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11. 发明申请

US20090082899A1 CALIBRATION ASSEMBLY FOR AN INSPECTION SYSTEM 失效
标题翻译：检验系统的校准组件
公开(公告)号：US20090082899A1
公开(公告)日：2009-03-26
申请号：US11858483
申请日：2007-09-20
申请人： Xiaoming Du , Kevin George Harding , Steven Robert Hayashi , Jianming Zheng , Tian Chen , Howard Paul Weaver , Yong Yang , Guofei Hu , James Allen Baird, JR.
发明人： Xiaoming Du , Kevin George Harding , Steven Robert Hayashi , Jianming Zheng , Tian Chen , Howard Paul Weaver , Yong Yang , Guofei Hu , James Allen Baird, JR.
IPC分类号： G06F19/00
CPC分类号： G05B19/4015 , B23Q17/22 , G05B2219/37069 , G05B2219/49177
摘要： A method of calibrating an inspection system is provided. The method includes contacting a test part with a run-out measurement device and rotating the test part and measuring a first run-out using the run-out measurement device. The method also includes moving the run-out measurement device to a new position and repeating the steps of contacting and rotating the test part to measure a second run-out at the new position. The method further includes using the first and second run-outs to adjust measurements of the inspection system.
摘要翻译：提供校准检查系统的方法。该方法包括使测试部件与跑出测量装置接触并旋转测试部件，并使用跑出测量装置测量第一次跑出。该方法还包括将跑出测量装置移动到新位置，并重复接触和旋转测试部件以测量新位置处的第二跳动的步骤。该方法进一步包括使用第一和第二跳动来调整检查系统的测量。

12. 发明授权

US07876454B2 Method and system for measurement of a cutting tool 失效
标题翻译：切削工具的测量方法和系统
公开(公告)号：US07876454B2
公开(公告)日：2011-01-25
申请号：US12240295
申请日：2008-09-29
申请人： Xiaoming Du , Kevin George Harding , Steven Robert Hayashi , Tian Chen , Jianming Zheng , Howard Paul Weaver , James Allen Baird , Xinjue Zou
发明人： Xiaoming Du , Kevin George Harding , Steven Robert Hayashi , Tian Chen , Jianming Zheng , Howard Paul Weaver , James Allen Baird , Xinjue Zou
IPC分类号： G01B11/24
CPC分类号： G01B11/24
摘要： A method for measurement of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing a first rotary scan of a first section of the cutting tool to generate a first scanning point cloud, segmenting the first scanning point cloud, performing a second rotary scan of the first section based on the segmentation of the first scanning point cloud, and extracting the parameters of the first section based on the second rotary scan of the first section. A system for extracting parameters of a cutting tool is also presented.
摘要翻译：提供了一种用于测量切削工具的方法。该方法包括将切割工具定位在可移动台上，对切割工具的第一部分执行第一旋转扫描以产生第一扫描点云，分割第一扫描点云，对第一部分进行第二旋转扫描在第一扫描点云的分割上，并且基于第一部分的第二旋转扫描来提取第一部分的参数。还提出了一种用于提取切削刀具参数的系统。

13. 发明授权

US07768655B2 Methods and system for measuring an object 失效
标题翻译：测量物体的方法和系统
公开(公告)号：US07768655B2
公开(公告)日：2010-08-03
申请号：US11642076
申请日：2006-12-20
申请人： Steven Robert Hayashi , Zhongguo Li , Kevin George Harding , Jianming Zheng , Howard Paul Weaver , Xiaoming Du , Tian Chen
发明人： Steven Robert Hayashi , Zhongguo Li , Kevin George Harding , Jianming Zheng , Howard Paul Weaver , Xiaoming Du , Tian Chen
IPC分类号： G01B11/24
CPC分类号： G01B11/24
摘要： A method of measuring an object includes positioning the object on a moveable stage, performing a rotary scan of the object with a range sensor, and determining geometric parameters of the object based on the rotary scan.
摘要翻译：测量物体的方法包括将物体定位在可移动台上，用距离传感器执行物体的旋转扫描，以及基于旋转扫描确定物体的几何参数。

