会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 131. 发明申请
    • SEMICONDUCTOR DEVICE
    • 半导体器件
    • US20090195387A1
    • 2009-08-06
    • US12358349
    • 2009-01-23
    • Jun KOYAMAShunpei YAMAZAKI
    • Jun KOYAMAShunpei YAMAZAKI
    • G08B13/14
    • G06K19/0723G06K19/0719
    • A semiconductor device with improved reliability, in which increase in power consumption can be reduced. The semiconductor device includes an antenna for transmitting and receiving a wireless signal to/from a communication device and at least first and second functional circuits electrically connected to the antenna. The first functional circuit includes a power supply control circuit for controlling power supply voltage output from a power supply circuit in the second functional circuit. A power supply control circuit in the second functional circuit includes a transistor of which first terminal is electrically connected to an output terminal of the power supply circuit and second terminal is electrically connected to a ground line. A gate terminal of the transistor is electrically connected to the power supply control circuit included in one functional circuit.
    • 具有可靠性提高的能够降低功耗增加的半导体装置。 半导体器件包括用于向/从通信设备发送和接收无线信号的天线以及电连接到天线的至少第一和第二功能电路。 第一功能电路包括用于控制从第二功能电路中的电源电路输出的电源电压的电源控制电路。 第二功能电路中的电源控制电路包括晶体管,其第一端子电连接到电源电路的输出端子,并且第二端子电连接到接地线。 晶体管的栅极端子电连接到包括在一个功能电路中的电源控制电路。
    • 136. 发明申请
    • THIN FILM TRANSISTOR, AND DISPLAY DEVICE HAVING THE THIN FILM TRANSISTOR
    • 薄膜晶体管和具有薄膜晶体管的显示器件
    • US20090114921A1
    • 2009-05-07
    • US12258569
    • 2008-10-27
    • Shunpei YAMAZAKIYasuhiro JINBO
    • Shunpei YAMAZAKIYasuhiro JINBO
    • H01L29/04
    • H01L29/4908H01L29/04H01L29/66765H01L29/78609H01L29/78678H01L29/78696
    • The thin film transistor includes a gate insulating film formed over a gate electrode; a microcrystalline semiconductor film including an impurity element which serves as a donor, formed over the gate insulating film; a pair of buffer layers formed over the microcrystalline semiconductor film; a pair of semiconductor films to which an impurity element imparting one conductivity type is added, formed over the pair of buffer layers; and wirings formed over the pair of semiconductor films to which an impurity element imparting one conductivity type is added. The concentration of the impurity element which serves as a donor in the microcrystalline semiconductor film is decreased from the gate insulating film side toward the buffer layers, and the buffer layers do not include the impurity element which serves as a donor at a higher concentration than the detection limit of SIMS.
    • 薄膜晶体管包括形成在栅电极上的栅极绝缘膜; 包括形成在所述栅极绝缘膜上的用作供体的杂质元素的微晶半导体膜; 形成在所述微晶半导体膜上的一对缓冲层; 在一对缓冲层上形成一对添加有赋予一种导电类型的杂质元素的半导体膜; 并且在添加有赋予一种导电类型的杂质元素的一对半导体膜上形成的布线。 作为微晶半导体膜中的供体的杂质元素的浓度从栅极绝缘膜侧朝向缓冲层减少,缓冲层不包含作为供体的杂质元素,其浓度高于 SIMS检测限。
    • 137. 发明申请
    • METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE, DISPLAY PANEL, AND DISPLAY DEVICE
    • 用于制造半导体衬底,显示面板和显示装置的方法
    • US20090104750A1
    • 2009-04-23
    • US12253301
    • 2008-10-17
    • Shunpei YAMAZAKIHideto OHNUMAJun KOYAMA
    • Shunpei YAMAZAKIHideto OHNUMAJun KOYAMA
    • H01L21/762
    • H01L27/1266C03C17/3435C03C17/3482C03C2218/32H01L21/76254H01L27/1214H01L29/66772Y10S438/938Y10S438/961
    • If the size of a single crystal silicon layer attached is not appropriate, even when a large glass substrate is used, the number of panels to be obtained cannot be maximized. Therefore, in the present invention, a substantially quadrangular single crystal semiconductor substrate is formed from a substantially circular single crystal semiconductor wafer, and a damaged layer is formed by irradiation with an ion beam into the single crystal semiconductor substrate. A plurality of the single crystal semiconductor substrates are arranged so as to be separated from each other over one surface of a supporting substrate. By thermal treatment, a crack is generated in the damaged layer and the single crystal semiconductor substrate is separated while a single semiconductor layer is left over the supporting substrate. After that, one or a plurality of display panels is manufactured from the single crystal semiconductor layer bonded to the supporting substrate.
