会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 23. 发明申请
    • Apparatus and method for total internal reflection spectroscopy
    • 全内反射光谱仪的装置和方法
    • US20050062974A1
    • 2005-03-24
    • US10869824
    • 2004-06-16
    • Bengt Ivarsson
    • Bengt Ivarsson
    • G01J20060101G01N21/55
    • G01N21/552G01N21/553G01N21/648
    • An optical apparatus for total internal reflection spectroscopy comprises: a transparent body having an internally reflective surface; at least one source of electromagnetic radiation for providing at least one beam of collimated electromagnetic radiation; optical scanning means for directing the beam or beams to the transparent body so that the radiation is internally reflected at the reflective surface, and sequentially or continuously scanning the incident angle of the radiation over an angular range; at least one detector for detecting electromagnetic radiation exiting the transparent body, and means for counteracting variation of the irradiance in the illuminated area of the surface during the angular scan, or the effect of such variation on the reflected beam or beams. An optical apparatus for examining thin layer structures on a surface for differences in respect of optical thickness and/or refractive index, and a method for total internal reflection spectroscopy are also disclosed.
    • 用于全内反射光谱的光学装置包括:具有内部反射表面的透明体; 用于提供至少一个准直电磁辐射束的至少一个电磁辐射源; 用于将光束或光束引导到透明体的光学扫描装置,使得辐射在反射表面处被内部反射,并且在角度范围内依次或连续地扫描辐射的入射角; 用于检测离开透明体的电磁辐射的至少一个检测器,以及用于在角扫描期间抵消表面的照射区域中的辐照度变化的装置,或这种变化对反射光束或束的影响的装置。 还公开了一种用于检查表面上关于光学厚度和/或折射率的差异的薄层结构的光学装置,以及全内反射光谱法的方法。
    • 25. 发明申请
    • Analytical method and apparatus
    • 分析方法和装置
    • US20050007605A1
    • 2005-01-13
    • US10766696
    • 2004-01-27
    • Bengt Ivarsson
    • Bengt Ivarsson
    • G01N33/543G01B11/06G01N21/27G01N21/55G01B11/28
    • G01B11/0625G01N21/552G01N21/553G01N2021/212G01N2021/215
    • A method of examining thin layer structures on a surface for differences in respect of optical thickness, which method comprises the steps of: irradiating the surface with light so that the light is internally or externally reflected at the surface; imaging the reflected light on a first two-dimensional detector; sequentially or continuously scanning the incident angle and/or wavelength of the light over an angular and/or wavelength range; measuring the intensities of light reflected from different parts of the surface and impinging on different parts of the detector, at at least a number of incident angles and/or wavelengths, the intensity of light reflected from each part of the surface for each angle and/or wavelength depending on the optical thickness of the thin layer structure thereon; and determining from the detected light intensities at the different light incident angles and/or wavelengths an optical thickness image of the thin layer structures on the surface. According to the invention, part of the light reflected at said surface is detected on a second detector to determine the incident angle or wavelength of the polarized light irradiating the surface. An apparatus for carrying out the method is also disclosed.
    • 一种检查表面上薄层结构相对于光学厚度差异的方法,该方法包括以下步骤:用光照射表面,使得光在表面内部或外部反射; 对第一二维检测器上的反射光进行成像; 在角度和/或波长范围内顺序地或连续地扫描光的入射角和/或波长; 测量从表面的不同部分反射的光的强度,并且以至少多个入射角和/或波长在入射角和/或波长的至少多个入射角度和/或波长处撞击从表面的每个部分反射的光的强度和/ 或波长取决于其上的薄层结构的光学厚度; 并且根据检测到的不同光入射角的光强度和/或波长确定表面上的薄层结构的光学厚度图像。 根据本发明,在第二检测器上检测在所述表面反射的光的一部分,以确定照射表面的偏振光的入射角或波长。 还公开了一种用于执行该方法的装置。
    • 26. 发明申请
    • Method and system for curve quality control
    • 曲线质量控制方法和系统
    • US20040002167A1
    • 2004-01-01
    • US10400158
    • 2003-03-26
    • Biacore AB
    • Karl AnderssonPeter Borg
    • G01N033/543
    • G01N33/54373G06F19/18G06F19/24
    • A method of analysis wherein molecular interactions at one or more sensing surface areas are detected and respective response curves representing the progress of each interaction with time are produced, and wherein a resulting set of response curves is subjected to a quality assessment procedure which comprises representing the response curves with one or more quality descriptors, applying a quality classification method to the descriptors to find outliers, and removing the outliers. The invention also relates to an analytical system including means for classifying the response curves with regard to quality, a computer program for performing the classification, and a computer program product containing the program.