14. 发明申请

US20100079769A1 METHOD AND SYSTEM FOR PARAMETER EXTRACTION OF A CUTTING TOOL 失效
标题翻译：切割工具参数提取的方法和系统
公开(公告)号：US20100079769A1
公开(公告)日：2010-04-01
申请号：US12419051
申请日：2009-04-06
申请人： Tian Chen , Kevin George Harding , Steven Robert Hayashi , Xiaoming Du , Jianming Zheng , Howard Paul Weaver , James Allen Baird , Xinjue Zou , Kevin William Meyer
发明人： Tian Chen , Kevin George Harding , Steven Robert Hayashi , Xiaoming Du , Jianming Zheng , Howard Paul Weaver , James Allen Baird , Xinjue Zou , Kevin William Meyer
IPC分类号： G01B11/00
CPC分类号： G01B11/24
摘要： A method for extracting parameters of a cutting tool is provided. The method comprises positioning the cutting tool on a moveable stage, performing one or more rotary scans of a first section of the cutting tool to generate a scanning point cloud, indexing a plurality of points of the scanning point cloud, detecting one or more feature points based on the indexed scanning point cloud, and extracting one or more parameters based on the detected feature points. A system for extracting the parameters is also presented.
摘要翻译：提供了一种用于提取切削工具的参数的方法。该方法包括将切割工具定位在可移动台上，对切割工具的第一部分进行一次或多次旋转扫描以产生扫描点云，对扫描点云的多个点进行索引，检测一个或多个特征点基于索引的扫描点云，并且基于检测到的特征点提取一个或多个参数。还提出了一个提取参数的系统。

15. 发明授权

US08911599B2 Tool adapter assembly and machining system 有权
标题翻译：工具适配器组装和加工系统
公开(公告)号：US08911599B2
公开(公告)日：2014-12-16
申请号：US13574345
申请日：2011-01-20
申请人： Hongtao Li , Bin Wei , Xiaobin Chen , Steven Robert Hayashi , Renwei Yuan , Yuanfeng Luo
发明人： Hongtao Li , Bin Wei , Xiaobin Chen , Steven Robert Hayashi , Renwei Yuan , Yuanfeng Luo
IPC分类号： B23H11/00 , C25F7/00 , B23H3/10 , B23H7/20 , B23H7/36
CPC分类号： B23H7/36 , B23H3/02 , B23H3/10 , B23H7/20 , B23H9/14
摘要： A machining system is provided and includes a machining tool comprising a spindle, one or more electrodes configured to perform the electromachining, and one or more tool holding elements configure to conductively hold the respective one or more electrodes and be assembled onto the spindle of the machining tool. The machining system further comprises one or more adapters and one or more power sources configured to electrically connect to the respective one or more adapters and the workpiece. The one or more adapters are configured to conductively contact the respective one or more tool holding elements. Further, the machining system comprises one or more machining solution sources provided to pass one or more machining solutions between the workpiece and the respective one or more electrodes. A tool adapter assembly is also presented.
摘要翻译：提供了一种加工系统，其包括一个加工工具，该加工工具包括一个主轴，一个或多个被配置为执行电机加工的电极，以及一个或多个工具保持元件，其构造成导电地保持相应的一个或多个电极并被组装到加工的主轴上工具。加工系统还包括一个或多个适配器和一个或多个配置成电连接到相应的一个或多个适配器和工件的电源。一个或多个适配器被配置为导电地接触相应的一个或多个工具保持元件。此外，加工系统包括一个或多个加工液源，其被提供以在工件和相应的一个或多个电极之间传递一个或多个加工溶液。还提供了工具适配器组件。

