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    • 13. 发明授权
    • Test circuit, system, and method for testing one or more circuit components arranged upon a common printed circuit board
    • 用于测试布置在公共印刷电路板上的一个或多个电路部件的测试电路,系统和方法
    • US07809052B2
    • 2010-10-05
    • US11460444
    • 2006-07-27
    • Gabriel Li
    • Gabriel Li
    • H04B3/46
    • G01R31/31922G01R31/31709G01R31/31937
    • A test circuit, system, and method are provided herein for testing one or more circuit components arranged upon a monolithic substrate. According to one embodiment, the system may include a test circuit and one or more circuit components, all of which are arranged upon the same monolithic substrate. In general, the test circuit may be configured for: (i) receiving an input signal at an input frequency, (ii) generating a test signal by modulating a phase of the input signal in accordance with a periodic signal, and (iii) supplying either the input signal or the test signal to the one or more integrated circuits, based on a control signal supplied to the test circuit. More specifically, the test circuit may be used to determine the jitter and/or duty cycle distortion (DCD) tolerance of any system component without changing the frequency of the clock signal supplied to the component or injecting noise into the clock recovery system.
    • 本文提供了测试电路,系统和方法来测试布置在单片基板上的一个或多个电路组件。 根据一个实施例,系统可以包括测试电路和一个或多个电路部件,所有电路部件都布置在相同的单片基板上。 通常,测试电路可以被配置为:(i)以输入频率接收输入信号,(ii)通过根据周期信号调制输入信号的相位来产生测试信号,以及(iii)提供 基于提供给测试电路的控制信号,将输入信号或测试信号传送到一个或多个集成电路。 更具体地,测试电路可用于确定任何系统组件的抖动和/或占空比失真(DCD)容限,而不改变提供给组件的时钟信号的频率或将噪声注入到时钟恢复系统中。
    • 14. 发明申请
    • System and method for monitoring a power supply level
    • 监控电源电平的系统和方法
    • US20070001720A1
    • 2007-01-04
    • US11153773
    • 2005-06-15
    • Gabriel LiGreg Richmond
    • Gabriel LiGreg Richmond
    • H03L7/00
    • G06F1/28
    • A system and method are provided herein for monitoring the integrity of a power supply by monitoring a level of the power supply voltage supplied to one or more system components. The method, as described herein, includes setting a bit in a status register after the power supply level reaches a threshold level, and monitoring a state of the bit to determine if the power supply level has dropped below the threshold level. For example, the method may determine that the power supply level has dropped below the threshold level if the state of the bit changes from a set bit to a cleared bit. In addition, the system and method described herein may be used for detecting the occurrence of a power abnormality by providing additional resources/information about a power related event.
    • 本文提供了一种系统和方法,用于通过监视提供给一个或多个系统组件的电源电压的电平来监视电源的完整性。 如本文所描述的,该方法包括在电源电平达到阈值电平之后设置状态寄存器中的位,并且监视该位的状态以确定电源电平是否已经降低到阈值电平以下。 例如,如果位的状态从设置位改变为清零位,则该方法可以确定电源电平已经降低到阈值电平以下。 此外,本文所述的系统和方法可以通过提供关于电力相关事件的附加资源/信息来用于检测电力异常的发生。
    • 15. 发明申请
    • Circuit and method for monitoring the integrity of a power supply
    • 用于监控电源完整性的电路和方法
    • US20060284655A1
    • 2006-12-21
    • US11153759
    • 2005-06-15
    • Gabriel LiGreg Richmond
    • Gabriel LiGreg Richmond
    • H03L7/00
    • G06F1/28G01R19/16552
    • Circuits and methods are provided herein for monitoring the integrity of a power supply, the circuits and methods providing additional resources/information for diagnosing a cause behind a reset signal, and in some cases, a reason behind a power failure. A first method described herein provides exemplary steps for monitoring a level of a power supply voltage supplied to one or more system components. A second method describes exemplary steps for monitoring an electrical connection between the power supply (or ground supply) and one or more supply pins. Each of the methods involves monitoring a state of one or more bits stored, e.g., within a status register. The methods may be used separately, or in conjunction with one another, for detecting the occurrence of a power abnormality.
    • 本文提供了用于监测电源的完整性的电路和方法,所述电路和方法提供用于诊断复位信号背后的原因的附加资源/信息,并且在一些情况下是电源故障背后的原因。 本文描述的第一种方法提供了用于监测提供给一个或多个系统组件的电源电压的电平的示例性步骤。 第二种方法描述了用于监测电源(或接地电源)和一个或多个电源引脚之间的电连接的示例性步骤。 每种方法涉及监视存储在例如状态寄存器内的一个或多个位的状态。 这些方法可以单独使用,也可以彼此结合使用,用于检测功率异常的发生。
    • 16. 发明授权
    • Programmable phase shift and duty cycle correction circuit and method
    • 可编程相移和占空比校正电路及方法
    • US07138841B1
    • 2006-11-21
    • US11014578
    • 2004-12-16
    • Gabriel LiChwei-Po ChewDusan Vecera
    • Gabriel LiChwei-Po ChewDusan Vecera
    • H03K3/017
    • H03K5/151H03K5/1565H03K2005/00058H03K2005/00156
    • A phase shift and duty cycle correction circuit is disclosed herein as comprising a programmable digital to analog converter (DAC), a storage device (e.g., a capacitor), a charge sub-circuit and dump sub-circuit for charging and discharging the storage device, respectively, a comparator, and a clock driver circuit. A linearly increasing (or ramped) voltage waveform is generated within the storage device by the charging and discharging actions of the charge and dump sub-circuits; a periodic process which is controlled by opposite phases of the input clock. By programming the DAC control input to change the slicing threshold of the ramped waveform, the circuit and method described herein provides a means for programmable phase shifting and duty cycle correction.
