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    • 12. 发明授权
    • Device on board a moving vehicle to obtain signals representative of the
relative speed of the vehicle with respect to an ambient fluid
    • 装置在移动车辆上以获得代表相对于环境流体的车辆的相对速度的信号
    • US5047653A
    • 1991-09-10
    • US543081
    • 1990-06-25
    • James GarciaGerard Beigbeder
    • James GarciaGerard Beigbeder
    • G01C21/10G01C21/00G01P5/00G01P5/26
    • G01P5/26
    • A device uses fringe laser diode anemometers which, from the beams coming from one or more laser diodes, form measuring volumes having interference fringes. The component of the relative speed of an aircraft in a direction perpendicular to the plane of these fringes is deduced from the modulation of light reflected by particles moving through the measuring volume to cause modulation of the signal of the photodetector of each anemometer during their passage in the measuring volume of this anemometer. By joining two anemometers with the measuring volumes whose planes of the associated fringes are, for example, orthogonal, it is possible to determine two components of the relative speed vector and determine, for example, this relative speed in the longitudinal vertical plane of the aircraft, and to deduce from it the angle of incidence of the aircraft.
    • 器件使用边缘激光二极管风速计,其来自一个或多个激光二极管的光束形成具有干涉条纹的测量体积。 飞行器在与这些边缘平面垂直的方向上的相对速度的分量是从粒子移动通过测量体积反射的光的调制推导的,以便在每个风速计通过期间对每个风速计的光电检测器的信号进行调制 该风速计的测量体积。 通过连接两个具有相关边缘的平面的测量体积的风速计例如正交,可以确定相对速度矢量的两个分量,并且确定例如飞行器的纵向垂直平面中的相对速度 ,并从中推断出飞机的发生角度。
    • 19. 发明授权
    • Apparatus for measuring contaminant mobile ions in dielectric materials
    • 用于测量介电材料中污染物移动离子的装置
    • US06699436B1
    • 2004-03-02
    • US09904005
    • 2001-07-12
    • James GarciaMichael McBride
    • James GarciaMichael McBride
    • G01N3348
    • H01L22/12Y10T436/11
    • Methods and apparatus are provided for measuring contaminant mobile ions in a dielectric portion of a semiconductor. The apparatus is comprised of a heat source configured to elevate a temperature of the dielectric portion of the semiconductor and mobilize the contaminant mobile ions. The apparatus is also comprised of a fluid source configured to expose the dielectric portion of the semiconductor to a mobilizing fluid having contaminant ion releasing atoms that assists in mobilizing the contaminant mobile ions. The apparatus further comprises a mobile ion measurement unit configured to perform measurements of the contaminant mobile ions in the dielectric portion of the semiconductor.
    • 提供了用于测量半导体电介质部分中的污染物移动离子的方法和装置。 该装置包括被配置为提高半导体的电介质部分的温度并调动污染物移动离子的热源。 该装置还包括被配置为将半导体的电介质部分暴露于有助于移动污染物移动离子的污染物离子释放原子的移动流体的流体源。 该装置还包括移动离子测量单元,被配置为执行半导体介质部分中的污染物移动离子的测量。