16. 发明申请

US20120285820A1 TOOL ADAPTER ASSEMBLY AND MACHINING SYSTEM 有权
标题翻译：工具适配器和加工系统
公开(公告)号：US20120285820A1
公开(公告)日：2012-11-15
申请号：US13574345
申请日：2011-01-20
申请人： Hongtao Li , Bin Wei , Xiaobin Chen , Steven Robert Hayashi , Renwei Yuan , Yuanfeng Luo
发明人： Hongtao Li , Bin Wei , Xiaobin Chen , Steven Robert Hayashi , Renwei Yuan , Yuanfeng Luo
IPC分类号： B23H3/10
CPC分类号： B23H7/36 , B23H3/02 , B23H3/10 , B23H7/20 , B23H9/14
摘要： A machining system is provided and includes a machining tool comprising a spindle, one or more electrodes configured to perform the electromachining, and one or more tool holding elements configure to conductively hold the respective one or more electrodes and be assembled onto the spindle of the machining tool. The machining system further comprises one or more adapters and one or more power sources configured to electrically connect to the respective one or more adapters and the workpiece. The one or more adapters are configured to conductively contact the respective one or more tool holding elements. Further, the machining system comprises one or more machining solution sources provided to pass one or more machining solutions between the workpiece and the respective one or more electrodes. A tool adapter assembly is also presented.
摘要翻译：提供了一种加工系统，其包括一个加工工具，该加工工具包括一个主轴，一个或多个被配置为执行电机加工的电极，以及一个或多个工具保持元件，其构造成导电地保持相应的一个或多个电极并被组装到加工主轴上工具。加工系统还包括一个或多个适配器和一个或多个配置成电连接到相应的一个或多个适配器和工件的电源。一个或多个适配器被配置为导电地接触相应的一个或多个工具保持元件。此外，加工系统包括一个或多个加工液源，其被提供以在工件和相应的一个或多个电极之间传递一个或多个加工溶液。还提供了工具适配器组件。

17. 发明授权

US07065479B2 Method for determining and compensating for peening-induced distortion 失效
公开(公告)号：US07065479B2
公开(公告)日：2006-06-20
申请号：US10156490
申请日：2002-05-28
申请人： David Peter Mika , Apostolos Pavlos Karafillis , Dale Robert Lombardo , Steven Robert Hayashi
发明人： David Peter Mika , Apostolos Pavlos Karafillis , Dale Robert Lombardo , Steven Robert Hayashi
IPC分类号： G06G7/48
CPC分类号： G06F17/5018 , C21D7/06 , G06F2217/80
摘要： A method for determining an equilibrium configuration for an object to be subjected to peening includes representing a bulk geometry of the object as a solid body and representing a surface of the object as a surface layer overlying the solid body. The method further includes expanding the surface layer in response to a number of thermal loads to simulate peening and balancing a number of forces on the surface layer and the solid body to determine the equilibrium configuration of the object after peening.

18. 发明授权

US5846035A Damage resistant drill 失效
标题翻译：耐磨钻
公开(公告)号：US5846035A
公开(公告)日：1998-12-08
申请号：US893485
申请日：1997-07-11
申请人： Apostolos Pavlos Karafillis , Steven Robert Hayashi
发明人： Apostolos Pavlos Karafillis , Steven Robert Hayashi
IPC分类号： B23B51/00 , B23B51/02 , B23B35/00
CPC分类号： B23B51/02 , B23B2251/18 , Y10T408/03 , Y10T408/909 , Y10T408/9097
摘要： A drill according to an exemplary embodiment of the invention comprises a shank from which the drill is driven; a body connected to the shank, the body having a surface; a flute in the body; a cutting edge at a drill point; and a peripheral relief surface which extends outwardly from the surface of the body to an outer circumference of the drill, wherein the peripheral relief surface, for a cross section of the drill perpendicular to a drill axis, intersects the outer circumference at a peripheral point at an edge of the flute. The drill has an improved capacity to withstand a loss of coolant during drilling without severe overheating of the drill or workpiece and with little damage to the drill and workpiece.
摘要翻译：根据本发明的示例性实施例的钻头包括：钻头从其驱动的柄; 连接到所述柄的主体，所述主体具有表面; 长笛在身上; 在钻头处的切削刃; 以及从所述主体的表面向外延伸到所述钻头的外圆周的周边浮雕表面，其中所述垂直于钻头轴线的所述钻头的横截面的所述周边浮雕表面在所述钻头的外围点处与所述外圆周相交长笛的边缘。该钻具具有改进的能力来承受在钻孔期间的冷却剂损失而钻头或工件的严重过热并且几乎不损坏钻头和工件。