    • 本文公开了一种相移和占空比校正电路,其包括可编程数模转换器(DAC),存储装置(例如,电容器),用于对存储装置进行充电和放电的充电子电路和转储子电路 一个比较器和一个时钟驱动电路。 通过充电和转储子电路的充电和放电动作,在存储装置内产生线性增加(或斜坡)的电压波形; 周期性过程由输入时钟的相反相位控制。 通过对DAC控制输入进行编程以改变斜坡波形的限幅门限,本文描述的电路和方法提供了可编程相移和占空比校正的方法。
    • 17. 发明授权
    • High speed memory interface system and method
    • 高速存储器接口系统及方法
    • US07013359B1
    • 2006-03-14
    • US10032248
    • 2001-12-21
    • Gabriel Li
    • Gabriel Li
    • G06F13/14
    • G06F13/4243
    • The present invention is a high speed serial memory interface system and method that facilitates efficient communication of information between a system controller operating at a relatively high speed serial communication rate and a memory array operating at a relatively slow speed serial communication rate. In one embodiment the present invention is a high speed serial memory interface system with an information configuration core for coordinating proper alignment of information communication signals, a system interface for communicating with a system controller, and a memory array interface for communicating with a memory array. A memory module array for storing information and a high speed serial memory interface system for providing interface configuration management are integrated on a single substrate.
    • 本发明是一种高速串行存储器接口系统和方法,其有助于以相对高速的串行通信速率操作的系统控制器与以相对慢的串行通信速率工作的存储器阵列之间的信息的有效通信。 在一个实施例中,本发明是具有用于协调信息通信信号的适当对准的信息配置核心的高速串行存储器接口系统,用于与系统控制器通信的系统接口以及用于与存储器阵列通信的存储器阵列接口。 用于存储信息的存储器模块阵列和用于提供接口配置管理的高速串行存储器接口系统集成在单个衬底上。
    • 18. 发明授权
    • Buried layer substrate isolation in integrated circuits
    • 集成电路中埋地层衬底隔离
    • US06831346B1
    • 2004-12-14
    • US09849047
    • 2001-05-04
    • Gabriel LiKenelm G. D. MurrayJose ArreolaShahin SharifzadehK. Nirmal Ratnakumar
    • Gabriel LiKenelm G. D. MurrayJose ArreolaShahin SharifzadehK. Nirmal Ratnakumar
    • H01L2900
    • H01L29/41758H01L21/761H01L21/823878H01L29/0847
    • In an embodiment of an integrated circuit structure having buried layer substrate isolation and a method for forming same, a buried layer having conductivity type opposite to that of an overlying well region is used for wells containing transistors prone to noise generation, where the wells are of the same conductivity type as the substrate. The buried layer may in some embodiments include a first portion underlying the transistor and a second portion spaced apart from and laterally surrounding the first portion. In some embodiments, the circuit may include a doped annular region of the same conductivity type as the buried layer, where the annular region contacts a portion of the buried layer and laterally surrounds the transistor. The circuit may further include metallization adapted to connect the well and annular region to opposite polarities of a power supply voltage, or in some embodiments to preclude such connection.
    • 在具有掩埋层衬底隔离的集成电路结构及其形成方法的实施例中,具有与上覆阱区相反的导电类型的掩埋层用于容纳产生噪声的晶体管的阱,其中阱为 与基片相同的导电类型。 在一些实施例中,掩埋层可以包括晶体管下面的第一部分和与第一部分间隔开并横向包围第一部分的第二部分。 在一些实施例中,电路可以包括与埋层相同的导电类型的掺杂环形区域,其中环形区域接触掩埋层的一部分并横向围绕晶体管。 电路还可以包括适于将阱和环形区域连接到电源电压的相反极性的金属化,或者在一些实施例中以排除这种连接。
    • 19. 发明授权
    • Phase alignment system
    • 相位对准系统
    • US06373302B1
    • 2002-04-16
    • US09533740
    • 2000-03-23
    • Gabriel LiPaul H. Scott
    • Gabriel LiPaul H. Scott
    • H03L700
    • H03L7/0814
    • An apparatus including a clock circuit and a control circuit. The clock circuit may be configured to generate a first output clock, a second output clock and a first control signal in response to (i) a first input clock, (ii) a second input clock, (iii) a second control signal and (iv) a third control signal. The control circuit may be configured to generate the second control signal and the third control signal in response to the first input clock and the first control signal. The first and second output clocks may have a skew less than a predetermined threshold.
    • 一种包括时钟电路和控制电路的装置。 时钟电路可以被配置为响应于(i)第一输入时钟,(ii)第二输入时钟,(iii)第二控制信号和(iii)第二控制信号而产生第一输出时钟,第二输出时钟和第一控制信号, iv)第三控制信号。 控制电路可以被配置为响应于第一输入时钟和第一控制信号而产生第二控制信号和第三控制信号。 第一和第二输出时钟可以具有小于预定阈值的偏斜。