所述冷却装置包括冷却器,所述冷却器被配置为冷却所述第一辐射 并且被配置为执行基板的辐射冷却。
    • 29. 发明申请
    • IMPRINT APPARATUS AND MANUFACTURING METHOD OF COMMODITIES
    • 商品的印刷设备和制造方法
    • US20110084423A1
    • 2011-04-14
    • US12902552
    • 2010-10-12
    • Nobushige KORENAGA
    • Nobushige KORENAGA
    • B29C59/02
    • H01L21/67121B82Y10/00B82Y40/00G03F7/0002H01L21/67092Y10S977/887
    • The present invention provides an imprint apparatus including a mold and a stage that holds a substrate, the imprint apparatus executing a curing process of curing a resin while the mold and the resin applied to the substrate contact and a demolding process of releasing the mold from the resin cured in the curing process, the imprint apparatus including a structure that holds the mold, a pillar that supports the structure mechanically independently from the stage through an anti-vibration mount that reduces propagation of vibration, and a force providing unit that provides, to the structure, force in an opposite direction from a direction of force generated in the structure by providing demolding force to the mold during the demolding process.
    • 本发明提供了一种压印装置,其包括模具和保持基板的台架,所述压印装置在施加到所述基板的模具和树脂接触的同时执行固化树脂的固化过程以及从所述模具脱模的脱模过程 在固化过程中固化的树脂,所述压印装置包括保持模具的结构,通过减少振动传播的防振支架而机械地独立于舞台的结构支撑的支柱;以及力提供单元, 该结构通过在脱模过程中向模具提供脱模力而在与结构中产生的力的方向相反的方向上施力。
    • 30. 发明授权
    • Exposure apparatus and device manufacturing method
    • 曝光装置和装置制造方法
    • US07307692B2
    • 2007-12-11
    • US11091590
    • 2005-03-29
    • Nobushige KorenagaNaosuke Nishimura
    • Nobushige KorenagaNaosuke Nishimura
    • G03B27/52G03B27/42G03B27/58
    • G03F7/70775G03F7/70641G03F7/70733
    • The start of exposure or a process delays because reference alignment such as abutment must be executed along the optical axis after a substrate stage is moved between the exposure position and the processing position. To solve this problem, an exposure apparatus according to this invention includes an exposure optical system which exposes a substrate to a pattern, a substrate processing system which performs a predetermined process for the substrate at a position apart from the exposure optical system, a substrate stage which moves along a plane perpendicular to the optical axis of the exposure optical system, and a measurement device which continuously measures the position of the substrate stage along the optical axis in the moving range of the substrate stage while the substrate stage moves from below the substrate processing system to below the exposure optical system.
    • 曝光开始或处理延迟,因为在曝光位置和处理位置之间移动衬底台之后,必须沿着光轴执行诸如邻接的参考对准。 为了解决这个问题,根据本发明的曝光装置包括曝光光学系统,其将衬底暴露于图案;衬底处理系统,其在离开曝光光学系统的位置处对衬底执行预定的处理;衬底台 其沿着与曝光光学系统的光轴垂直的平面移动;以及测量装置,其在衬底台从衬底的下方连续地测量衬底台的移动范围中沿着光轴的位置的位置 处理系统到曝光光学系统下方。