19. 发明申请

US20130026380A1 RADIATION DETECTOR WITH ANGLED SURFACES AND METHOD OF FABRICATION 审中-公开
标题翻译：具有光刻表面的辐射探测器和制造方法
公开(公告)号：US20130026380A1
公开(公告)日：2013-01-31
申请号：US13191292
申请日：2011-07-26
申请人： John Eric Tkaczyk , Steven Robert Hayashi , Haochuan Jiang , Wenwu Zhang , Kristian William Andreini , Nitin Garg , Tan Zhang
发明人： John Eric Tkaczyk , Steven Robert Hayashi , Haochuan Jiang , Wenwu Zhang , Kristian William Andreini , Nitin Garg , Tan Zhang
IPC分类号： G01T1/24 , H01L31/18 , G01T1/16
CPC分类号： G01T1/2928
摘要： Radiations detectors with angled walls and methods of fabrication are provided. One radiation detector module includes a plurality of sensor tiles configured to detect radiation. The plurality of sensor tiles have (i) top and bottom edges defining top and bottom surfaces of the plurality of sensor tiles, (ii) sidewall edges defining sides of the plurality of sensor tiles, and (iii) corners defined by the top and bottom edges and the sidewall edges. The radiation detector module also has at least one beveled surface having an oblique angle, wherein the beveled surface includes beveling of at least one of top or bottom edges, the side wall edges, or the corners.
摘要翻译：提供了具有成角度壁的辐射检测器和制造方法。一个辐射探测器模块包括被配置成检测辐射的多个传感器瓦片。多个传感器瓦片具有（i）限定多个传感器瓦片的顶部和底部表面的顶部和底部边缘，（ii）限定多个传感器瓦片侧面的侧壁边缘，以及（iii）由顶部和底部限定的角部边缘和侧壁边缘。辐射检测器模块还具有至少一个具有倾斜角度的倾斜表面，其中斜面包括顶部或底部边缘，侧壁边缘或拐角中的至少一个的斜面。

20. 发明申请

US20100126877A1 ELECTROCHEMICAL GRINDING ELECTRODE, AND APPARATUS AND METHOD USING THE SAME 审中-公开
标题翻译：电化学研磨电极，以及使用该电极的装置和方法
公开(公告)号：US20100126877A1
公开(公告)日：2010-05-27
申请号：US12276499
申请日：2008-11-24
申请人： Yuanfeng Luo , Bin Wei , Steven Robert Hayashi , Andrew Lee Trimmer , Jian Wu
发明人： Yuanfeng Luo , Bin Wei , Steven Robert Hayashi , Andrew Lee Trimmer , Jian Wu
IPC分类号： C25F3/02 , C25F7/00
CPC分类号： B23H5/08 , B23H5/06 , B23H5/10
摘要： An electrochemical grinding electrode comprises an electrically conductive material; an arc resistance material; and an abrasive material different from the arc resistance material. An electrochemical grinding apparatus and a method are also presented.
摘要翻译：电化学研磨电极包括导电材料; 耐电弧材料; 以及与耐电弧材料不同的研磨材料。还提出了电化学研磨装置和方法。

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