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    • 13. 发明授权
    • Thin film fabrication method and thin film fabrication apparatus
    • 薄膜制造方法和薄膜制造装置
    • US06872289B2
    • 2005-03-29
    • US09799609
    • 2001-03-07
    • Shigeru MizunoMakoto SatouManabu TagamiHideki Satou
    • Shigeru MizunoMakoto SatouManabu TagamiHideki Satou
    • C23C14/34C23C14/35C23C16/52H01J37/34H01L21/285C23C16/00
    • H01J37/32706C23C14/354H01J37/3405
    • A thin film is fabricated while causing ions in a plasma P to be incident by effecting biasing relative to the space potential of the plasma P by imparting a set potential to the surface of a substrate 9. A bias system 6 causes the substrate surface potential Vs to vary in pulse form by imposing an electrode imposed voltage Ve in pulse form on a bias electrode 23 which is in a dielectric block 22. The pulse frequency is lower than the oscillation frequency of ions in the plasma P, and the pulse period T, pulse width t and pulse height h are controlled by a control section 62 in a manner such that the incidence of ions is optimized. The imposed pulses are controlled in a manner such that the substrate surface potential Vs recovers to a floating potential Vf at the end of a pulse period T, and that the ion incidence energy temporarily crosses a thin film sputtering threshold value in a pulse period T.
    • 制造薄膜,同时使等离子体P中的离子通过相对于等离子体P的空间电位施加偏置而入射,通过赋予衬底9的表面设定电位。偏置系统6使衬底表面电位Vs 通过在介质块22中的偏置电极23上施加脉冲形式的电极施加的电压Ve来改变脉冲形式。脉冲频率低于等离子体P中的离子的振荡频率,脉冲周期T, 脉冲宽度t和脉冲高度h由控制部分62以使得离子的入射被优化的方式控制。 施加的脉冲以使得在脉冲周期T结束时基板表面电位Vs恢复到浮动电位Vf的方式被控制,并且离子入射能量在脉冲周期T中暂时跨越薄膜溅射阈值。
    • 17. 发明授权
    • Multilayer circuit board
    • 多层电路板
    • US06407460B1
    • 2002-06-18
    • US09616139
    • 2000-07-13
    • Michio HoriuchiShigeru Mizuno
    • Michio HoriuchiShigeru Mizuno
    • H01L2352
    • H01L23/49838H01L2224/16H01L2224/16235H01L2924/15174H01L2924/15311H05K1/112H05K2201/09227H05K2201/10734
    • The present invention provides a multilayer circuit board for mounting thereon a semiconductor chip or other electronic elements having electrode terminals or other connection terminals which are arranged in a grid, staggered, or close-packed manner in an improved form to enable reduction in the number of the wiring layers for lead wiring lines, thereby facilitating the production of multilayer circuit boards and providing an improved product reliability. The multilayer circuit board comprises: a base board having a mounting surface for mounting thereon a semiconductor chip and/or other electronic elements having lattice-arranged connection terminals; connection terminal pads arranged on the mounting surface to form a plane lattice corresponding to the lattice arrangement of the connection terminals and having lattice sites each occupied by one of the connection terminal pads; lead wiring lines lying on the mounting surface and having one end connected to the connection terminal pads and the other end extending outwardly from the plane lattice; and the said plane lattice having a peripheral zone including periodic vacant lattice areas formed by vacant lattice sites occupied by no connection terminal pads.
    • 本发明提供了一种多层电路板,用于在其上安装半导体芯片或具有电极端子或其他连接端子的其他电子元件,电子端子或其他连接端子以改进的形式布置成格栅,交错或紧密堆叠的方式,以减少数量 用于引线布线的布线层,从而便于生产多层电路板并提供改进的产品可靠性。 多层电路板包括:基板,其具有用于安装其上的半导体芯片的安装表面和/或具有格子排列的连接端子的其它电子元件; 连接端子焊盘,其布置在所述安装表面上以形成与所述连接端子的格栅布置相对应的平面格子,并具有各自由所述连接端子焊盘之一占据的格子部位; 引线布线位于安装表面上,其一端连接到连接端子焊盘,另一端从平面格架向外延伸; 并且所述平面晶格具有包括由没有连接端子焊盘占据的空位网格形成的周期性空格格区域的周边区域。
    • 19. 发明授权
    • Integrated module multi-chamber CVD processing system and its method for
processing subtrates
    • 集成模块多室CVD处理系统及其处理方法
    • US5534072A
    • 1996-07-09
    • US77687
    • 1993-06-16
    • Shigeru MizunoYoshihiro KatsumataNobuyuki Takahashi
    • Shigeru MizunoYoshihiro KatsumataNobuyuki Takahashi
    • C23C16/44C23C16/455C23C16/458C23C16/54C23C16/00
    • C23C16/45519C23C16/4401C23C16/45521C23C16/4585C23C16/54Y10S414/135Y10S438/908
    • In a CVD processing system for depositing a blanket tungsten film, a distinct shadow is formed without causing any micro-peeling when the substrate fixture is separated from the substrate so as to prevent any blanket tungsten from being deposited on SiO.sub.2, thus reducing the occurrence of fine dust particles. A CVD processing system for depositing a blanket tungsten film, includes a susceptor (4); a ring chuck (9) for affixing the peripheral portion of a substrate (3) on the susceptor; reactive gas supply mechanisms (17, 18 and 19) for supplying reactive gas; and an exhaust mechanism (2) for exhausting unreacted gas and the like, wherein: the ring chuck has at least three point contact members (10) in contact with the peripheral portion of the substrate; the point contact members are provided at positions outside the inner periphery of the ring chuck; a gap (11) is formed at the point contact members between the ring chuck and the substrate; and purge gas supply mechanisms (20 and 21) are provided to blow off purge gas through the gap in order to prevent reactive gas from entering the gap (11). A ratio of the size of the gap to the flow rate of purge gas is set to such an optimum value as to satisfy a condition in which the position of the peripheral portion of the thin film coincides with the position of the inner periphery of the ring chuck.
    • 在用于沉积覆盖钨膜的CVD处理系统中,当衬底夹具与衬底分离时,形成不同的阴影,而不会发生任何微剥离,以防止任何覆盖的钨沉积在SiO 2上,从而减少 细尘粒子。 一种用于沉积覆盖钨膜的CVD处理系统,包括基座(4); 环形卡盘(9),用于将基板(3)的周边部分固定在基座上; 用于供应反应性气体的反应气体供应机构(17,18和19) 以及用于排出未反应气体等的排气机构(2),其中:所述环卡盘具有与所述基板的周边部分接触的至少三点接触构件(10) 点接触构件设置在环卡盘的内周的外侧的位置; 在环卡盘和基板之间的点接触构件处形成间隙(11); 并且提供吹扫气体供给机构(20和21)以吹扫通过间隙的吹扫气体,以防止反应性气体进入间隙(11)。 将间隙尺寸与吹扫气体的流量的比率设定为最佳值,以满足薄膜的周边部分的位置与环的内周的位置一致的条件 卡盘