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    • 11. 发明授权
    • Transistor
    • 晶体管
    • US06703665B1
    • 2004-03-09
    • US09639811
    • 2000-08-17
    • Hideyuki Nakamura
    • Hideyuki Nakamura
    • H01L2974
    • H01L29/7802H01L29/0634H01L29/0878H01L29/0886H01L29/1095H01L29/42372H01L29/66712H01L29/7395H01L29/7809
    • A withstand voltage region of a second conductivity type is formed in a drain layer of a first conductivity type in a semiconductor substrate, and a conductive region of the first conductivity type is partly formed in the withstand voltage region by being diffused from the surface of the withstand voltage region. The conductive region has a bottom held in contact with the drain layer. A base region and a source region are formed in the surface of semiconductor substrate, with a region between the source region and the conductive region serving as a channel region, thus producing a transistor. When a voltage is applied to a gate electrode film on the channel region to form an inverted layer, the source region and the drain layer are connected to each other by the inverted layer and the conductive region.
    • 第二导电类型的耐电压区域形成在半导体衬底中的第一导电类型的漏极层中,并且第一导电类型的导电区域通过从耐蚀电压区域的表面扩散而部分地形成在耐电压区域中 耐电压区域。 导电区域具有与漏极层保持接触的底部。 在半导体衬底的表面中形成基极区域和源极区域,源极区域和导电区域之间的区域用作沟道区域,从而产生晶体管。 当在沟道区上施加电压到栅电极膜以形成反转层时,源区和漏层通过反相层和导电区相互连接。
    • 12. 发明授权
    • Thermal transfer material and image forming material using the same
    • 热转印材料和使用其的成像材料
    • US06703087B1
    • 2004-03-09
    • US09598512
    • 2000-06-21
    • Kazuhito MiyakeHideyuki NakamuraAkira Hatakeyama
    • Kazuhito MiyakeHideyuki NakamuraAkira Hatakeyama
    • B41M530
    • B41M5/395
    • It is an object of the present invention to provide a thermal transfer material which has an image forming layer of low fusible viscosity, which has an excellent transferring sensitivity, which is able to form a high quality image, and in which leakage of a thermally fusible substance is not caused so that there is hardly any contamination of hardware such as an image forming device by the thermally fusible substance. Such an object is accomplished by providing a thermal transfer material having a support, and on the support, an image forming layer which contains a pigment, at least one thermally fusible substance, and at least one resin, in which given that a weight ratio of one thermally fusible substance i to one resin j is bij (weight of the thermally fusible substance i/weight of the resin j), and an absolute value of a difference between solubility parameter (SP) values of the thermally fusible substance i and the resin j is aij (absolute value of (SP value of the thermally fusible substance i)−(SP value of the resin j)), then bij
    • 本发明的目的是提供一种热转印材料,其具有低易熔粘度的图像形成层,其具有优异的转印灵敏度,其能够形成高质量图像,并且其中热熔体 不会引起物质,使得几乎不会受到热熔性物质的成像装置等硬件的污染。 这样的目的是通过提供一种具有支撑体的热转印材料,并且在支撑体上,形成含有颜料,至少一种热熔性物质和至少一种树脂的图像形成层,其中给定重量比 一种热熔性物质i与一种树脂j是Bij(热熔体i的重量/树脂j的重量),热熔性物质i和树脂的溶解度参数(SP)值之差的绝对值 j是aij(热熔物质i的SP值(树脂j的SP值)的绝对值),则bij <(0.03 / Aij)。
    • 13. 发明授权
    • Memory-mounting integrated circuit and test method thereof
    • 内存安装集成电路及其测试方法
    • US06668348B1
    • 2003-12-23
    • US09618824
    • 2000-07-18
    • Hideyuki Nakamura
    • Hideyuki Nakamura
    • G01R3128
    • G01R31/3187G11C29/12G11C2029/0405
    • To provide such a memory-mounting integrated circuit as well as a memory test method that can reduce costs to incur for a tester, regulate the number of the input-output terminals for testing, and nevertheless can monitor from outside all the contents of defects in principle. The memory-mounting integrated circuit on which at least a BIST circuit and a memory are mounted, in which the above described BIST circuit includes a data storing apparatus to store the data in a normal memory, a comparing apparatus to compare a memory test result signal from the above described memory with data from the above described data storing apparatus to output a first comparing signal, a control apparatus to control to implement outputting outward from the first comparing signal outputted by the above described comparing apparatus, and an output apparatus to output defective data outward by the above described control apparatus.
    • 为了提供这种存储器安装集成电路以及可以降低测试者的成本的存储器测试方法,调节用于测试的输入 - 输出端子的数量,并且可以从外部监视所有缺陷内容 原理。 至少安装了BIST电路和存储器的存储器安装集成电路,其中上述BIST电路包括用于将数据存储在正常存储器中的数据存储装置,比较装置,用于比较存储器测试结果信号 从上述存储器中读取来自上述数据存储装置的数据以输出第一比较信号,控制装置,用于执行从上述比较装置输出的第一比较信号向外输出的控制装置,以及输出缺陷的输出装置 数据由上述控制装置向外。
    • 15. 发明授权
    • Connection member for friction stir welding
    • 摩擦搅拌焊接接头
    • US06568872B2
    • 2003-05-27
    • US09785481
    • 2001-02-20
    • Takeshi KawasakiToshiaki SagawaHideyuki Nakamura
    • Takeshi KawasakiToshiaki SagawaHideyuki Nakamura
    • B23K2012
    • B23K33/00B23K20/122B23K2101/006B23K2101/045Y10T403/477Y10T403/478Y10T428/12
    • An abutted portion of face plates (12b and 22b) of hollow frame members (10 and 20) is carried out according to a friction stir joining. Next, a connection member (30) is mounted, one end of the connection member (30) is abutted to an end portion of the face plate (11) of the hollow frame member (10). Under this condition, the abutted portion between the face plate (11) and the connection member (30) is carried out according to the friction stir joining. An overlapping portion between another end of the connection member (30) and the hollow frame member (20) is carried out according to the friction stir joining. According to demands, the connection member (30) and the face plate (21) of the hollow member (20) are welded. Without of regard of a dimension accuracy of the hollow frame member and the like, a good joining from one side face of the hollow frame member can be carried out.
    • 根据摩擦搅拌接合来执行中空框架构件(10和20)的面板(12b和22b)的邻接部分。 接下来,安装连接构件(30),连接构件(30)的一端与中空框架构件(10)的面板(11)的端部抵接。 在这种情况下,面板(11)和连接部件(30)之间的抵接部分根据摩擦搅拌接合进行。 根据摩擦搅拌接合来进行连接构件(30)的另一端与中空框架构件(20)的重叠部分。 根据需要,中空构件(20)的连接构件(30)和面板(21)被焊接。 不考虑中空框架构件等的尺寸精度,可以进行从中空框架构件的一个侧面的良好接合。