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    • 11. 发明申请
    • MICROSCOPE AND METHOD FOR CONTROLLING MICROSCOPE
    • 显微镜和控制微阵列的方法
    • US20110058253A1
    • 2011-03-10
    • US12946067
    • 2010-11-15
    • Masayoshi KARASAWAKeisuke TamuraHideaki EndoTetsuya ShirotaTsuyoshi Mochizuki
    • Masayoshi KARASAWAKeisuke TamuraHideaki EndoTetsuya ShirotaTsuyoshi Mochizuki
    • G02B21/06
    • G02B21/06
    • A microscope includes a microscope main unit including a stage on which a specimen is to be placed; and a light source provided on the microscope main unit and emitting illumination light for illuminating the specimen. The microscope also includes a main power supply operable to be turned on and off; a sensor that senses the presence or absence of a subject in a front or side area of the microscope main unit; a determining unit that determines based on a result of the sensing whether the subject moves; and a control unit that turns on the light source when the main power supply is turned on, maintains the light source in an ON state when the determining unit determines that the subject moves, and turns off the light source when the determining unit determines that the subject does not move and a predetermined period of time passes.
    • 显微镜包括显微镜主单元,其包括待放置样本的载物台; 以及设置在显微镜主单元上并发射用于照射样本的照明光的光源。 显微镜还包括可操作以打开和关闭的主电源; 检测显微镜主单元的正面或侧面的被检体的存在或不存在的传感器; 确定单元,其基于所述感测的结果来确定所述被摄体是否移动; 以及控制单元,当所述主电源接通时接通所述光源,当所述确定单元确定所述被摄体移动时,将所述光源保持在ON状态,并且当所述确定单元确定所述光源 被摄体不移动并且经过预定的时间段。
    • 15. 发明申请
    • Integrated circuit designing system, method and program
    • 集成电路设计系统,方法和程序
    • US20050283744A1
    • 2005-12-22
    • US10972412
    • 2004-10-26
    • Tsuyoshi Mochizuki
    • Tsuyoshi Mochizuki
    • G06F17/50G06G7/62
    • G06F17/5022
    • When a simulation model generation unit converts logic on the gate level into a basic primitive which can be executed by a simulator to generate a simulation model, for the basic primitives a degeneracy processing unit determines and deletes a gate which can be deleted and which will not affect the delay stage count. The degeneracy processing unit is provided with a constant gate degeneracy unit which puts a plurality of constant gates together, a buffer degeneracy unit which deletes fan-out-free buffers and an identical fan-in gate degeneracy unit which puts identical fan-in gates together.
    • 当仿真模型生成单元将门级上的逻辑转换为可以由模拟器执行以生成模拟模型的基本原语时,对于基本原语,简并处理单元确定并删除可以被删除的门,哪些不会 影响延迟阶段计数。 简并处理单元设置有将多个恒定门放在一起的恒定栅极简并单元,一个删除无扇出缓冲器的缓冲器简并单元和将相同的扇入栅极放在一起的相同的扇入栅极简并单元 。
    • 16. 发明授权
    • Method and apparatus for continuously applying surface treatment onto an
article being fed along a pass line
    • 用于将表面处理连续地施加到沿着传送线进给的物品上的方法和装置
    • US4811748A
    • 1989-03-14
    • US848132
    • 1986-04-04
    • Masatsugu MuraoKazuhiko MuraoTsuyoshi Mochizuki
    • Masatsugu MuraoKazuhiko MuraoTsuyoshi Mochizuki
    • B08B3/02C23G3/02B08B3/04
    • B08B3/022C23G3/02
    • A continuous article has its surface treated twice by first and second jets of fluids as passing though a tunnel provided on a pass line. A fluid flow is supplied through each of first and second introducing ports into the tunnel where it is converted into each of the first and second jets of fluids, one rushing over the article in the same direction as the article and the other rushing over the same in the opposite direction thereto for effecting surface treatments respectively by the first and second jets of fluid. Each of the first and second jets causes a negative pressure to be developed at each inlet and outlet outlet of the tunnel through which the article enters and exits the tunnel. The negative pressure in turn draws in the ambient air through the inlet and the outlet over the article to thereby provide an air seal at each inlet and outlet, preventing the fluids introduced in the tunnel from escaping outwardly thereof. The fluids after rushing over the article advance into an expansion chamber formed within the tunnel midway between the inlet and the outlet and is recovered through a discharge port of the expansion chamber. Accordingly, the surface treatment of the article can be performed in a closed system so as not to worsen the working environment.
