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11. 发明授权

US07335328B2 Method for manufacturing multilayer ceramic capacitor 有权
标题翻译：多层陶瓷电容器制造方法
公开(公告)号：US07335328B2
公开(公告)日：2008-02-26
申请号：US10502602
申请日：2003-10-24
申请人： Kazuki Hirata , Kenji Oka , Kazuhiro Komatsu , Atsuo Nagai
发明人： Kazuki Hirata , Kenji Oka , Kazuhiro Komatsu , Atsuo Nagai
IPC分类号： H01G4/00 , C04B33/32
CPC分类号： H01G4/30 , H01G4/1227
摘要： A method of manufacturing a multilayer ceramic capacitor includes the steps of: preparing a mixture of a raw material powder mainly composed of barium titanate particles; forming the mixture and a binder into a green sheet; alternately layering the green sheet and an internal electrode to obtain a laminated body; and sintering the laminated body. The step of preparing the mixture includes the steps of: introducing the raw material powder and the dispersion medium into a mixing container, and stirring them with balls serving as a mixing medium, to obtain a slurry containing a raw material powder mixture; and drying the slurry. The mixing medium has a diameter that is equal to or less than 400 times the mean particle size of the barium titanate particles of the raw material. The present invention provides a multilayer ceramic capacitor having good DC bias characteristics by suppressing the variation in crystal particles.
摘要翻译：制造多层陶瓷电容器的方法包括以下步骤：制备主要由钛酸钡颗粒组成的原料粉末的混合物; 将所述混合物和粘合剂形成生片; 交替层叠生片和内部电极以获得层压体; 并烧结层叠体。制备混合物的步骤包括以下步骤：将原料粉末和分散介质引入混合容器中，并用作为混合介质的滚珠搅拌，得到含有原料粉末混合物的浆料; 并干燥浆料。混合介质的直径等于或小于原料的钛酸钡颗粒的平均粒度的400倍。本发明通过抑制晶体颗粒的变化来提供具有良好DC偏置特性的多层陶瓷电容器。

12. 发明申请

US20070291992A1 RANGING DEVICE UTILIZING IMAGE PROCESSING 有权
标题翻译：使用图像处理的范围设备
公开(公告)号：US20070291992A1
公开(公告)日：2007-12-20
申请号：US11839701
申请日：2007-08-16
申请人： Nobukazu Shima , Akihiro Oota , Kenji Oka
发明人： Nobukazu Shima , Akihiro Oota , Kenji Oka
IPC分类号： G06K9/00
CPC分类号： G06K9/00805 , B60W2420/42 , G06K9/3241 , G06K2209/23 , G06T7/97
摘要： An image size changing section obtains a size changed image by changing the size of one of two original images captured by a pair of cameras. If an edge of an object has many oblique components, the edge is difficult to detect as a vertical edge but, when the image is horizontally reduced, an oblique edge becomes close to a vertical edge. For this reason, feature end points are extracted with reliability by a feature extracting section and, thereby, an object is recognized and the distance to the object is determined reliably.
摘要翻译：图像尺寸改变部通过改变由一对相机拍摄的两个原始图像中的一个的尺寸来获得尺寸改变图像。如果物体的边缘具有许多倾斜分量，则边缘难以被检测为垂直边缘，但是当图像水平减小时，倾斜边缘变得接近垂直边缘。因此，通过特征提取部分可靠地提取特征终点，从而识别对象并且可靠地确定到对象的距离。

