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    • 21. 发明授权
    • Compliant printed circuit socket diagnostic tool
    • 符合印刷电路插座诊断工具
    • US08928344B2
    • 2015-01-06
    • US13266907
    • 2010-05-27
    • James Rathburn
    • James Rathburn
    • G01R31/00G01R31/28G01R31/02
    • G01R31/2889G01R31/024Y10T29/49004
    • Diagnostic tools for testing integrated circuit (IC) devices, and a method of making the same. The first diagnostic tool includes a first compliant printed circuit with a plurality of contact pads configured to form an electrical interconnect at a first interface between proximal ends of contact members in the socket and contact pads on a printed circuit board (PCB). A plurality of printed conductive traces electrically couple to a plurality of the contact pads on the first compliant printed circuit. A plurality of electrical devices are printed on the first compliant printed circuit at a location external to the first interface. The electrical devices are electrically coupled to the conductive traces and programmed to provide one or more of continuity testing at the first interface or functionality of the IC devices. A second diagnostic tool includes a second compliant printed circuit electrically coupled to a surrogate IC device.
    • 用于测试集成电路(IC)器件的诊断工具及其制作方法。 第一诊断工具包括具有多个接触焊盘的第一顺应印刷电路,其被配置为在插座中的接触构件的近端和印刷电路板(PCB)上的接触焊盘之间的第一界面处形成电互连。 多个印刷导电迹线电耦合到第一顺应印刷电路上的多个接触焊盘。 多个电气设备被印刷在第一接合印刷电路上的位于第一接口外部的位置处。 电气设备电耦合到导电迹线并被编程为在IC器件的第一接口或功能性处提供一个或多个连续性测试。 第二诊断工具包括电耦合到替代IC器件的第二顺应印刷电路。
    • 22. 发明授权
    • Compliant wafer level probe assembly
    • 符合晶圆级探头组件
    • US08803539B2
    • 2014-08-12
    • US13266522
    • 2010-05-25
    • James Rathburn
    • James Rathburn
    • G01R1/067
    • G01R1/07314
    • A probe assembly that acts as a temporary interconnect between terminals on a circuit member and a test station. The probe assembly can include a base layer of a dielectric material printed onto a surface of a fixture. The surface of the fixture can have a plurality of cavities. A plurality of discrete contact members can be formed in the plurality of cavities in the fixture and coupled to the base layer. A plurality of conductive traces can be printed onto an exposed surface of the base layer and electrically coupled with proximal ends of one or more of the discrete contact members. A compliant layer can be deposited over the conductive traces and the proximal ends of the contact members. A protective layer can be deposited on the compliant layer such that when the probe assembly is removed from the fixture the distal ends of the contact members contact terminals on the circuit member and the conductive traces electrically couple the circuit member to a test station. Electrical devices on the probe assembly can communicate with the test station to provide adaptive testing.
    • 探针组件,用作电路元件端子和测试台之间的临时互连。 探针组件可以包括印刷在固定装置的表面上的电介质材料的基层。 固定装置的表面可以具有多个空腔。 多个离散的接触构件可以形成在固定装置中的多个空腔中并且耦合到基层。 多个导电迹线可以印刷到基底层的暴露表面上并与一个或多个离散接触构件的近端电耦合。 柔性层可以沉积在导电迹线和接触构件的近端上。 保护层可以沉积在柔性层上,使得当探针组件从固定装置移除时,接触构件的远端接触电路构件上的端子,并且导电迹线将电路构件电耦合到测试台。 探头组件上的电气设备可以与测试台通信以提供自适应测试。
    • 27. 发明申请
    • COMPLIANT PRINTED CIRCUIT WAFER PROBE DIAGNOSTIC TOOL
    • 合格打印电路探头检测工具
    • US20120062270A1
    • 2012-03-15
    • US13318038
    • 2010-05-27
    • James Rathburn
    • James Rathburn
    • G01R31/26
    • G01R31/2889G01R31/024H01L2224/16225
    • Diagnostic tools for testing wafer-level IC devices, and a method of making the same. The first diagnostic tool can include a first compliant printed circuit with a plurality of contact pads configured to form an electrical interconnect at a first interface between distal ends of probe members in the wafer probe and contact pads on a wafer-level IC device. A plurality of printed conductive traces electrically couple to a plurality of the contact pads on the first compliant printed circuit. A plurality of electrical devices are printed on the first compliant printed circuit at a location away from the first interface. The electrical devices are electrically coupled to the conductive traces and are configured to provide one or more of continuity testing or functionality of the wafer-level IC devices. A second diagnostic tool includes a second compliant printed circuit electrically coupled to a dedicated IC testing device. A plurality of electrical devices are printed on the second compliant printed circuit and electrically coupled to the dedicated IC device.