    • 一种分析方法,其中检测一个或多个感测表面区域处的分子相互作用,并且产生表示每次与时间相互作用的进展的各自的响应曲线,并且其中对所得到的一组响应曲线进行质量评估程序,其包括表示 响应曲线与一个或多个质量描述符,向描述符应用质量分类方法以找出异常值,并移除异常值。 本发明还涉及一种分析系统,包括用于对质量的响应曲线进行分类的装置,用于执行分类的计算机程序以及包含该程序的计算机程序产品。
    • 27. 发明授权
    • Surface plasmon resonance-mass spectrometry
    • 表面等离子体共振质谱
    • US5955729A
    • 1999-09-21
    • US708341
    • 1996-09-06
    • Randall W. NelsonJennifer R. KroneRussell GranzowOsten JanssonStefan Sjolander
    • Randall W. NelsonJennifer R. KroneRussell GranzowOsten JanssonStefan Sjolander
    • G01N27/62G01N21/27G01N21/55G01N33/543B01D59/44H01J49/00
    • H01J49/0418G01N21/553H01J49/164
    • The invention provides surface plasmon resonance-mass spectroscopy for the rapid, sensitive and accurate investigation of molecular interactions coupled with the identification and quantification of the same. Methods of the invention include capturing an analyte present within a sample by an interactive surface layer on a real-time interaction analysis sensor, analyzing the analyte by surface plasmon resonance while the analyte is captured by the interactive surface layer, and identifying the captured analyte by desorbing/ionizing the analyte from the interactive surface layer while under vacuum within a mass spectrometer. Devices of the invention include a transparent material, a conductive material capable of supporting surface plasmon resonance affixed to the transparent material, an interactive surface affixed to the conductive material, and a means for exposing the interactive surface to the interior of a mass spectrometer without breaking the vacuum therein.
    • 本发明提供表面等离子体共振 - 质谱法,用于快速,灵敏和准确地研究分子相互作用以及其鉴定和定量。 本发明的方法包括通过实时相互作用分析传感器上的交互表面层捕获样品中存在的分析物,通过表面等离子体共振分析分析物,同时通过交互表面层捕获分析物,并通过 在质谱仪内真空下从交互表面层解离/电离分析物。 本发明的装置包括透明材料,能够支撑固定在透明材料上的表面等离子体共振的导电材料,固定在导电材料上的相互作用表面,以及用于将相互作用表面暴露于质谱仪内部而不断裂的装置 其中的真空。
    • 28. 发明授权
    • Method and system for determination of molecular interaction parameters
    • 测定分子相互作用参数的方法和系统
    • US07373255B2
    • 2008-05-13
    • US10861098
    • 2004-06-04
    • Robert KarlssonKarl AnderssonChristina Wass
    • Robert KarlssonKarl AnderssonChristina Wass
    • G01N7/00
    • G01N33/6854B01L3/5027G01N33/53G01N33/543G01N35/08G01N2333/912G01N2333/936G01N2333/974G01N2333/988G01N2500/04G01N2500/20Y10S707/99943
    • A method of determining kinetic parameters for a reversible molecular interaction between a ligand immobilized to a solid support surface and a binding partner to the ligand in solution, comprises sequentially, without intermediate regeneration or renewal of the immobilized ligand, flowing a plurality of fluid volumes containing different known concentrations of the binding partner over the solid support surface, monitoring the momentary amount of binding partner bound to the solid support surface related to time and solution concentration of binding partner and collecting the binding data, and determining the kinetic parameters by globally fitting a predetermined kinetic model for the interaction between the binding partner and the immobilized ligand to the collected binding data, which model allows for mass transport limitation at the solid support surface. An analytical system for carrying out the method, a computer program, a computer program product and a computer system for performing the method are also disclosed.
