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    • 12. 发明授权
    • Serial to parallel conversion with phase locked loop
    • 具有锁相环的串并转换
    • US5598156A
    • 1997-01-28
    • US372412
    • 1995-01-13
    • Glen HushJake BakerTom Voshell
    • Glen HushJake BakerTom Voshell
    • H03L7/08H03M9/00H04L7/033H04L7/04H04L7/06H04L7/08H04N5/12
    • H03M9/00H03L7/08H04N5/126H04L7/033H04L7/044H04L7/06
    • A serial to parallel conversion circuit uses a dynamic shift register in a phase locked loop for an index to access a parallel holding register. The composite input signal includes serial data to be sampled and a synchronizing signal at an integer factor of the sampling serial data rate. The phase locked loop generates a control signal for sampling the serial data at a multiple of the synchronizing frequency by incorporating a delay between a variable frequency oscillator output and a phase comparator input. The delay element in one embodiment includes a shift register with a walking-one pattern that overflows to the phase comparator. The walking-one pattern is used to identify which position of the holding register should store the next sample of the input signal. The shift register is self-initialized by a logic combination of all shift register outputs. Power dissipation by the serial to parallel conversion circuit is minimal because only one 7-transistor shift register cell draws current at a time.
    • 串行到并行转换电路在锁相环中使用动态移位寄存器用于访问并行保持寄存器的索引。 复合输入信号包括要采样的串行数据和采样串行数据速率的整数因子的同步信号。 锁相环产生一个控制信号,用于通过结合可变频率振荡器输出和相位比较器输入之间的延迟以同步频率的倍数对串行数据进行采样。 一个实施例中的延迟元件包括移位寄存器,其具有溢出到相位比较器的步行模式。 步行模式用于识别保持寄存器的哪个位置应存储输入信号的下一个采样。 移位寄存器由所有移位寄存器输出的逻辑组合进行自初始化。 串并转换电路的功耗最小,因为只有一个7晶体管移位寄存器单元一次抽出电流。
    • 17. 发明授权
    • Method and apparatus for sensing resistive memory state
    • 用于感测电阻式存储器状态的方法和装置
    • US06954385B2
    • 2005-10-11
    • US10918386
    • 2004-08-16
    • Stephen L. CasperKevin DuesmanGlen Hush
    • Stephen L. CasperKevin DuesmanGlen Hush
    • G11C13/00G11C11/34G11C13/02G11C16/28H01L27/105
    • G11C13/0069G11C13/0004G11C13/0011G11C13/004G11C2013/0042G11C2013/0054G11C2013/009G11C2213/79
    • A sense circuit for reading a resistance level of a programmable conductor random access memory (PCRAM) cell is provided. A voltage potential difference is introduced across a PCRAM cell by activating an access transistor from a raised rowline voltage. Both a digit line and a digit complement reference line are precharged to a first predetermined voltage. The cell being sensed has the precharged voltage discharged through the resistance of the programmable conductor memory element of the PCRAM cell. A comparison is made of the voltage read at the digit line and at the reference conductor. If the voltage at the digit line is greater than the reference voltage, the cell is read as a high resistance value (e.g., logic HIGH); however, if the voltage measured at the digit line is lower than that of the reference voltage, the cell is read as a low resistance value (e.g., logic LOW).
    • 提供了用于读取可编程导体随机存取存储器(PCRAM)单元的电阻电平的读出电路。 通过从升高的行线电压激活存取晶体管,通过PCRAM单元引入电压电位差。 数字线和数位补码参考线都被预充电到第一预定电压。 被感测的电池具有通过PCRAM单元的可编程导体存储元件的电阻放电的预充电电压。 比较在数字线和参考导体读取的电压。 如果数字线上的电压大于参考电压,则将单元读为高电阻值(例如,逻辑高电平); 然而,如果在数字线处测量的电压低于参考电压的电压,则将该单元读为低电阻值(例如,逻辑低电平)。