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11. 发明申请

US20130257451A1 DIELECTRIC STRENGTH VOLTAGE TESTING METHOD FOR ELECTRONICS DEVICE 有权
标题翻译：用于电子设备的电介质强度电压测试方法
公开(公告)号：US20130257451A1
公开(公告)日：2013-10-03
申请号：US13766241
申请日：2013-02-13
申请人： CANON KABUSHIKI KAISHA
发明人： Tetsuya Nozaki
IPC分类号： G01R31/18
CPC分类号： G01R31/18 , G01R31/028 , G01R31/129 , G06F1/26
摘要： A first X capacitor is connected between one of a plurality of hot line sections of a hot line that is located at an output side of a first relay as viewed from a commercial alternating-current power supply, and one of a plurality of neutral line sections of a neutral line that is located at an input side of a second relay as viewed from the commercial alternating-current power supply. A second X capacitor is connected between one of the hot line sections that is located at the output side of the first relay as viewed from the commercial alternating-current power supply, and one of the neutral line sections that is located at an output side of the second relay as viewed from the commercial alternating-current power supply.
摘要翻译：第一X电容器连接在从商用交流电源观察的位于第一继电器的输出侧的热线的多个热线部分之一和多个中性线部分中的一个之间位于从商用交流电源观察的第二继电器的输入侧的中性线。第二X电容器连接在从商用交流电源观察时位于第一继电器的输出侧的一个热线部分和位于输出侧的一个中性线部分从商用交流电源观察的第二继电器。

12. 发明授权

US4484136A Test set for transient protection devices 失效
标题翻译：瞬态保护装置的测试装置
公开(公告)号：US4484136A
公开(公告)日：1984-11-20
申请号：US277306
申请日：1981-06-25
申请人： John E. B. Tuttle
发明人： John E. B. Tuttle
IPC分类号： G01R31/02 , G01R31/18 , H02H3/04
CPC分类号： H02H3/044 , G01R31/024 , G01R31/18
摘要： A method and device for testing transient protection circuits comprising itive and negative high voltage protection circuits and high voltage fast rise time protection circuits. A bipolar test signal with alternate positive and negative high voltage pulses is applied to the circuit under test. Determination is made whether the pulses are within a predetermined voltage window. Signals indicating pass/fail responsive to that determination are generated. A high voltage fast rise time negative pulse is applied to the circuit under test. Changes in the voltage-time waveform are sensed and compared to predetermined levels. Pass/fail signals are generated in response to the comparison.
摘要翻译：一种用于测试瞬态保护电路的方法和装置，包括正，负高压保护电路和高电压快速上升时间保护电路。具有交替的正和负高压脉冲的双极性测试信号被施加到被测电路。确定脉冲是否在预定电压窗口内。生成响应于该确定的通过/失败的信号。高压快速上升时间负脉冲被施加到被测电路。检测电压 - 时间波形的变化并与预定的电平进行比较。响应于比较产生通过/失败信号。

13. 发明授权

US4204161A Apparatus for rapidly testing electrochemical cells 失效
标题翻译：用于快速检测电化学电池的装置
公开(公告)号：US4204161A
公开(公告)日：1980-05-20
申请号：US882354
申请日：1978-03-01
申请人： John J. Strickland
发明人： John J. Strickland
IPC分类号： B07C5/344 , G01R31/18 , G01R31/36 , H01M10/42 , G01N27/42
CPC分类号： B07C5/344 , G01R31/18 , G01R31/3627 , H01M10/4285
摘要： Apparatus for rapidly testing rechargeable electrochemical cells following assembly which enables the testing of cells to be carried out in a substantially uncharged condition, such apparatus including an automatically actuated probe for applying to and receiving electrical signals at the terminals of the cells as they progress on the assembly line. When extended, a central electrode on the probe engages the central cell terminal and a pair of self-aligning resiliently biased pivotal arms positively engages the rim of the cell casing, which constitutes the other cell electrode, thus establishing reliable electrical contact even in the presence of residue or other manufacturing debris on the cell.
摘要翻译：用于在组装之后快速测试可再充电电化学电池的装置，其使得能够以基本上不带电的状态进行电池的测试，所述装置包括用于在电池的端子上施加和接收电信号的电信号的装置，流水线。当延伸时，探针上的中心电极接合中心电池端子，一对自对准的弹性偏压的枢转臂与构成另一个电池电极的电池壳体的边缘正向接合，从而即使在存在时也建立可靠的电接触的残留物或其他制造碎片在细胞上。

