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    • 12. 发明授权
    • Method of measuring thickness of thin film using microwave
    • 使用微波测量薄膜厚度的方法
    • US07535236B2
    • 2009-05-19
    • US11994247
    • 2006-09-28
    • Sang Young LeeJae Hun LeeHyun Kyung HanSang Geun LeeByung Woo Park
    • Sang Young LeeJae Hun LeeHyun Kyung HanSang Geun LeeByung Woo Park
    • G01R27/04G01R27/32
    • G01B15/025
    • The present invention relates to a thickness measurement method for thin films using microwaves. In the method, the Q-factors of a dielectric resonator are measured. The effective surface resistance (RSeff) of a superconductor or a conductor film and the loss tangent of a dielectric are determined using the Q-factor. The penetration depth λ for the superconductor film is measured using a dielectric resonator with a small gap between the superconductor film at the top of the resonator and the rest. The intrinsic surface resistance of superconductor films for calibration is determined using the measured RSeff and λ while the intrinsic surface resistance of a conductor film for calibration is determined using the measured RSeff and the nature of the intrinsic surface resistance being equal to the intrinsic surface reactance. The thickness of a superconductor or a conductor film is measured using a relation between the RSeff and the calibrated intrinsic surface resistance for superconductor films or conductor films.
    • 本发明涉及使用微波的薄膜的厚度测量方法。 在该方法中,测量介质谐振器的Q因子。 使用Q因子确定超导体或导体膜的有效表面电阻(RSeff)和电介质的损耗角正切。 超导薄膜的穿透深度λ是使用在谐振器顶部的超导薄膜与其余部分之间具有小间隙的介质谐振器来测量的。 使用测量的RSeff和λ测定用于校准的超导体膜的固有表面电阻,而使用所测量的RSeff和本征表面电阻的性质等于固有表面电抗确定用于校准的导体膜的固有表面电阻。 使用超导体膜或导体膜的RSeff与校正的固有表面电阻之间的关系来测量超导体或导体膜的厚度。
    • 17. 发明申请
    • Functional Fiber for Preventing Forgery
    • 功能纤维防伪
    • US20090311527A1
    • 2009-12-17
    • US12489386
    • 2009-06-22
    • Ku Won SeoWon Gyun ChoeSun Young KimSoo Dong KimHong Sub ChoiSang Geun LeeSun Hong Yoon
    • Ku Won SeoWon Gyun ChoeSun Young KimSoo Dong KimHong Sub ChoiSang Geun LeeSun Hong Yoon
    • D02G3/22
    • D01D5/32D01F1/04D21H21/40Y10T428/2931
    • The present invention relates to a functional fiber for preventing forgery, more particularly functional fiber for preventing forgery which exerts functionality by mixing special pigments to composite fibers of side by side shape on which two components are attached.The functional fibers of two components structure according to the present invention are consisted of synthetic high molecules, and have functionality which fibers display color by colored pigments with visual or fluorescence by light of ultraviolet ray or absorbing property of infrared pigments by being produced by mixing colored pigments, fluorescent pigments, infrared pigments and the like to each resin, and then melt-spinning the said mixture, or post treating it.While such fibers according to the present invention are hard to have a property of fibers since those contain pigments above a specific concentration, the fibers have functionality for preventing forgery by mixing a monofilament which is obtained by cutting the said fibers to papers, resins of high molecules, or coating agents so that it can be used as a functional element for preventing forgery and identifying authenticity of particular product demanded security such as a bank bill, a bond, a passport, an identity card.
    • 本发明涉及防止伪造的功能性纤维,更具体地说,涉及防止伪造的功能性纤维,其特征在于,通过将特殊颜料与并置有两种成分的复合纤维混合而发挥功能。 根据本发明的两种组分结构的功能性纤维由合成的高分子组成,并且具有通过紫外线光或视觉或荧光的颜色通过彩色颜料显示颜色的功能,或者通过混合着色的 颜料,荧光颜料,红外线颜料等,然后将所述混合物熔融纺丝或后处理。 虽然根据本发明的这种纤维难以具有纤维的性质,因为它们含有高于特定浓度的颜料,但是纤维具有通过将通过将所述纤维切割成纸而获得的单丝混合成纸,防止伪造的功能, 分子或涂层剂,使得其可以用作防止伪造和识别特定产品所需安全性的真实性的功能元件,例如银行票据,债券,护照,身份证。
    • 18. 发明申请
    • Method of Measuring Thickness of Thin Film Using Microwave
    • 使用微波测量薄膜厚度的方法
    • US20080205595A1
    • 2008-08-28
    • US11994247
    • 2006-09-28
    • Sang Young LeeJae Hun LeeHyun Kyung HanSang Geun LeeByung Woo Park
    • Sang Young LeeJae Hun LeeHyun Kyung HanSang Geun LeeByung Woo Park
    • G01B15/02
    • G01B15/025
    • The present invention relates to a thickness measurement method for thin films using microwaves. In the method, the Q-factors of a dielectric resonator are measured. The effective surface resistance (RSeff) of a superconductor or a conductor film and the loss tangent of a dielectric are determined using the Q-factor. The penetration depth λ for the superconductor film is measured using a dielectric resonator with a small gap between the superconductor film at the top of the resonator and the rest. The intrinsic surface resistance of superconductor films for calibration is determined using the measured RSeff and λ while the intrinsic surface resistance of a conductor film for calibration is determined using the measured RSeff and the nature of the intrinsic surface resistance being equal to the intrinsic surface reactance. The thickness of a superconductor or a conductor film is measured using a relation between the RSeff and the calibrated intrinsic surface resistance for superconductor films or conductor films.
    • 本发明涉及使用微波的薄膜的厚度测量方法。 在该方法中,测量介质谐振器的Q因子。 使用Q因子确定超导体或导体膜的有效表面电阻(R sub S eff)和电介质的损耗角正切。 超导薄膜的穿透深度λ是使用在谐振器顶部的超导薄膜与其余部分之间具有小间隙的介质谐振器来测量的。 用于校准的超导体膜的固有表面电阻是使用测量的R S S O SUP和λ确定的,而用于校准的导体膜的固有表面电阻是使用测量的R 本征表面电阻的性质等于固有表面电抗。 使用超导体膜或导体膜的校准固有表面电阻之间的关系来测量超导体或导体膜的厚度。