13. 发明授权

US07233279B2 Method and device for distance measurement by pulse radar 有权
标题翻译：脉冲雷达测距方法及装置
公开(公告)号：US07233279B2
公开(公告)日：2007-06-19
申请号：US11019378
申请日：2004-12-23
申请人： Masayoshi Moriya , Satoshi Ishii , Tetsuo Seki , Kazuaki Hamada , Kenji Oka , Akihiro Ohta
发明人： Masayoshi Moriya , Satoshi Ishii , Tetsuo Seki , Kazuaki Hamada , Kenji Oka , Akihiro Ohta
IPC分类号： G01S13/08 , G01S13/12
CPC分类号： G01S13/20 , G01S13/18 , G01S13/227 , G01S13/24
摘要： In order to provide the method and the device for distance measurement by pulse radar that securely eliminates the false echo from the distance over the detectable limit determined by the pulse generation cycle, the pulse radar comprises the pulse signal sending unit that generates the pulse signals with different cycles at OSC 9a˜9c, switches to the predetermined intervals by OSC switch 10, and sends the pulse signal to targets, the reflected signal receiving unit that receives the reflected signals and stores the data in the RAM 25, the reflected signal data acquisition unit that obtains the data of each reflected signal, and the reflected signal identification unit that compares the intensity of the reflected signals obtained at the same lag time point during a certain time period after sending the pulse signal for reference and identifies the reflected signals of the sent pulse signal for reference.
摘要翻译：为了提供通过脉冲雷达进行距离测量的方法和装置，从脉冲发生周期确定的可检测限度的距离安全地消除假回波，脉冲雷达包括产生脉冲信号的脉冲信号发送单元，在OSC 9 a〜9 c处的不同周期，由OSC开关10切换到预定间隔，并将脉冲信号发送到目标，反射信号接收单元接收反射信号并将数据存储在RAM 25中，反射信号数据获取单元，其获得每个反射信号的数据;以及反射信号识别单元，其在发送用于参考的脉冲信号之后的特定时间段内比较在相同滞后时间点获得的反射信号的强度，并且识别反射信号的发送脉冲信号供参考。

14. 发明授权

US07221486B2 Method and apparatus for picking up 2D image of an object to be sensed 失效
标题翻译：拾取被感测物体的2D图像的方法和装置
公开(公告)号：US07221486B2
公开(公告)日：2007-05-22
申请号：US10265659
申请日：2002-10-08
申请人： Hiroshi Makihira , Shunji Maeda , Kenji Oka , Minoru Yoshida , Yasuhiko Nakayama
发明人： Hiroshi Makihira , Shunji Maeda , Kenji Oka , Minoru Yoshida , Yasuhiko Nakayama
IPC分类号： H04N1/04
CPC分类号： G06T7/0004 , G06T2207/30148
摘要： A method and apparatus for sensing by a linear image sensor a two-dimensional image of an object to be sensed includes detecting a position of the object by a position sensor having a first resolution, picking up an image of the object being projected in a direction (V-scan direction) generally perpendicular to an internal scan (H-scan) direction of the linear image sensor in synchronism with relative movement between the object and the linear image sensor, periodically switching a pixel size along the V-scan direction between a plurality of predefined pixel sizes during the relative movement between the object and the linear image sensor in accordance with information of the relative movement detected by the position sensor, and producing from an output of the linear image sensor a two-dimensional image of the projected image having a second resolution of the object to be sensed. The second resolution is a higher resolution than the first resolution.
摘要翻译：一种用于通过线性图像传感器检测待检测物体的二维图像的方法和装置包括通过具有第一分辨率的位置传感器检测物体的位置，拾取沿着方向投影的物体的图像（V扫描方向），与物体和线性图像传感器之间的相对运动同步地与线性图像传感器的内部扫描（H扫描）方向大致垂直，周期性地沿着V扫描方向切换像素尺寸，根据由位置传感器检测到的相对运动的信息，在物体和线性图像传感器之间的相对运动期间的多个预定像素尺寸，并且从线性图像传感器的输出产生投影图像的二维图像具有要被感测的物体的第二分辨率。第二项决议是比第一项决议更高的决议。