    • 如果附着的单晶硅层的尺寸不合适,即使使用大的玻璃基板,也不能使要获得的面板的数量最大化。 因此,在本发明中,从大致圆形的单晶半导体晶片形成大致四边形的单晶半导体基板,通过将离子束照射到单晶半导体基板中形成损伤层。 多个单晶半导体基板被布置成在支撑基板的一个表面上彼此分离。 通过热处理,在损伤层中产生裂纹,并且单个半导体衬底被分离,而单个半导体层留在支撑衬底上。 之后,从结合到支撑基板的单晶半导体层制造一个或多个显示面板。
    • 138. 发明申请
    • METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
    • 制造半导体器件的方法
    • US20090098709A1
    • 2009-04-16
    • US12240186
    • 2008-09-29
    • Hideto OHNUMAYoichi IIKUBOShunpei YAMAZAKI
    • Hideto OHNUMAYoichi IIKUBOShunpei YAMAZAKI
    • H01L21/762
    • H01L27/1266H01L21/76254H01L27/1214H01L29/66772
    • To provide a method of manufacturing a semiconductor device, which prevents impurities from entering an SOI substrate. A source gas including one or plural kinds selected from a hydrogen gas, a helium gas, or halogen gas are excited to generate ions, and the ions are added to a bonding substrate to thereby form a fragile layer in the bonding substrate. Then, a region of the bonding substrate that is on and near the surface thereof, i.e., a region ranging from a shallower position than the fragile layer to the surface is removed by etching, polishing, or the like. Next, after attaching the bonding substrate to a base substrate, the bonding substrate is separated at the fragile layer to thereby form a semiconductor film over the base substrate. After forming the semiconductor film over the base substrate, a semiconductor element is formed using the semiconductor film.
    • 提供一种防止杂质进入SOI衬底的半导体器件的制造方法。 激发包括选自氢气,氦气或卤素气体中的一种或多种的源气体以产生离子,并将离子加入到接合衬底中,从而在接合衬底中形成脆性层。 然后,通过蚀刻,抛光等除去在其表面上及其附近,即从比脆弱层更浅的位置到表面的区域的接合基板的区域。 接下来,在将接合基板粘贴到基底基板上之后,在脆性层分离接合基板,从而在基底基板上形成半导体膜。 在基底基板上形成半导体膜之后,使用半导体膜形成半导体元件。
    • 140. 发明申请
    • MANUFACTURING METHOD OF SUBSTRATE PROVIDED WITH SEMICONDUCTOR FILMS
    • 具有半导体膜的衬底的制造方法
    • US20090081845A1
    • 2009-03-26
    • US12211951
    • 2008-09-17
    • Shunpei YAMAZAKIMakoto FURUNO
    • Shunpei YAMAZAKIMakoto FURUNO
    • H01L21/762
    • H01L21/02002H01L21/76254
    • A plurality of rectangular single crystal semiconductor substrates are prepared. Each of the single crystal semiconductor substrates is doped with hydrogen ions and a damaged region is formed at a desired depth, and a bonding layer is formed on a surface thereof. The plurality of single crystal substrates with the damaged regions formed therein and the bonding layers formed thereover are arranged on a tray. Depression portions for holding the single crystal semiconductor substrates are formed in the tray. With the single crystal semiconductor substrates arranged on the tray, the plurality of single crystal semiconductor substrates with the damaged regions formed therein and the bonding layers formed thereover are bonded to a base substrate. By performing heat treatment and dividing the single crystal semiconductor substrates along the damaged regions, the plurality of single crystal semiconductor layers that are sliced are formed over the base substrate.
    • 制备多个矩形单晶半导体衬底。 每个单晶半导体衬底都掺杂有氢离子,并且在期望的深度上形成损伤区域,并且在其表面上形成接合层。 其中形成有损伤区域的多个单晶基板和形成在其上的接合层布置在托盘上。 用于保持单晶半导体衬底的凹陷部分形成在托盘中。 利用布置在托盘上的单晶半导体衬底,其中形成有损坏区域的多个单晶半导体衬底和其上形成的接合层被接合到基底衬底。 通过对损伤区域进行热处理和分割单晶半导体基板,在基底基板上形成切片的多个单晶半导体层。