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    • 12. 发明授权
    • System and method for classifying objects
    • 用于分类对象的系统和方法
    • US07610285B1
    • 2009-10-27
    • US11524831
    • 2006-09-21
    • Keith ZoellnerPeter LeeBrad Might
    • Keith ZoellnerPeter LeeBrad Might
    • G06F17/30
    • G06F17/30705G06F17/30115G06F17/3012Y10S707/99937
    • Embodiments of a classification pipeline disclosed herein have the ability to both collect data as it occurs and dynamically redact it, allowing ongoing statistics to be gathered and maintained while simultaneously constraining the total amount of storage capacity that must be dedicated to such a purpose. Various types of information can be extracted from or obtained on the object through the classification pipeline. In one embodiment, the classification pipeline comprises a plurality of layers implemented as a set of services available to network clients through a Web interface or an Applications Programming Interface (API). Each client can subscribe to one or more layers of the classification pipeline at their leisure and tailor their classification pipeline configuration through the interface. The classification pipeline can be configured to collaborate with other software to provide a consistent snapshot of the state of a network environment based on data collected at the time.
    • 本文公开的分类流程的实施例具有在数据发生时收集数据的能力,并且动态地对其进行修改,从而允许收集和维护正在进行的统计信息,同时限制必须专用于此目的的总存储容量。 可以通过分类管道从物体中提取或获取各种类型的信息。 在一个实施例中,分类流水线包括通过Web接口或应用编程接口(API)来实现为可用于网络客户端的一组服务的多个层。 每个客户端可以随意订阅分层管道的一层或多层,并通过接口定制其分类流水线配置。 分类流水线可以配置为与其他软件协作,以便根据当时收集的数据提供网络环境状态的一致性快照。
    • 14. 发明申请
    • Circuit and method for multiple-level programming, reading, and erasing dual-sided nonvolatile memory cell
    • 用于多级编程,读取和擦除双面非易失性存储单元的电路和方法
    • US20080205141A1
    • 2008-08-28
    • US12069637
    • 2008-02-12
    • Peter LeeFu-Chang Hsu
    • Peter LeeFu-Chang Hsu
    • G11C16/04G11C16/06
    • H01L29/7887G11C7/18G11C11/5671G11C16/0475G11C16/0483G11C16/08G11C16/24H01L27/115H01L29/7923
    • A control apparatus programs, reads, and erases trapped charges representing multiple data bits from a charge trapping region of a NMOS dual-sided charge-trapping nonvolatile memory cell includes a programming circuit, an erasing circuit, and a reading circuit. The programming circuit provides a negative medium large program voltage to cell's gate along with positive drain and source voltage to inject hot carriers of holes to two charge trapping regions, one of a plurality of threshold adjustment voltages representing a portion of the multiple data bits to the drain and source regions to set the hot carrier charge levels to the two charge trapping regions. The erasing circuit provides a very large positive erase voltage to tunnel the electrons from cell's channel to whole trapping layer including the two charge trapping regions. The reading circuit generates one of a plurality of threshold detection voltages to detect one of a plurality of programmed threshold voltages representative of multiple data bits, generates a drain voltage level to activate the charge-trapping nonvolatile memory cell.
    • 控制装置对来自NMOS双侧电荷捕获非易失性存储单元的电荷捕获区域的多个数据位进行编程,读取和擦除捕获的电荷包括编程电路,擦除电路和读取电路。 编程电路向单元的栅极提供负的中等大的编程电压以及正的漏极和源极电压,以将空穴的热载流子注入到两个电荷俘获区域,多个阈值调整电压中的一个表示多个数据位的一部分 漏极和源极区域,以将热载流子电荷电平设置为两个电荷捕获区域。 擦除电路提供非常大的正擦除电压,以将电子从电池的通道隧穿到包括两个电荷俘获区域的整个俘获层。 读取电路产生多个阈值检测电压中的一个,以检测表示多个数据位的多个编程的阈值电压中的一个,产生漏极电压电平以激活电荷捕获非易失性存储单元。
    • 15. 发明申请
    • Bit line structure for a multilevel, dual-sided nonvolatile memory cell array
    • 用于多层双面非易失性存储单元阵列的位线结构
    • US20080205140A1
    • 2008-08-28
    • US12069228
    • 2008-02-08
    • Peter LeeFu-Chang Hsu
    • Peter LeeFu-Chang Hsu
    • G11C16/04G11C16/06H01L21/336
    • H01L29/7887G11C7/18G11C11/5671G11C16/0475G11C16/0483G11C16/08G11C16/24H01L27/115H01L29/7923
    • A nonvolatile memory array includes a plurality of dual-sided charge-trapping nonvolatile memory cells arranged in rows and columns. The dual-sided charge-trapping nonvolatile memory cells on each column form at least one grouping that is arranged in a NAND series string of dual-sided charge-trapping nonvolatile memory cells. Each NAND series string has a top select transistor and a bottom select transistor. A plurality of bit lines is connected in a cross connective columnar bit line structure such that each column of the dual-sided charge-trapping nonvolatile memory cells is connected to an associated pair of bit lines. The first of the associated pair of bit lines is further connected to a first adjacent column of dual-sided charge-trapping nonvolatile memory cells and the second of the associated pair of bit lines is further associated with a second adjacent column of the dual-sided charge-trapping nonvolatile memory cells.
    • 非易失性存储器阵列包括以行和列排列的多个双面电荷俘获非易失性存储单元。 每列上的双面电荷捕获非易失性存储单元形成至少一个分组,其被布置在NAND串联的双面电荷捕获非易失性存储单元中。 每个NAND串联串具有顶部选择晶体管和底部选择晶体管。 多个位线连接在交叉连接柱状位线结构中,使得双面电荷捕获非易失性存储器单元的每一列连接到相关的一对位线。 相关联的一对位线中的第一个进一步连接到双面电荷捕获非易失性存储器单元的第一相邻列,并且相关联的位线对中的第二相关联还与双面电荷捕获非易失性存储器单元的第二相邻列相关联 电荷捕获非易失性存储单元。