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    • 18. 发明授权
    • X-ray examination device
    • X光检查装置
    • US07578618B2
    • 2009-08-25
    • US12065624
    • 2006-09-08
    • Roger Anton Marie TimmermansRaymond Wilhelmus Louis Lafarre
    • Roger Anton Marie TimmermansRaymond Wilhelmus Louis Lafarre
    • H05G1/02
    • A61B6/4441A61B6/4464
    • The invention concerns an X-ray examination device (10) comprising an X-ray source (20), an X-ray detector (18) and a segmented carrier, where the X-ray source and the X-ray detector are rotatable together around an isocentre (32). The segmented carrier includes a main arm (12) on which the X-ray source and X-ray detector are mounted and at least one first auxiliary arm (22) to which the main arm is mounted. The first auxiliary arm is rotatable around a first rotational axis (30) through the isocentre. The present invention provides an improved X-ray examination device that allows the provision of a greater freedom of selection of inspection angles regarding a patient
    • 本发明涉及一种X射线检查装置(10),其包括X射线源(20),X射线检测器(18)和分段载体,其中X射线源和X射线检测器可一起旋转 围绕一个等中心(32)。 分段载体包括安装有X射线源和X射线检测器的主臂(12)和安装有主臂的至少一个第一辅助臂(22)。 第一辅助臂可绕第一旋转轴线(30)通过等中心旋转。 本发明提供一种改进的X射线检查装置,其允许提供关于患者的检查角度的更大的选择自由度