14. 发明授权

US3478876A Magnetic parts sorter 失效
标题翻译：磁性部件SORTER
公开(公告)号：US3478876A
公开(公告)日：1969-11-18
申请号：US3478876D
申请日：1965-01-12
申请人： LITTWIN ARTHUR K , ROBERT L LITTWIN , LITTWIN DONALD F , YOUNG HORACE A
发明人： LITTWIN ARTHUR K , LITTWIN DONALD F
IPC分类号： B07C5/344 , G01R31/18 , G01R33/12 , B07C5/34 , G01R33/00
CPC分类号： G01R31/18 , B07C5/344 , B07C5/365 , G01R33/12 , Y10S209/914 , Y10S209/92 , Y10S209/934

15. 发明授权

US09891267B2 Kernel based cluster fault analysis 有权
公开(公告)号：US09891267B2
公开(公告)日：2018-02-13
申请号：US15181649
申请日：2016-06-14
申请人： FREESCALE SEMICONDUCTOR, INC.
发明人： Nikolas Bradley Sumikawa , Chen He
IPC分类号： G01R31/28 , G01R31/3177 , G01R31/3185 , G01R31/26 , G01R31/01 , G01R31/18 , H01L21/66
CPC分类号： G01R31/18 , G01R31/01 , G01R31/26 , G01R31/2894 , G01R31/31718 , G01R31/318511 , G01R31/31937 , H01L22/00
摘要： A fault analysis method comprises: receiving fault data from wafer level testing that identifies locations and test results of a plurality of die; applying a kernel transform to the fault data to produce cluster data, where the kernel transform defines a fault impact distribution that defines fault contribution from the failed die to local die within an outer radial boundary of the fault impact distribution. Applying the kernel transform comprises: centering the fault impact distribution at a location of each die that failed wafer level testing, associating each local die that falls within the outer radial boundary with a respective fault contribution value according to the fault impact distribution, and accruing fault contribution values associated with each respective die of the plurality of die to produce a cluster value for the respective die, which correlates to a probability of failure of the respective die at a future time.

16. 发明申请

US20170356955A1 KERNEL BASED CLUSTER FAULT ANALYSIS 有权
公开(公告)号：US20170356955A1
公开(公告)日：2017-12-14
申请号：US15181649
申请日：2016-06-14
申请人： FREESCALE SEMICONDUCTOR, INC.
发明人： Nikolas Bradley SUMIKAWA , Chen HE
IPC分类号： G01R31/28 , G01R31/3177
CPC分类号： G01R31/18 , G01R31/01 , G01R31/26 , G01R31/2894 , G01R31/31718 , G01R31/318511 , G01R31/31937 , H01L22/00
摘要： A fault analysis method comprises: receiving fault data from wafer level testing that identifies locations and test results of a plurality of die; applying a kernel transform to the fault data to produce cluster data, where the kernel transform defines a fault impact distribution that defines fault contribution from the failed die to local die within an outer radial boundary of the fault impact distribution. Applying the kernel transform comprises: centering the fault impact distribution at a location of each die that failed wafer level testing, associating each local die that falls within the outer radial boundary with a respective fault contribution value according to the fault impact distribution, and accruing fault contribution values associated with each respective die of the plurality of die to produce a cluster value for the respective die, which correlates to a probability of failure of the respective die at a future time.

17. 发明申请

US20160084878A1 TRIAXIAL DC-AC CONNECTION SYSTEM 有权
标题翻译：三相直流交流连接系统
公开(公告)号：US20160084878A1
公开(公告)日：2016-03-24
申请号：US14846121
申请日：2015-09-04
申请人： Keithley Instruments, Inc.
发明人： Wayne C. Goeke , Gregory Sobolewski
IPC分类号： G01R1/04 , G01R27/28 , G01R31/28
CPC分类号： G01R1/0416 , G01R27/28 , G01R31/06 , G01R31/18 , G01R31/24 , G01R31/2607 , G01R31/2822 , G01R31/2889
摘要： Embodiments of the present invention provide an improved two-cable connection system for connecting electrical test instrumentation to a device under test (DUT). In one embodiment, a single pair of equal-length triaxial cables each has a desired characteristic impedance. Each cable has a center connecter, intermediate conductor, and outer conductor. The proximal end of each cable is connected to the test instrumentation, and the distal ends are located at the DUT. At the distal end, the center conductors are connected to the DUT, the intermediate conductors are allowed to float, and the outer conductors are connected to each other. The proximal end of each cable is connected to the device using an appropriate connection for the test that will be performed. This allows the test instrumentation to perform different types of tests without changing connections to the DUT.
摘要翻译：本发明的实施例提供了一种用于将电测试仪器连接到被测器件（DUT）的改进的双电缆连接系统。在一个实施例中，单对等长三轴电缆各具有期望的特性阻抗。每个电缆都有一个中心连接器，中间导体和外部导体。每个电缆的近端连接到测试仪器，并且远端位于DUT。在远端，中心导体连接到DUT，允许中间导体浮动，外导体彼此连接。每个电缆的近端使用适当的连接连接到设备，用于要执行的测试。这允许测试仪器执行不同类型的测试，而不改变与DUT的连接。