    • 确定固定在固体支持物表面的配体与溶液中配体的结合配偶体之间的可逆分子相互作用的动力学参数的方法包括顺序地,不经过固定配体的中间再生或更新,流过多个含有 在固体支持物表面上结合配偶体的不同已知浓度,监测与固体支持物表面结合的结合配偶体的瞬时量与结合配偶体的时间和溶液浓度相关并收集结合数据,并通过全局拟合来确定动力学参数 用于结合配偶体和固定的配体与收集的结合数据之间相互作用的预定动力学模型,该模型允许在固体支持物表面的质量传递限制。 还公开了用于执行该方法的分析系统,计算机程序,计算机程序产品和用于执行该方法的计算机系统。
    • 29. 发明授权
    • Sample flow positioning method and analytical system using the method
    • 采样流定位方法及分析系统采用该方法
    • US07219528B2
    • 2007-05-22
    • US11005492
    • 2004-12-06
    • Mattias TidareRoos Håkan
    • Mattias TidareRoos Håkan
    • G01N21/00
    • G05D7/0682G01N21/553Y10T436/25
    • A method of positioning a laminar flow of a sample fluid on a surface within a flow cell is disclosed. The method comprises providing a laminar flow of a first guiding fluid adjacent to a laminar flow of a second guiding fluid different from the first guiding fluid such that the two fluids flow together over the surface with a detectable interface to each other; detecting the interface between the two different guiding fluids; optionally adjusting the interface laterally to a desired position by adjusting the relative flow rates of the two guiding fluids; and introducing a laminar flow of the sample fluid between the laminar flows of the first and second guiding fluids such that the flow of the sample fluid is sandwiched between the guiding fluids. An analytical system for carrying out the method, a computer program, a computer program product and a computer system for performing the method are also disclosed.
    • 公开了一种将样品流体的层流定位在流动池内的表面上的方法。 该方法包括提供与第一引导流体不同的第二引导流体的层流相邻的第一引导流体的层流,使得两个流体在表面上一起流动,彼此具有可检测的界面; 检测两种不同导向流体之间的界面; 可选地通过调节两个引导流体的相对流速来将界面侧向调节到所需位置; 以及在第一和第二引导流体的层流之间引入样品流体的层流,使得样品流体的流动被夹在引导流体之间。 还公开了用于执行该方法的分析系统,计算机程序,计算机程序产品和用于执行该方法的计算机系统。
    • 30. 发明授权
    • Analytical method and apparatus
    • US07081958B2
    • 2006-07-25
    • US11234829
    • 2005-09-23
    • Bengt Ivarsson
    • Bengt Ivarsson
    • G01N21/55G01B11/28
    • G01B11/0625G01N21/552G01N21/553G01N2021/212G01N2021/215
    • A method of examining thin layer structures on a surface for differences in respect of optical thickness, which method comprises the steps of: irradiating the surface with light so that the light is internally or externally reflected at the surface; imaging the reflected light on a first two-dimensional detector; sequentially or continuously scanning the incident angle and/or wavelength of the light over an angular and/or wavelength range; measuring the intensities of light reflected from different parts of the surface and impinging on different parts of the detector, at at least a number of incident angles and/or wavelengths, the intensity of light reflected from each part of the surface for each angle and/or wavelength depending on the optical thickness of the thin layer structure thereon; and determining from the detected light intensities at the different light incident angles and/or wavelengths an optical thickness image of the thin layer structures on the surface. According to the invention, part of the light reflected at said surface is detected on a second detector to determine the incident angle or wavelength of the polarized light irradiating the surface. An apparatus for carrying out the method is also disclosed.