    • 连续制品的表面经过第一和第二流体射流两次,通过设在通行线上的隧道。 流体流通过第一和第二引入口中的每一个被供应到隧道中,在那里它被转换成第一和第二流体流中的每一个,一个在物品上沿与物品相同的方向冲过另一个,而另一个冲在同一个 在其相反方向上分别通过第一和第二流体射流进行表面处理。 第一和第二射流中的每一个导致在隧道的每个入口和出口处形成负压,物品通过该出口和出口穿过隧道进入和离开隧道。 负压又通过物品上的入口和出口吸入环境空气,从而在每个入口和出口处提供空气密封,防止引入隧道的流体向外逸出。 在冲洗物品之后的流体进入形成在入口和出口之间中间的隧道内的膨胀室中,并通过膨胀室的排放口回收。 因此,可以在封闭系统中进行制品的表面处理,以免使工作环境恶化。
    • 18. 发明授权
    • Total internal reflection illumination apparatus and microscope using this total internal reflection illumination apparatus
    • 全内反射照明装置和使用该全内反射照明装置的显微镜
    • US07245426B2
    • 2007-07-17
    • US11432811
    • 2006-05-11
    • Yasushi AonoTsuyoshi Mochizuki
    • Yasushi AonoTsuyoshi Mochizuki
    • G02B21/06
    • G02B21/16G02B21/06
    • A total internal reflection illumination apparatus applied to a microscope which illuminates a sample through an objective having a numerical aperture enabling total internal reflection illumination, comprises a first total internal reflection mirror which is arranged in the vicinity of an outermost peripheral part of an observation optical path of the microscope to reflect an incident illumination light in a direction of the objective, a second total internal reflection mirror which is arranged at a symmetrical position with the first total internal reflection mirror to sandwich an observation optical axis and reflects return light reflected on a surface of the sample in a direction different from the illumination optical path, and a return light dimming part configured to dim the return light reflected by the second total internal reflection mirror.
    • 应用于通过具有能够进行全内反射照明的数值孔径的物镜照射样品的显微镜的全内反射照明装置包括布置在观察光路的最外周部附近的第一全内反射镜 的第二全反射镜,其被布置在与第一全内反射镜对称的位置处以夹持观察光轴并且反射在表面上反射的返回光 在与所述照明光路不同的方向上的所述样本的反射光调光部,以及对由所述第二全内反射镜反射的返回光进行调光的返回光调光部。
    • 20. 发明授权
    • Total internal reflection illumination apparatus and microscope using this total internal reflection illumination apparatus
    • 全内反射照明装置和使用该全内反射照明装置的显微镜
    • US06819484B2
    • 2004-11-16
    • US10286639
    • 2002-11-01
    • Yasushi AonoTsuyoshi Mochizuki
    • Yasushi AonoTsuyoshi Mochizuki
    • G02B2100
    • G02B21/16G02B21/06
    • A total internal reflection illumination apparatus applied to a microscope which illuminates a sample through an objective having a numerical aperture enabling total internal reflection illumination, comprises a first total internal reflection mirror which is arranged in the vicinity of an outermost peripheral part of an observation optical path of the microscope to reflect an incident illumination light in a direction of the objective, a second total internal reflection mirror which is arranged at a symmetrical position with the first total internal reflection mirror to sandwich an observation optical axis and reflects return light reflected on a surface of the sample in a direction different from the illumination optical path, and a return light dimming part configured to dim the return light reflected by the second total internal reflection mirror.
    • 应用于通过具有能够进行全内反射照明的数值孔径的物镜照射样品的显微镜的全内反射照明装置包括布置在观察光路的最外周部附近的第一全内反射镜 的第二全反射镜,其被布置在与第一全内反射镜对称的位置处以夹持观察光轴并且反射在表面上反射的返回光 在与所述照明光路不同的方向上的所述样本的反射光调光部,以及对由所述第二全内反射镜反射的返回光进行调光的返回光调光部。