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    • 11. 发明申请
    • Voltage Controlled Static Random Access Memory
    • 电压控制静态随机存取存储器
    • US20080049534A1
    • 2008-02-28
    • US11923796
    • 2007-10-25
    • John FifieldHarold Pilo
    • John FifieldHarold Pilo
    • G11C5/14
    • G11C8/08G11C11/413
    • A static random access memory (SRAM) comprising a plurality of SRAM cells, a plurality of wordlines(WL0-WLN) and a voltage regulator for driving the wordlines with a wordline voltage signal (VWLP). The wordline voltage signal is determined so as to reduce the likelihood of occurrence of read-disturbances and other memory instabilities. In one embodiment, the wordline voltage signal is determined as a function of the metastability voltage (VMETA) of the SRAM cells and an adjusted most positive down level voltage (VAMPDL) that is a function of a predetermined voltage margin (VM) and a most positive down level voltage (VMPDL) that corresponds to the read-disturb voltage of the SRAM cells.
    • 一种静态随机存取存储器(SRAM),包括多个SRAM单元,多个字线(WL 0 -WLN)和用于用字线电压信号(VWLP)驱动字线的电压调节器。 确定字线电压信号以便减少发生读取干扰和其它存储器不稳定性的可能性。 在一个实施例中,字线电压信号被确定为SRAM单元的亚稳态电压(VMETA)的函数,以及作为预定电压余量(VM)的函数的经调整的最正向下电平电压(VAMPDL) 对应于SRAM单元的读取 - 干扰电压的正向下电平电压(VMPDL)。
    • 13. 发明申请
    • METHOD OF IMPROVING FUSE STATE DETECTION AND YIELD IN SEMICONDUCTOR APPLICATIONS
    • 改进半导体应用中保险丝状态检测和电位的方法
    • US20070222497A1
    • 2007-09-27
    • US11277315
    • 2006-03-23
    • John BarwinSteven LamphierHarold Pilo
    • John BarwinSteven LamphierHarold Pilo
    • H01H37/76
    • G11C17/18H01L23/5256H01L2924/0002H01L2924/00
    • Disclosed are embodiments of an apparatus incorporating a detection circuit adapted for determining the state of selected fuses and a programming circuit for blowing selected fuses on demand. Also, disclosed are embodiments of an associated method. The detection circuit comprises a plurality of fuses in identical signal and reference legs in order to increase the signal margin for detecting blown fuses and/or current sources configured to pass offset currents through the signal and reference legs in order to set the trip point for detecting blown fuses between the un-blown and the minimum blown resistances. Thus, the invention provides the flexibility of single-sided fuse state detection devices with even greater sensitivity than both single-sided and differential fuse state detection device.
    • 公开了一种装置的实施例,其包括适于确定所选保险丝的状态的检测电路和用于根据需要吹送选定保险丝的编程电路。 此外,公开了相关方法的实施例。 检测电路包括相同的信号和参考支路中的多个保险丝,以便增加用于检测熔断熔丝和/或电流源的信号余量,该熔断器和/或电流源被配置为使偏移电流通过信号和参考支路,以便设置用于检测的跳闸点 在未吹塑和最小吹塑电阻之间熔断熔断器。 因此,本发明提供具有比单面和差分熔丝状态检测装置更高灵敏度的单面熔丝状态检测装置的灵活性。
    • 15. 发明申请
    • VOLTAGE CONTROLLED STATIC RANDOM ACCESS MEMORY
    • 电压控制随机访问存储器
    • US20070035985A1
    • 2007-02-15
    • US11161742
    • 2005-08-15
    • John FifieldHarold Pilo
    • John FifieldHarold Pilo
    • G11C11/00
    • G11C8/08G11C11/413
    • A static random access memory (SRAM) (200, 400) comprising a plurality of SRAM cells (204), a plurality of wordlines (WL0-WLN) and a voltage regulator (240, 240′, 300, 516) for driving the wordlines with a wordline voltage signal (VWLP). The wordline voltage signal is determined so as to reduce the likelihood of occurrence of read-disturbances and other memory instabilities. In one embodiment, the wordline voltage signal is determined as a function of the metastability voltage (VMETA) of the SRAM cells and an adjusted most positive down level voltage (VAMPDL) that is a function of a predetermined voltage margin (VM) and a most positive down level voltage (VMPDL) that corresponds to the read-disturb voltage of the SRAM cells.
    • 包括多个SRAM单元(204),多个字线(WL 0 -WLN)和用于驱动所述多个SRAM单元的电压调节器(240,240',300,516)的静态随机存取存储器(SRAM)(200,400) 具有字线电压信号(VWLP)的字线。 确定字线电压信号以便减少发生读取干扰和其它存储器不稳定性的可能性。 在一个实施例中,字线电压信号被确定为SRAM单元的亚稳态电压(VMETA)的函数,以及作为预定电压余量(VM)的函数的经调整的最正向下电平电压(VAMPDL) 对应于SRAM单元的读取 - 干扰电压的正向下电平电压(VMPDL)。
    • 17. 发明授权
    • Method and apparatus for improving cycle time in a quad data rate SRAM device
    • 用于改善四倍数据速率SRAM器件中的周期时间的方法和装置
    • US06967861B2
    • 2005-11-22
    • US10708379
    • 2004-02-27
    • George M. BracerasHarold Pilo
    • George M. BracerasHarold Pilo
    • G11C8/00G11C11/00G11C11/413
    • G11C11/413
    • A method for implementing a self-timed, read to write operation in a memory storage device. In an exemplary embodiment, the method includes capturing a read address during a first half of a current clock cycle, and commencing a read operation so as to read data corresponding to the captured read address onto a pair of bit lines. A write operation is commenced for the current clock cycle so as to cause write data to appear on the pair of bit lines as soon as the read data from the captured read address is amplified by a sense amplifier, wherein the write operation uses a previous write address captured during a preceding clock cycle. A current write address is captured during a second half of the current clock cycle, said current write address used for a write operation implemented during a subsequent clock cycle, wherein the write operation for the current clock cycle is timed independent of the current write address captured during said second half of the current clock cycle.
    • 一种用于在存储器存储设备中实现自定时的读写操作的方法。 在一个示例性实施例中,该方法包括在当前时钟周期的前半部分期间捕获读取地址,并开始读取操作,以便将对应于所捕获的读取地址的数据读取到一对位线上。 一旦当前时钟周期开始写入操作,以便一旦来自捕获的读取地址的读取数据被读出放大器放大,就会使写入数据出现在该对位线上,其中写入操作使用先前的写入 在前一个时钟周期捕获的地址。 在当前时钟周期的后半段期间捕获当前写入地址,所述当前写入地址用于在随后的时钟周期期间实现的写入操作,其中当前时钟周期的写入操作被独立于捕获的当前写入地址 在当前时钟周期的后半段。