15. 发明申请

US20070070336A1 Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected 失效
标题翻译：半导体基板的制造方法以及检查被检查体的图案的缺陷的方法和装置
公开(公告)号：US20070070336A1
公开(公告)日：2007-03-29
申请号：US11605242
申请日：2006-11-29
申请人： Shunji Maeda , Yasuhiko Nakayama , Minoru Yoshida , Hitoshi Kubota , Kenji Oka
发明人： Shunji Maeda , Yasuhiko Nakayama , Minoru Yoshida , Hitoshi Kubota , Kenji Oka
IPC分类号： G01N21/00
CPC分类号： G01N21/95607 , G01N21/8806 , G01N21/9501 , G01N21/956 , G01N2021/95615 , G01N2201/0618 , G01N2201/0634
摘要： A method of inspecting a specimen, including: emitting a light from a lamp of a light source; illuminating a specimen on which plural patterns are formed with the light emitted from the light source and, passed through an objective lens; forming an optical image of the specimen by collecting light reflected from the specimen by the illuminating and passed through the objective lens and a image forming lens; detecting the optical image with a TDI image sensor; and processing a signal outputted from the TDI image sensor and detecting a defect of a pattern among the plural patterns formed on the specimen, wherein the image detected by the TDI image sensor is formed with light having a wavelength selected from the wavelengths of the light emitted from the light source.
摘要翻译：一种检查样本的方法，包括：从光源的灯发射光; 用从光源发射的光照射形成有多个图案的样本，并通过物镜; 通过照射通过收集从样本反射的光并通过物镜和成像透镜来形成样本的光学图像; 用TDI图像传感器检测光学图像; 并处理从TDI图像传感器输出的信号，并且检测在样本上形成的多个图案之间的图案的缺陷，其中由TDI图像传感器检测到的图像由具有选自发射的光的波长的波长的光形成从光源。

16. 发明授权

US07180584B2 Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected 失效
标题翻译：半导体基板的制造方法以及检查被检查体的图案的缺陷的方法和装置
公开(公告)号：US07180584B2
公开(公告)日：2007-02-20
申请号：US10686584
申请日：2003-10-17
申请人： Shunji Maeda , Yasuhiko Nakayama , Minoru Yoshida , Hitoshi Kubota , Kenji Oka
发明人： Shunji Maeda , Yasuhiko Nakayama , Minoru Yoshida , Hitoshi Kubota , Kenji Oka
IPC分类号： G01N21/00
CPC分类号： G01N21/8806 , G01N21/9501 , G01N21/956 , G01N21/95607 , G01N2021/95615 , G01N2201/0618 , G01N2201/0634
摘要： A pattern detection method and apparatus thereof for inspecting with high resolution a micro fine defect of a pattern on an inspected object and a semiconductor substrate manufacturing method and system for manufacturing semiconductor substrates such as semiconductor wafers with a high yield. A micro fine pattern on the inspected object is inspected by irradiating an annular-looped illumination through an objective lens onto a wafer mounted on a stage, the wafer having micro fine patterns thereon. The illumination light may be circularly or elliptically polarized and controlled according to an image detected on the pupil of the objective lens and image signals are obtained by detecting a reflected light from the wafer. The image signals are compared with reference image signals and a part of the pattern showing inconsistency is detected as a defect so that simultaneously, a micro fine defect or defects on the micro fine pattern are detected with high resolution. Further, process conditions of a manufacturing line are controlled by analyzing a cause of defect and a factor of defect which occurs on the pattern.
摘要翻译：一种用于以高分辨率检查被检查物体上的图案的微细缺陷的图案检测方法及其装置以及以高产率制造半导体晶片等半导体基板的半导体基板的制造方法和系统。通过将通过物镜的环形照明照射到安装在台架上的晶片上，检查被检查物体上的微细图案，晶片上具有微细精细图案。照明光可以根据在物镜的光瞳上检测到的图像而被圆形或椭圆偏振并且被控制，并且通过检测来自晶片的反射光来获得图像信号。将图像信号与参考图像信号进行比较，并且检测出显示不一致的图案的一部分作为缺陷，从而同时以高分辨率检测微细微图案或微细图案上的缺陷。此外，通过分析缺陷的原因和在图案上发生的缺陷因素来控制生产线的工艺条件。

