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1. 发明授权

US07535236B2 Method of measuring thickness of thin film using microwave 失效
标题翻译：使用微波测量薄膜厚度的方法
公开(公告)号：US07535236B2
公开(公告)日：2009-05-19
申请号：US11994247
申请日：2006-09-28
申请人： Sang Young Lee , Jae Hun Lee , Hyun Kyung Han , Sang Geun Lee , Byung Woo Park
发明人： Sang Young Lee , Jae Hun Lee , Hyun Kyung Han , Sang Geun Lee , Byung Woo Park
IPC分类号： G01R27/04 , G01R27/32
CPC分类号： G01B15/025
摘要： The present invention relates to a thickness measurement method for thin films using microwaves. In the method, the Q-factors of a dielectric resonator are measured. The effective surface resistance (RSeff) of a superconductor or a conductor film and the loss tangent of a dielectric are determined using the Q-factor. The penetration depth λ for the superconductor film is measured using a dielectric resonator with a small gap between the superconductor film at the top of the resonator and the rest. The intrinsic surface resistance of superconductor films for calibration is determined using the measured RSeff and λ while the intrinsic surface resistance of a conductor film for calibration is determined using the measured RSeff and the nature of the intrinsic surface resistance being equal to the intrinsic surface reactance. The thickness of a superconductor or a conductor film is measured using a relation between the RSeff and the calibrated intrinsic surface resistance for superconductor films or conductor films.
摘要翻译：本发明涉及使用微波的薄膜的厚度测量方法。在该方法中，测量介质谐振器的Q因子。使用Q因子确定超导体或导体膜的有效表面电阻（RSeff）和电介质的损耗角正切。超导薄膜的穿透深度λ是使用在谐振器顶部的超导薄膜与其余部分之间具有小间隙的介质谐振器来测量的。使用测量的RSeff和λ测定用于校准的超导体膜的固有表面电阻，而使用所测量的RSeff和本征表面电阻的性质等于固有表面电抗确定用于校准的导体膜的固有表面电阻。使用超导体膜或导体膜的RSeff与校正的固有表面电阻之间的关系来测量超导体或导体膜的厚度。

2. 发明申请

US20080205595A1 Method of Measuring Thickness of Thin Film Using Microwave 失效
标题翻译：使用微波测量薄膜厚度的方法
公开(公告)号：US20080205595A1
公开(公告)日：2008-08-28
申请号：US11994247
申请日：2006-09-28
申请人： Sang Young Lee , Jae Hun Lee , Hyun Kyung Han , Sang Geun Lee , Byung Woo Park
发明人： Sang Young Lee , Jae Hun Lee , Hyun Kyung Han , Sang Geun Lee , Byung Woo Park
IPC分类号： G01B15/02
CPC分类号： G01B15/025
摘要： The present invention relates to a thickness measurement method for thin films using microwaves. In the method, the Q-factors of a dielectric resonator are measured. The effective surface resistance (RSeff) of a superconductor or a conductor film and the loss tangent of a dielectric are determined using the Q-factor. The penetration depth λ for the superconductor film is measured using a dielectric resonator with a small gap between the superconductor film at the top of the resonator and the rest. The intrinsic surface resistance of superconductor films for calibration is determined using the measured RSeff and λ while the intrinsic surface resistance of a conductor film for calibration is determined using the measured RSeff and the nature of the intrinsic surface resistance being equal to the intrinsic surface reactance. The thickness of a superconductor or a conductor film is measured using a relation between the RSeff and the calibrated intrinsic surface resistance for superconductor films or conductor films.
摘要翻译：本发明涉及使用微波的薄膜的厚度测量方法。在该方法中，测量介质谐振器的Q因子。使用Q因子确定超导体或导体膜的有效表面电阻（R sub S eff）和电介质的损耗角正切。超导薄膜的穿透深度λ是使用在谐振器顶部的超导薄膜与其余部分之间具有小间隙的介质谐振器来测量的。用于校准的超导体膜的固有表面电阻是使用测量的R S S O SUP和λ确定的，而用于校准的导体膜的固有表面电阻是使用测量的R 本征表面电阻的性质等于固有表面电抗。使用超导体膜或导体膜的校准固有表面电阻之间的关系来测量超导体或导体膜的厚度。

3. 发明授权

US06916580B2 Positive active material for a rechargeable lithium battery, method for preparing the same and battery containing the same 有权
标题翻译：用于可再充电锂电池的正极活性材料，其制备方法和含有它的电池
公开(公告)号：US06916580B2
公开(公告)日：2005-07-12
申请号：US10270811
申请日：2002-10-15
申请人： Jae-Phil Cho , Byung-Woo Park , Yong-Jeong Kim , Tae-Jun Kim
发明人： Jae-Phil Cho , Byung-Woo Park , Yong-Jeong Kim , Tae-Jun Kim
IPC分类号： H01M10/05 , H01M4/36 , H01M4/48 , H01M4/505 , H01M4/525 , H01M4/58 , H01M4/62
CPC分类号： H01M4/366 , H01M4/0416 , H01M4/485 , H01M4/505 , H01M4/525 , H01M4/628 , H01M10/0525 , H01M10/4235 , H01M2004/021
摘要： A positive active material for a rechargeable lithium battery is provided. The positive active material comprises a lithiated intercalation compound and a coating layer formed on the lithiated intercalation compound. The coating layer comprises a solid-solution compound and an oxide compound having at least two coating elements, the oxide compound represented by the following Formula 1: MpM′qOr (1) wherein M and M′ are not the same and are each independently at least one element selected from the group consisting of Zr, Al, Na, K, Mg, Ca, Sr, Ni, Co, Ti, Sn, Mn, Cr, Fe, and V; 0
摘要翻译：提供了用于可再充电锂电池的正极活性材料。正极活性物质包含锂化插层化合物和在锂化插层化合物上形成的涂层。涂层包含固溶体化合物和具有至少两个涂层元素的氧化物化合物，由下式1表示的氧化物化合物：<？在线配方说明=“在线配方”末端=“铅” （1）<？in-line-formula description =“In-line Formulas”end = “尾”→其中M和M'不相同，并且各自独立地选自Zr，Al，Na，K，Mg，Ca，Sr，Ni，Co，Ti，Sn中的至少一种元素， Mn，Cr，Fe和V; 0
r <_2，其中r是基于p和q确定的。该固溶体化合物是通过使锂化嵌入化合物与氧化物化合物反应来制备的。该涂层的断裂韧性至少为3.5MPam 1/2。还提供了制造正极活性物质的方法。

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