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    • 13. 发明申请
    • LIGHT OR RADIATION IMAGE PICKUP APPARATUS
    • 光或辐射图像拾取装置
    • US20120033110A1
    • 2012-02-09
    • US13265064
    • 2009-04-24
    • Koichi TanabeHiroyuki Kishihara
    • Koichi TanabeHiroyuki Kishihara
    • H04N9/64
    • H04N5/361A61B6/585G01T1/17H04N5/32H04N5/3742H04N5/378
    • The radiation image pickup apparatus of this invention can obtain an accurate temperature characteristic of dark current noise, the dark current noise being caused by dark current flowing through an X-ray conversion layer, by obtaining dark image signals at varied times for accumulating in capacitors charge signals converted by an X-ray converting layer. Consequently, the noise due to the dark current can be removed with high accuracy by removing periodically acquired offset signals from X-ray detection signals acquired at a time of X-ray image pickup, and correcting variations of the dark current noise due to a difference in temperature between a time of offset signal acquisition and the time of X-ray image pickup, using the temperature characteristic of the dark current noise.
    • 本发明的放射线摄像装置可以获得暗电流噪声的精确温度特性,暗电流噪声是由流过X射线转换层的暗电流引起的,通过获得在电容器电荷积累的变化时间的暗图像信号 由X射线转换层转换的信号。 因此,通过从X射线摄像时获取的X射线检测信号中去除周期性地获取的偏移信号,可以高精度地去除由于暗电流引起的噪声,并且校正由于差异引起的暗电流噪声的变化 使用暗电流噪声的温度特性,在偏移信号获取时间与X射线摄像时间之间的温度。
    • 14. 发明授权
    • Light or radiation image pickup apparatus
    • 光或辐射摄像装置
    • US08760544B2
    • 2014-06-24
    • US13265064
    • 2009-04-24
    • Koichi TanabeHiroyuki Kishihara
    • Koichi TanabeHiroyuki Kishihara
    • G01T1/24H04N9/64
    • H04N5/361A61B6/585G01T1/17H04N5/32H04N5/3742H04N5/378
    • The radiation image pickup apparatus of this invention can obtain an accurate temperature characteristic of dark current noise, the dark current noise being caused by dark current flowing through an X-ray conversion layer, by obtaining dark image signals at varied times for accumulating in capacitors charge signals converted by an X-ray converting layer. Consequently, the noise due to the dark current can be removed with high accuracy by removing periodically acquired offset signals from X-ray detection signals acquired at a time of X-ray image pickup, and correcting variations of the dark current noise due to a difference in temperature between a time of offset signal acquisition and the time of X-ray image pickup, using the temperature characteristic of the dark current noise.
    • 本发明的放射线摄像装置可以获得暗电流噪声的精确温度特性,暗电流噪声是由流过X射线转换层的暗电流引起的,通过获得在电容器电荷积累的变化时间的暗图像信号 由X射线转换层转换的信号。 因此,通过从X射线摄像时获取的X射线检测信号中去除周期性地获取的偏移信号,可以高精度地去除由于暗电流引起的噪声,并且校正由于差异引起的暗电流噪声的变化 使用暗电流噪声的温度特性,在偏移信号获取时间与X射线摄像时间之间的温度。
    • 17. 发明授权
    • Thermal photodetector and method of manufacturing the same
    • 热像仪及其制造方法
    • US5231289A
    • 1993-07-27
    • US871771
    • 1992-04-21
    • Jun-ichi KitaHiroyuki Kishihara
    • Jun-ichi KitaHiroyuki Kishihara
    • G01J1/02G01J5/02G01J5/06G01J5/34H01L37/02
    • G01J5/34H01L37/02G01J5/061
    • A thermal photodetector includes a thermal photodetector element and a support stand for supporting the thermal photodetector element. The support stand is made of a material of which heat conduction is relatively small, and is thermally connected to and mounted on a mount of which temperature is controlled to a predetermined temperature. The sizes of the support stand are determined such that the quantity of heat conduction in a heat conduction passage from the thermal photodetector element to the mount is equal to a predetermined quantity. The method of manufacturing this thermal detector includes the steps of exposing, to light, a photosensitive glass plate having a thickness corresponding to the height of a support stand of a thermal photodetector to be manufactured. The light exposure is made with the use of a mask having a shape which corresponds to the shape in transverse section of the support stand. The photosensitive glass plate is adhered to pyroelectric crystal plate provided on one surface thereof with an electrode. The surface of the pyroelectric crystal plate on which the electrode is mounted faces the photosensitive glass plate. The surface of the pyroelectric crystal plate opposite to the adhered surface is polished. The light-sensed portion of the photosensitive glass plate is then removed.