18. 发明授权

US07649361B2 Methods for forming process test capacitors for testing embedded passives during embedment into a printed wiring board 失效
标题翻译：在嵌入印刷电路板期间形成用于测试嵌入式无源器件的工艺测试电容器的方法
公开(公告)号：US07649361B2
公开(公告)日：2010-01-19
申请号：US11612089
申请日：2006-12-18
申请人： William Borland , Saul Ferguson , Diptarka Majumdar , Daniel I. Amey
发明人： William Borland , Saul Ferguson , Diptarka Majumdar , Daniel I. Amey
IPC分类号： G01R31/18
CPC分类号： G01R31/18 , H05K1/0268 , H05K1/162 , H05K3/1291 , H05K2201/0355 , H05K2203/1126 , H05K2203/1476 , Y10T29/417 , Y10T29/4913
摘要： Making process test capacitors simultaneously with circuit capacitors that are to be embedded into a printed wiring board and firing the test capacitors to result in fired-on-foil test capacitors for the purpose of using the test capacitors as test substitutes for the embedded circuit capacitors to predict whether capacitance, dissipation factor or insulation resistance of the circuit capacitors will fall within acceptable specified ranges prior to and after embedment.
摘要翻译：将待测电容器与要嵌入印刷电路板的电路电容器同时烧制，并对测试电容器进行烧结，以产生烧结箔测试电容器，以将测试电容器用作嵌入式电路电容器的替代品预测电路电容器的电容，耗散因数或绝缘电阻在嵌入之前和之后是否落在可接受的规定范围内。

19. 发明授权

US07038279B2 Process parameter event monitoring system and method for process 失效
标题翻译：过程参数事件监控系统及过程方法
公开(公告)号：US07038279B2
公开(公告)日：2006-05-02
申请号：US10282771
申请日：2002-10-28
申请人： Vladimir Kraz , Kirk Alan Martin
发明人： Vladimir Kraz , Kirk Alan Martin
IPC分类号： H01L23/62
CPC分类号： H01L21/67253 , G01R31/18 , H05K13/0413 , H05K13/082
摘要： A system and method for measuring process parameters in a process machine is described. The system is synchronized to the operation of the process machine so that spurious process parameters events are filtered out.
摘要翻译：描述了用于测量过程机器中的过程参数的系统和方法。该系统与过程机器的操作同步，以便过滤出杂散过程参数事件。

20. 发明授权

US4267503A Method and instrument for testing the operating characteristics of a capacitor 失效
标题翻译：用于测试电容器工作特性的方法和仪器
公开(公告)号：US4267503A
公开(公告)日：1981-05-12
申请号：US90554
申请日：1979-11-02
申请人： Marlin D. Westra
发明人： Marlin D. Westra
IPC分类号： G01R27/26 , G01R31/01 , G01R31/18 , G01R11/52
CPC分类号： G01R31/028 , G01R27/2605 , G01R31/18
摘要： Dielectric absorption in a capacitor is detected by making a first measurement of the capacitance of the capacitor, then charging the capacitor to its rated voltage, then discharging the capacitor, and then promptly making a second measurement of the capacitance of the capacitor. If the second measurement indicates a capacitance value less than that indicated by the first measurement, the capacitor exhibits dielectric absorption.
摘要翻译：通过对电容器的电容进行第一次测量，然后将电容器充电至其额定电压，然后对电容器放电，然后及时对电容器的电容进行第二次测量，来检测电容器中的介电吸收。如果第二测量值表示比第一次测量值小的电容值，则电容器呈现电介质吸收。

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