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    • 11. 发明申请
    • SEMICONDUCTOR PACKAGE AND METHOD FOR MAKING THE SAME
    • 半导体封装及其制造方法
    • US20110309516A1
    • 2011-12-22
    • US12819796
    • 2010-06-21
    • Yi-Shao LaiTsung-Yueh TsaiMing-Kun ChenHsiao-Chuan ChangMing-Hsiang Cheng
    • Yi-Shao LaiTsung-Yueh TsaiMing-Kun ChenHsiao-Chuan ChangMing-Hsiang Cheng
    • H01L23/538H01L21/768H01L21/60
    • H01L23/48H01L23/481H01L24/48H01L25/0657H01L2224/16225H01L2224/48091H01L2224/48227H01L2225/06513H01L2225/06531H01L2225/06541H01L2924/00014H01L2924/1815H01L2224/45099H01L2224/45015H01L2924/207
    • The present invention relates to a semiconductor package and a method for making the same. The semiconductor package includes a first chip and a second chip. The first chip comprises a first active surface, at least one first non-top metal layer and a plurality of first signal coupling pads. The first non-top metal layer is disposed adjacent to and spaced apart from the first active surface by a second distance. The first signal coupling pads are disposed on the first non-top metal layer. The second chip is electrically connected to the first chip. The second chip comprises a second active surface, at least one second non-top metal layer and a plurality of third signal coupling pads. The second active surface faces the first active surface of the first chip. The second non-top metal layer is disposed adjacent to and spaced apart from the second active surface by a fourth distance. The third signal coupling pads are disposed on the second non-top metal layer and capacitively coupled to the first signal coupling pads of the first chip, so as to provide proximity communication between the first chip and the second chip. Whereby, the gap variation between the first signal coupling pads of the first chip and the third signal coupling pads of the second chip is under stringent control of the second distance and the fourth distance. Therefore, the mass-production yield of the semiconductor package is increased.
    • 半导体封装及其制造方法技术领域本发明涉及半导体封装及其制造方法。 半导体封装包括第一芯片和第二芯片。 第一芯片包括第一有源表面,至少一个第一非顶部金属层和多个第一信号耦合焊盘。 第一非顶部金属层设置成与第一有源表面相邻并间隔开第二距离。 第一信号耦合焊盘设置在第一非顶部金属层上。 第二芯片电连接到第一芯片。 第二芯片包括第二有源表面,至少一个第二非顶部金属层和多个第三信号耦合焊盘。 第二活性表面面向第一芯片的第一有效表面。 第二非顶部金属层被布置成与第二有源表面相邻并且与第二有源表面间隔开第四距离。 第三信号耦合焊盘设置在第二非顶部金属层上,并电容耦合到第一芯片的第一信号耦合焊盘,从而提供第一芯片与第二芯片之间的接近通信。 由此,第一芯片的第一信号耦合焊盘与第二芯片的第三信号耦合焊盘之间的间隙变化受到第二距离和第四距离的严格控制。 因此,半导体封装的批量生产量增加。
    • 15. 发明授权
    • Bonding strength measuring device
    • 接合强度测量装置
    • US07980757B2
    • 2011-07-19
    • US12350643
    • 2009-01-08
    • Yi-Shao LaiTsung-Yueh TsaiHsiao-Chuan Chang
    • Yi-Shao LaiTsung-Yueh TsaiHsiao-Chuan Chang
    • G01K1/00G01N25/00
    • G01N19/04
    • A bonding strength measuring device for measuring the bonding strength between a substrate and a molding compound disposed on the substrate is provided. The measuring device includes a heating platform, a heating slide plate, and a fixing bracket. The heating platform has a first heating area and a first replaceable fixture. The substrate is disposed on the first heating area, and the first replaceable fixture is used to fix the substrate and has an opening exposing the molding compound. The heating slide plate has a second heating area and a second replaceable fixture. The second heating area is used to heat the molding compound, and the second replaceable fixture has a cavity for accommodating the molding compound. The fixing bracket is used to fix the heating slide plate above the heating platform.
    • 提供了用于测量基板和设置在基板上的模塑料之间的接合强度的接合强度测量装置。 测量装置包括加热平台,加热滑板和固定支架。 加热平台具有第一加热区域和第一可更换夹具。 基板设置在第一加热区域上,并且第一可更换夹具用于固定基板,并具有露出模塑料的开口。 加热滑板具有第二加热区域和第二可更换夹具。 第二加热区域用于加热模塑料,第二可更换夹具具有容纳模塑料的空腔。 固定支架用于将加热滑板固定在加热平台上。
    • 16. 发明申请
    • BONDING STRENGTH MEASURING DEVICE
    • 粘结强度测量装置
    • US20090175312A1
    • 2009-07-09
    • US12350643
    • 2009-01-08
    • Yi-Shao LaiTsung-Yueh TsaiHsiao-Chuan Chang
    • Yi-Shao LaiTsung-Yueh TsaiHsiao-Chuan Chang
    • G01N3/00
    • G01N19/04
    • A bonding strength measuring device for measuring the bonding strength between a substrate and a molding compound disposed on the substrate is provided. The measuring device includes a heating platform, a heating slide plate, and a fixing bracket. The heating platform has a first heating area and a first replaceable fixture. The substrate is disposed on the first heating area, and the first replaceable fixture is used to fix the substrate and has an opening exposing the molding compound. The heating slide plate has a second heating area and a second replaceable fixture. The second heating area is used to heat the molding compound, and the second replaceable fixture has a cavity for accommodating the molding compound. The fixing bracket is used to fix the heating slide plate above the heating platform.
    • 提供了用于测量基板和设置在基板上的模塑料之间的接合强度的接合强度测量装置。 测量装置包括加热平台,加热滑板和固定支架。 加热平台具有第一加热区域和第一可更换夹具。 基板设置在第一加热区域上,并且第一可更换夹具用于固定基板,并具有露出模塑料的开口。 加热滑板具有第二加热区域和第二可更换夹具。 第二加热区域用于加热模塑料,第二可更换夹具具有用于容纳模塑料的空腔。 固定支架用于将加热滑板固定在加热平台上。