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11. 发明申请

US20060100802A1 Method for evaluating diagnosis function of a variable valve mechanism and apparatus for diagnosing a variable valve mechanism 审中-公开
标题翻译：用于评估可变气门机构的诊断功能的方法和用于诊断可变气门机构的装置
公开(公告)号：US20060100802A1
公开(公告)日：2006-05-11
申请号：US11267147
申请日：2005-11-07
申请人： Ryo Miyakoshi , Kenichi Machida
发明人： Ryo Miyakoshi , Kenichi Machida
IPC分类号： G06F11/30
CPC分类号： G05B23/0256 , F01L1/3442 , F01L2001/34453 , F01L2001/34469 , G05B2219/33327
摘要： Gains of a feedback control of a variable valve mechanism are varied so that a response delay occurs. As a result that a transient response is diagnosed under this state, in the case where the occurrence of response delay is not judged, it is judged that a response diagnosis function is abnormal.
摘要翻译：可变阀机构的反馈控制的增益变化，从而发生响应延迟。结果，在该状态下诊断出瞬态响应，在没有判断出响应延迟的情况下，判断为响应诊断功能异常。

12. 发明申请

US20040138773A1 Process control system and process control method 有权
标题翻译：过程控制系统和过程控制方法
公开(公告)号：US20040138773A1
公开(公告)日：2004-07-15
申请号：US10727544
申请日：2003-12-05
发明人： Masayuki Tomoyasu
IPC分类号： G06F019/00
CPC分类号： G05B19/41875 , G05B2219/33327 , G05B2219/37575 , G05B2219/37576 , G05B2219/45031 , Y02P90/22
摘要： A process control system that controls processing executed on semiconductor wafers by processing apparatuses 120, 122,124 installed in each bay (area) 110 inside a factory the processing results of which are predictable, having installed in the corresponding bay, at least one measuring apparatus 130 that executes a measuring operation on workpieces undergoing the processing in the bay, a transfer path 140 of a transfer apparatus, through which the workpieces are transferred among various apparatuses installed within the bay including the individual processing apparatuses and the measuring apparatus and a process control device 150 that controls the processing apparatuses, the measuring apparatus and the transfer apparatus in the bay. This structure reduces the length of time (cycle time) to elapse from the processing through the inspection operation and also improves the operating rate of each processing apparatus.
摘要翻译：一种过程控制系统，其通过处理设备120,122,124来控制在半导体晶片上执行的处理，处理设备120,122,124安装在工厂内的每个间隔（区域）110中，其处理结果可预测地安装在相应的间隔中，至少一个测量设备130 执行在间隔中进行处理的工件上的测量操作，传送装置的传送路径140，工件在安装在包括各个处理设备和测量设备的托架内的各种设备之间传送通过该传送路径140以及过程控制设备150 它控制海湾中的处理设备，测量设备和传送设备。该结构减少了从通过检查操作的处理中经过的时间长度（循环时间），并且还提高了每个处理装置的操作速率。

13. 发明授权

US5200678A Motor driving control apparatus 失效
标题翻译：电机驱动控制装置
公开(公告)号：US5200678A
公开(公告)日：1993-04-06
申请号：US609660
申请日：1990-11-06
申请人： Mutuo Tokashiki , Kazumasa Sugiyama , Sumio Kobayashi , Hiroshi Sugai , Kazuyuki Nakagawa
发明人： Mutuo Tokashiki , Kazumasa Sugiyama , Sumio Kobayashi , Hiroshi Sugai , Kazuyuki Nakagawa
IPC分类号： G05B23/02 , G05B19/4062 , H02P29/00
CPC分类号： G05B19/4062 , G05B2219/33287 , G05B2219/33288 , G05B2219/33304 , G05B2219/33323 , G05B2219/33327 , G05B2219/34427
摘要： A motor driving control apparatus having a function for performing an individual test operation of a servomotor driving control apparatus or an inverter apparatus by generating test operation command in the control apparatus in place of a command from an external controller, whereby both a function check and a performance check can be performed to attain an improvement in reliability and case of operation.

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