17. 发明授权

US07061602B2 Method of inspecting a semiconductor device and an apparatus thereof 有权
标题翻译：检查半导体器件的方法及其装置
公开(公告)号：US07061602B2
公开(公告)日：2006-06-13
申请号：US11117336
申请日：2005-04-29
申请人： Akira Hamamatsu , Minori Noguchi , Yoshimasa Ohshima , Hidetoshi Nishiyama , Kenji Oka , Takanori Ninomiya , Maki Tanaka , Kenji Watanabe , Tetsuya Watanabe , Yoshio Morishige
发明人： Akira Hamamatsu , Minori Noguchi , Yoshimasa Ohshima , Hidetoshi Nishiyama , Kenji Oka , Takanori Ninomiya , Maki Tanaka , Kenji Watanabe , Tetsuya Watanabe , Yoshio Morishige
IPC分类号： G01N21/00 , G06K9/00
CPC分类号： G06T7/001 , G01N21/8851 , G01N21/9501 , G01N2021/8861 , G01N2021/8867 , G06T7/97 , G06T2207/10152 , G06T2207/30148
摘要： A method of inspecting a sample in which the sample is inspected under a plurality of inspection conditions and inspection data obtained by inspecting the sample under each of the plurality of inspection conditions and position information on the sample of the inspection date in correspondence with the respective inspection conditions are stored. The inspection data for each of the plurality of inspection conditions is against each other by the use of the position information on the sample to determine a position to be inspected in detail, and an image of the sample at a position to be inspected in detail is obtained. The obtained image is classified, the inspection condition of the sample by the use of information of classification of the image is determined.
摘要翻译：检查在多个检查条件下检查样品的样品的检查方法以及根据多个检查条件中的每一个检查样品而获得的检查数据以及与检查日期对应的检查日期的样品的位置信息的方法条件被存储。多个检查条件中的每一个的检查数据通过使用关于样本的位置信息彼此相对来确定待检查的位置，并且在待检查位置处的样本的图像是详细的获得。对所获得的图像进行分类，确定通过使用图像分类信息的样本的检查条件。

18. 发明授权

US06947276B2 Process for producing laminated ceramic capacitor 有权
标题翻译：叠层陶瓷电容器的制造工艺
公开(公告)号：US06947276B2
公开(公告)日：2005-09-20
申请号：US10502620
申请日：2003-10-24
申请人： Kazuki Hirata , Kenji Oka , Kazuhiro Komatsu , Atsuo Nagai
发明人： Kazuki Hirata , Kenji Oka , Kazuhiro Komatsu , Atsuo Nagai
IPC分类号： C04B35/468 , H01G4/06 , H01G4/12 , H01G4/228 , H01G4/30 , H01G7/00 , H05K3/36
CPC分类号： C04B35/4682 , B32B2311/22 , C04B2235/3206 , C04B2235/3224 , C04B2235/3263 , C04B2235/3418 , C04B2235/5409 , C04B2235/5445 , C04B2235/6025 , C04B2235/6582 , C04B2235/6587 , C04B2237/346 , C04B2237/405 , H01G4/1227 , Y10T29/43 , Y10T29/435 , Y10T29/49126 , Y10T29/49128
摘要： The present invention relates to a method of manufacturing a multilayer ceramic capacitor, having the steps of: (a) alternately layering internal electrodes and ceramic green sheets containing a ceramic material having barium titanate to form a laminated body; (b) sintering the laminated body to obtain a sintered body; and (c) forming an external electrode on end faces of the sintered body to obtain a multilayer ceramic capacitor. The barium titanate has a diffraction line derived from (002) plane and a diffraction line derived from (200) plane in an X-ray diffraction chart. The ratio I(200)/Ib of peak intensity I(200) at 2θ(200) to diffraction intensity Ib at a midpoint angle between peak angle 2θ(002) of the diffraction line derived from the (002) plane and peak angle 2θ(200) of the diffraction line derived from the (200) plane is 2 to 10. The product r·Sa of mean particle size r (μm) of the barium titanate and specific surface area Sa (m2/g) is 1 to 2.
摘要翻译：本发明涉及一种制造多层陶瓷电容器的方法，具有以下步骤：（a）将包含具有钛酸钡的陶瓷材料的内部电极和陶瓷生坯交替层叠以形成层压体; （b）烧结层压体以获得烧结体; （c）在烧结体的端面上形成外部电极，得到多层陶瓷电容器。在X射线衍射图中，钛酸钡具有衍生自（002）面的衍射线和衍生自（200）面的衍射线。（2）（200）的峰强度I（200）的比值I（200）/ I B （002）面的衍射线的峰角2θ（002）与峰角2θ（200°）之间的中点角度处的衍射强度I 衍生自（200）面的衍射线的为2〜10。钛酸钡的平均粒径r（母体）与比表面积Sa（m <2） SUP> / g）为1〜2。

