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    • 11. 发明授权
    • Microscope apparatus and microscope system
    • 显微镜仪器和显微镜系统
    • US07876500B2
    • 2011-01-25
    • US12059043
    • 2008-03-31
    • Toshiyuki HattoriTatsuo NakataYasunari MatsukawaAkinori ArayaMasaharu Tomioka
    • Toshiyuki HattoriTatsuo NakataYasunari MatsukawaAkinori ArayaMasaharu Tomioka
    • G02B21/00
    • G02B21/367
    • It is possible to check for observation success or failure and the observation history without waiting for observation to be completely finished, thus saving time and energy required for observation, and avoiding lost opportunities for observation of precious samples etc. Provided is a microscope apparatus including an image acquisition unit for acquiring a plurality of frame images while varying a plurality of parameters; an image saving unit for successively saving the frame images acquired by the image acquisition unit; a property-information saving unit for saving property information in which identifying information of the saved frame images is associated with the parameters; and a control unit for controlling these units, wherein the control unit saves updated property information in the property-information saving unit each time the frame image is saved in the image saving unit.
    • 可以检查观察成功或失败以及观察历史,而不等待观察完全完成,从而节省观察所需的时间和精力,并避免丢失观察珍贵样品等的机会。提供一种显微镜装置,包括 图像获取单元,用于在改变多个参数的同时获取多个帧图像; 图像保存单元,用于连续地保存由图像获取单元获取的帧图像; 属性信息保存单元,用于保存其中保存的帧图像的识别信息与参数相关联的属性信息; 以及用于控制这些单元的控制单元,其中,每当帧图像被保存在图像保存单元中时,控制单元将更新的属性信息保存在属性信息保存单元中。
    • 12. 发明授权
    • Scanning microscope and adjusting method for the same
    • 扫描显微镜和调整方法相同
    • US07773297B2
    • 2010-08-10
    • US12079153
    • 2008-03-25
    • Yasunari MatsukawaMasaharu TomiokaAkinori ArayaToshiyuki Hattori
    • Yasunari MatsukawaMasaharu TomiokaAkinori ArayaToshiyuki Hattori
    • G02B21/06
    • G02B21/008G02B21/365
    • A scanning microscope includes an objective lens for focusing illumination light onto a specimen; a scanning device for deflecting and scanning the illumination light; a pupil-projection optical system for illuminating a pupil of the objective lens with the scanned illumination light; and a total-magnification specifying unit for specifying a total magnification. An optical-system selecting unit changes at least one of the objective lens and the pupil-projection optical system such that a magnification of an optical system including the objective lens and the pupil-projection optical system is equal to or less than the total magnification specified by the total-magnification specifying unit and that the numerical aperture of the optical system is maximized. A deflection-angle determination unit determines a deflection angle of the illumination light deflected by the scanning device based on the ratio of the magnification of the optical system to the total magnification to achieve the total magnification.
    • 扫描显微镜包括用于将照明光聚焦到样本上的物镜; 用于偏转和扫描照明光的扫描装置; 用于利用扫描的照明光照射物镜的光瞳的光瞳投影光学系统; 以及用于指定总放大率的总放大率指定单元。 光学系统选择单元改变物镜和瞳孔投影光学系统中的至少一个,使得包括物镜和瞳孔投影光学系统的光学系统的放大倍数等于或小于指定的总倍率 通过总倍率指定单元,并且光学系统的数值孔径最大化。 偏转角确定单元基于光学系统的倍率与总放大率的比率确定由扫描装置偏转的照明光的偏转角,以实现总放大率。
    • 13. 发明申请
    • MICROSCOPE APPARATUS AND MICROSCOPE SYSTEM
    • MICROSCOPE装置和显微镜系统
    • US20080246839A1
    • 2008-10-09
    • US12059043
    • 2008-03-31
    • Toshiyuki HattoriTatsuo NakataYasunari MatsukawaAkinori ArayaMasaharu Tomioka
    • Toshiyuki HattoriTatsuo NakataYasunari MatsukawaAkinori ArayaMasaharu Tomioka
    • H04N7/18
    • G02B21/367
    • It is possible to check for observation success or failure and the observation history without waiting for observation to be completely finished, thus saving time and energy required for observation, and avoiding lost opportunities for observation of precious samples etc. Provided is a microscope apparatus including an image acquisition unit for acquiring a plurality of frame images while varying a plurality of parameters; an image saving unit for successively saving the frame images acquired by the image acquisition unit; a property-information saving unit for saving property information in which identifying information of the saved frame images is associated with the parameters; and a control unit for controlling these units, wherein the control unit saves updated property information in the property-information saving unit each time the frame image is saved in the image saving unit.
    • 可以检查观察成功或失败以及观察历史,而不等待观察完全完成,从而节省观察所需的时间和精力,并避免丢失观察珍贵样品等的机会。提供一种显微镜装置,包括 图像获取单元,用于在改变多个参数的同时获取多个帧图像; 图像保存单元,用于连续地保存由图像获取单元获取的帧图像; 属性信息保存单元,用于保存其中保存的帧图像的识别信息与参数相关联的属性信息; 以及用于控制这些单元的控制单元,其中,每当帧图像被保存在图像保存单元中时,控制单元将更新的属性信息保存在属性信息保存单元中。
    • 14. 发明申请
    • Scanning laser microscope apparatus
    • 扫描激光显微镜装置
    • US20060278530A1
    • 2006-12-14
    • US11447761
    • 2006-06-06
    • Kunihiko SasakiYasunari MatsukawaHiroshi SasakiTatsuo Nakata
    • Kunihiko SasakiYasunari MatsukawaHiroshi SasakiTatsuo Nakata
    • B01D57/02B01D59/42B01D59/50
    • G02B21/008G01N21/6458
    • A scanning laser microscope that can quantitatively display a laser irradiation power on a display unit and that can suppress fluctuations in the laser irradiation power is provided. The scanning laser microscope includes a light source configured to emit laser light, a scanning unit configured to scan the laser light emitted from the light source on a sample, a photodetector configured to detect light from the sample, a processing unit configured to convert a signal from the photodetector into an image signal of the sample and to output the image signal, a reference light detector configured to detect part of the laser light emitted from the light source as a reference light signal, a laser light control unit configured to control the power of the laser light emitted from the light source, an irradiation-power calculation unit configured to calculate an irradiation power value at the sample on the basis of the reference light signal detected by the reference light detector, and a display unit configured to display the calculated irradiation power value at the sample.
    • 提供了一种可以在显示单元上定量显示激光照射功率并且可以抑制激光照射功率的波动的扫描激光显微镜。 该扫描激光显微镜包括配置为发射激光的光源,被配置为扫描从样品上的光源发射的激光的扫描单元,被配置为检测来自样品的光的光电检测器,被配置为将信号 从光电检测器到样品的图像信号并输出​​图像信号;参考光检测器,被配置为检测从光源发射的激光的一部分作为参考光信号;激光控制单元,被配置为控制功率 照射功率计算单元,被配置为基于由参考光检测器检测的参考光信号计算样本处的照射功率值;以及显示单元,被配置为显示所计算的 样品照射功率值。