    • 用于测试晶圆级IC器件的诊断工具及其制作方法。 第一诊断工具可以包括具有多个接触焊盘的第一顺应印刷电路,其被配置为在晶片探针中的探针部件的远端和晶片级IC器件上的接触焊盘之间的第一接口处形成电互连。 多个印刷导电迹线电耦合到第一顺应印刷电路上的多个接触焊盘。 在远离第一接口的位置处,在第一顺应印刷电路上印刷多个电气设备。 电气设备电耦合到导电迹线并且被配置为提供晶片级IC器件的连续性测试或功能的一个或多个。 第二诊断工具包括电耦合到专用IC测试装置的第二顺应印刷电路。 多个电气设备印刷在第二顺应印刷电路上并电耦合到专用IC器件。
    • 28. 发明申请
    • SINGULATED SEMICONDUCTOR DEVICE SEPARABLE ELECTRICAL INTERCONNECT
    • 单相半导体器件可分离电气互连
    • US20120058653A1
    • 2012-03-08
    • US13319228
    • 2010-06-28
    • James Rathburn
    • James Rathburn
    • H01R12/71
    • G01R3/00G01R1/0491G01R1/0735Y10T29/49126Y10T29/49128Y10T29/49155Y10T29/49169Y10T29/49204Y10T29/49222
    • A socket assembly that forms a solderless electrical interconnection between terminals on a singulated integrated circuit device and another circuit member. The socket housing has an opening adapted to receive the singulated integrated circuit device. The compliant printed circuit is positioned relative to the socket housing to electrically couple with the terminals on a singulated integrated circuit device located in the opening. The compliant printed circuit includes a dielectric base layer printed onto a surface of a fixture, while leaving cavities in the surface of the fixture exposed. A plurality of contact members are formed in the plurality of cavities in the fixture and coupled to the dielectric base layer. The contact members are exposed wherein the compliant printed circuit is removed from the fixture. At least one dielectric layer with recesses corresponding to a target circuit geometry is printed on the dielectric base layer. A conductive material is deposited in at least a portion of the recesses to form conductive traces electrically coupling the contact members to the other circuit member.
    • 插座组件,其在单个集成电路器件和另一个电路部件之间形成端子之间的无焊接电气互连。 插座壳体具有适于容纳单个集成电路装置的开口。 顺应印刷电路相对于插座壳体定位,以在位于开口中的单个集成电路装置上与端子电耦合。 柔性印刷电路包括印刷在固定装置表面上的电介质基层,同时在固定装置表面露出空腔。 多个接触构件形成在固定装置中的多个空腔中,并与电介质基底层耦合。 接触构件被暴露,其中柔性印刷电路从固定装置移除。 具有对应于目标电路几何形状的凹部的至少一个电介质层被印刷在电介质基底层上。 导电材料沉积在凹陷的至少一部分中以形成将接触构件电耦合到另一个电路构件的导电迹线。
    • 29. 发明申请
    • HIGH PERFORMANCE SURFACE MOUNT ELECTRICAL INTERCONNECT
    • 高性能表面安装电气互连
    • US20120055701A1
    • 2012-03-08
    • US13266486
    • 2010-05-25
    • James Rathburn
    • James Rathburn
    • H05K1/03B23K31/02H05K1/16H05K1/02H05K1/09
    • H01R12/7082H01R12/57Y10T29/4913Y10T29/49144Y10T29/49165
    • An interconnect assembly including a substrate with a plurality of through holes extending from a first surface to a second surface. A plurality of discrete contact member are located in the plurality of through holes. The contact members include proximal ends that are accessible from the second surface, distal ends extending above the first surface, and intermediate portions engaged with an engagement region of the substrate located between the first surface and the recesses. Retention members are coupled with at least a portion of the proximal ends to retain the contact members in the through holes. The retention members can be made from a variety of materials with different levels of conductivity, ranging from highly conductive to non-conductive.
    • 一种互连组件,包括具有从第一表面延伸到第二表面的多个通孔的基底。 多个离散接触构件位于多个通孔中。 接触构件包括从第二表面可接近的近端,在第一表面上方延伸的远端,以及与位于第一表面和凹部之间的基底的接合区域接合的中间部分。 保持构件与至少一部分近端联接以将接触构件保持在通孔中。 保持构件可以由具有不同导电性的各种材料制成,从高导电性到非导电性。