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    • 111. 发明申请
    • FLUORESCENCE DETECTION SYSTEM
    • 荧光检测系统
    • US20100243915A1
    • 2010-09-30
    • US12438722
    • 2008-02-20
    • Takashi Fukuzawa
    • Takashi Fukuzawa
    • G01N21/64G01J1/58
    • G01N21/645G01N2021/6484
    • A fluorescence detection system capable of detecting fluorescence with a high sensitivity even if a sample generating fluorescence is small in amount includes a light source emitting excitation light, a probe arranged in opposition to a sample unit, an optical multiplexer/demultiplexer, a detector, a first optical fiber connecting the light source to the optical multiplexer/demultiplexer, a second optical fiber connecting the probe to the optical multiplexer/demultiplexer, and a third optical fiber connecting the detector to the optical multiplexer/demultiplexer. An excitation filter, serving as a short-pass filter, is arranged on the first optical fiber and a detection filter serving as a long-pass filter is arranged on the third optical fiber. The optical multiplexer/demultiplexer includes a multiplexing/demultiplexing filter serving as a long-pass filter.
    • 即使产生荧光的样品量少的荧光检测系统也能够高灵敏度地检测荧光,包括发射激发光的光源,与样品单元相对布置的探针,光复用器/解复用器,检测器, 将光源连接到光复用器/解复用器的第一光纤,将探针连接到光复用器/解复用器的第二光纤和将检测器连接到光复用器/解复用器的第三光纤。 用作短路滤波器的激励滤波器布置在第一光纤上,并且在第三光纤上布置用作长通滤波器的检测滤波器。 光复用器/解复用器包括用作长通滤波器的复用/解复用滤波器。
    • 120. 发明申请
    • DEVICE FOR THE EXALTED DETECTION OF THE EMISSION OF A TARGET PARTICLE
    • 用于显着检测目标颗粒的排放的装置
    • US20100140460A1
    • 2010-06-10
    • US12515664
    • 2007-11-21
    • Hervé RigneaultPierre-Francois LenneJerome WengerEvgueni PopovThomas Ebbesen
    • Hervé RigneaultPierre-Francois LenneJerome WengerEvgueni PopovThomas Ebbesen
    • G01J3/50G01J1/58
    • G01N21/6428G01N21/6452
    • The invention relates to a device (1) for detecting the emission of a target particle (6) at an emission wavelength, said device comprising: a photo-detector (2, 2A, 2B) comprising a sensitive detection surface having a high optical index; wherein said target particle (6) can be positioned in the vicinity of said sensitive surface in an analysis medium (13) having a low optical index; said device being characterised in that it further comprises: a mask (3) covering said sensitive surface, said mask including at least one area (4) opaque at said emission wavelength and at least one hole (5), said hole being capable of receiving the target particle; and in that the mask includes at least one interface; 7 said device further comprising at least one groove (10, 10A, 10B) provided at said interface, each of said at least one groove surrounding each of said at least one hole.
    • 本发明涉及一种用于检测发射波长的目标颗粒(6)的发射的装置(1),所述装置包括:光检测器(2,2A,2B),包括具有高光学指数的敏感检测表面 ; 其中所述目标颗粒(6)可以位于具有低光学指数的分析介质(13)中的所述敏感表面附近; 所述装置的特征在于,其还包括:覆盖所述敏感表面的掩模(3),所述掩模包括至少一个在所述发射波长处不透明的区域(4)和至少一个孔(5),所述孔能够接收 目标粒子; 并且所述掩模包括至少一个界面; 7,所述装置还包括设置在所述界面处的至少一个凹槽(10,10A,10B),每个所述至少一个凹槽围绕所述至少一个孔的每一个。