19. 发明申请

US20050196033A1 Method of inspecting a semiconductor device and an apparatus thereof 有权
标题翻译：检查半导体器件的方法及其装置
公开(公告)号：US20050196033A1
公开(公告)日：2005-09-08
申请号：US11117336
申请日：2005-04-29
申请人： Akira Hamamatsu , Minori Noguchi , Yoshimasa Ohshima , Hidetoshi Nishiyama , Kenji Oka , Takanori Ninomiya , Maki Tanaka , Kenji Watanabe , Tetsuya Watanabe , Yoshio Morishige
发明人： Akira Hamamatsu , Minori Noguchi , Yoshimasa Ohshima , Hidetoshi Nishiyama , Kenji Oka , Takanori Ninomiya , Maki Tanaka , Kenji Watanabe , Tetsuya Watanabe , Yoshio Morishige
IPC分类号： G01N21/956 , G06T7/00 , H01L21/66 , G06K9/00
CPC分类号： G06T7/001 , G01N21/8851 , G01N21/9501 , G01N2021/8861 , G01N2021/8867 , G06T7/97 , G06T2207/10152 , G06T2207/30148
摘要： A method of inspecting a sample in which the sample is inspected under a plurality of inspection conditions and inspection data obtained by inspecting the sample under each of the plurality of inspection conditions and position information on the sample of the inspection date in correspondence with the respective inspection conditions are stored. The inspection data for each of the plurality of inspection conditions is against each other by the use of the position information on the sample to determine a position to be inspected in detail, and an image of the sample at a position to be inspected in detail is obtained. The obtained image is classified, the inspection condition of the sample by the use of information of classification of the image is determined.
摘要翻译：检查在多个检查条件下检查样品的样品的检查方法以及根据多个检查条件中的每一个检查样品而获得的检查数据以及与检查日期对应的检查日期的样品的位置信息的方法条件被存储。多个检查条件中的每一个的检查数据通过使用关于样本的位置信息彼此相对来确定待检查的位置，并且在待检查位置处的样本的图像是详细的获得。对所获得的图像进行分类，确定通过使用图像分类信息的样本的检查条件。

20. 发明授权

US5914428A Process for preparation of isocyanate compounds 失效
标题翻译：异氰酸酯化合物的制备方法
公开(公告)号：US5914428A
公开(公告)日：1999-06-22
申请号：US560517
申请日：1995-11-16
申请人： Toyokazu Yagii , Teruo Itokazu , Kenji Oka , Yasutaka Tanaka , Hidetaka Kojima , Kiyokazu Murata
发明人： Toyokazu Yagii , Teruo Itokazu , Kenji Oka , Yasutaka Tanaka , Hidetaka Kojima , Kiyokazu Murata
IPC分类号： C07C68/00 , C07C263/04 , C07C265/10 , C07C265/14 , C07C269/04 , C07C263/00 , C07C261/00
CPC分类号： C07C269/04 , C07C263/04 , C07C68/005 , C07C2101/12
摘要： An aliphatic diisocyanate compound is prepared in a high yield by reacting dimethyl carbonate with an aliphatic diamine in the presence of an alkali catalyst to produce a corresponding urethane compound; and, within 48 hours after the completion of the preparation of the urethane compound, thermally decomposing the urethane compound under a reduced pressure of 1 to 700 Torr in a high-boiling-point solvent.
摘要翻译：通过在碱催化剂的存在下使碳酸二甲酯与脂族二胺反应，以高收率制备脂族二异氰酸酯化合物，生成相应的氨基甲酸酯化合物; 在氨基甲酸酯化合物的制备完成后48小时内，在高沸点溶剂中，在1〜700乇的减压下热分解氨基甲酸酯化合物。

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