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    • 11. 发明申请
    • Solid-state image pickup device
    • 固态图像拾取装置
    • US20070222885A1
    • 2007-09-27
    • US11723459
    • 2007-03-20
    • Motonari KatsunoRyohei Miyagawa
    • Motonari KatsunoRyohei Miyagawa
    • H04N5/225
    • H04N5/335
    • In a solid-state image pickup device, it is difficult to match an optimum incidence angle corresponding to an image height of a pixel array region with light incidence characteristics of a camera lens, thereby causing image quality deterioration due to sensitivity shading. Respective microlenses are disposed in a two-dimensional manner, i.e., in a row and a column directions. In particular, the microlenses are disposed such that each side of a disposition region where the microlenses are disposed has a concave curve with respect to a line connecting adjacent vertexes of the disposition region. In other words, a distance AH (AV) between center points of a pair of facing sides of the disposition region is set to be smaller than a distance BH (BV) between neighboring vertexes of the disposition region.
    • 在固态图像拾取装置中,难以将与像素阵列区域的图像高度相对应的最佳入射角与相机透镜的光入射特性相匹配,从而导致由于灵敏度阴影引起的图像质量劣化。 各个微透镜以二维方式设置,即以行和列方向布置。 特别地,微透镜被布置成使得布置微透镜的布置区域的每一侧相对于连接配置区域的相邻顶点的线具有凹曲线。 换句话说,位于配置区域的一对相对侧的中心点之间的距离A(H)将被设定为小于距离B V)。
    • 17. 发明申请
    • SOLID-STATE IMAGE SENSOR AND MANUFACTURING METHOD THEREOF
    • 固态图像传感器及其制造方法
    • US20090278181A1
    • 2009-11-12
    • US12434474
    • 2009-05-01
    • Shouzi TANAKARyohei Miyagawa
    • Shouzi TANAKARyohei Miyagawa
    • H01L31/112H01L21/265
    • H01L27/14603H01L21/26586H01L27/1463H01L27/14689
    • A solid-state image sensor includes: a trench isolation region; a photodiode region for converting incident light to signal charges and accumulating the signal charges therein; a floating diffusion region for accumulating the signal charges of the photodiode region; a gate electrode formed over the element formation region located between the photodiode region and the floating diffusion region, and formed so that both ends of the gate electrode respectively overlap a part of the photodiode region and a part of the floating diffusion region; and an inactive layer formed in a region located in a bottom portion and sidewall portions of the trench isolation region. An impurity concentration in a region located under the gate electrode in the inactive layer is lower than that in a region other than the region located under the gate electrode in the inactive layer.
    • 固态图像传感器包括:沟槽隔离区域; 用于将入射光转换为信号电荷并在其中累积信号电荷的光电二极管区域; 用于累积光电二极管区域的信号电荷的浮动扩散区域; 栅电极,形成在位于光电二极管区域和浮动扩散区域之间的元件形成区域上,并且形成为使得栅电极的两端分别与光电二极管区域的一部分和浮动扩散区域的一部分重叠; 以及形成在位于沟槽隔离区域的底部和侧壁部分中的区域中的非活性层。 在非活性层中位于栅电极下方的区域中的杂质浓度低于非活性层中位于栅电极下方的区域以外的区域中的杂质浓度。
    • 19. 发明申请
    • Solid-state image pickup device and method for manufacturing the same
    • 固体摄像装置及其制造方法
    • US20070111359A1
    • 2007-05-17
    • US11590794
    • 2006-11-01
    • Mikiya UchidaRyohei Miyagawa
    • Mikiya UchidaRyohei Miyagawa
    • H01L21/00
    • H01L27/14643H01L27/14689
    • Realized are a solid-state image pickup device whose element patterns are miniaturized and a method for manufacturing the solid-state image pickup device, in which furnace-annealing is employed without performing a process of nitriding a gate oxide film and a rapid thermal treatment in main heat treatment processes. The method for manufacturing the solid-state image pickup device according to the present invention comprises the steps of forming respective gate insulating films of an N-channel transistor and a P-channel transistor by thermally oxidizing a semiconductor substrate; forming a gate electrode of the P-channel transistor and forming a gate electrode of the N-channel transistor so as to have a minimum gate length equal to or less than 0.3 μm; implanting impurity into the semiconductor substrate utilizing the gate electrodes as a mask; and furnace-annealing the semiconductor substrate having the impurity implanted thereinto.
    • 实现了其元件图案小型化的固态图像拾取装置和用于制造固态图像拾取装置的方法,其中在不进行氮化栅极氧化膜的工艺和快速热处理的情况下使用炉退火 主要热处理工艺。 根据本发明的固体摄像装置的制造方法包括以下步骤:通过热氧化半导体衬底形成N沟道晶体管和P沟道晶体管的各个栅极绝缘膜; 形成所述P沟道晶体管的栅极,并形成所述N沟道晶体管的栅电极,使其栅极长度等于或小于0.3μm; 使用栅电极作为掩模将杂质注入半导体衬底; 并对其中注入杂质的半导体衬底进行炉退火。
    • 20. 发明授权
    • Solid state imager
    • 固态成像仪具有降低的漏电流
    • US06617625B2
    • 2003-09-09
    • US09886993
    • 2001-06-25
    • Ryohei Miyagawa
    • Ryohei Miyagawa
    • H01L31062
    • H01L27/14609H01L27/1463
    • A device region surrounded by a device isolation region has a rectangular shape with a width in a direction in which a gate electrode of a transfer gate extends. A signal accumulation region of a photodiode is disposed on the entirety of that portion of the device region, which is located on a source side of the gate electrode of the transfer gate. A detection section having a width in the direction in which the gate electrode extends is disposed on that portion of the device region, which is located on a drain side of the gate electrode of the transfer gate. The size of the detection section is set to be as small as possible. Two edge portions of the detection section, which are located in the direction of extension of the gate electrode, are spaced apart from the device isolation region.
    • 由器件隔离区域围绕的器件区域具有在转移栅极的栅电极延伸的方向上具有宽度的矩形形状。 光电二极管的信号存储区域设置在位于传输门的栅电极的源极侧的器件区域的整个部分上。 具有栅极延伸方向的宽度的检测部分设置在位于传输门的栅电极的漏极侧的器件区域的该部分上。 检测部的尺寸尽可能小。 位于栅极延伸方向上的检测部分的两个边缘部分与器件隔离区间隔开。