专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

111. 发明申请

US20070047093A1 METHOD AND DEVICE FOR THE IMMERSION AND CLEANING OF THE FRONT LENS OF MICROSCOPE OBJECTIVES 审中-公开
标题翻译：用于显微镜目标的前视镜的浸没和清洁的方法和装置
公开(公告)号：US20070047093A1
公开(公告)日：2007-03-01
申请号：US11467231
申请日：2006-08-25
申请人： Lutz Hoering , Andreas Nolte
发明人： Lutz Hoering , Andreas Nolte
IPC分类号： G02B21/02
CPC分类号： G02B27/0006 , G02B21/02
摘要： A method and a device are provided for the immersion and for the cleaning of the front lens of microscope objectives in fully automatic microscope systems, in particular inverted microscopes, for the examination of biological and/or chemical samples by which, besides an automatic immersion process, an automatic cleaning of the front lens of the microscope objective is achieved at the same time at the conclusion of the immersion process. In a method in which water is preferably used as immersion liquid, the immersion liquid is provided at the same time as a cleaning liquid for the automatic cleaning of a front lens of a microscope objective at the conclusion of the immersion process. The device according to the invention for implementing the method comprises a receiving vessel which can be placed on the front lens of the microscope objective. Openings are provided in the receiving vessel and are connected to a tube system for supplying fresh immersion and cleaning liquid from a reservoir vessel and for discharging the soiled liquid into a receiving vessel.
摘要翻译：提供了一种方法和装置，用于在全自动显微镜系统（特别是倒置显微镜）中用于浸没和清洁显微镜物镜的前透镜，用于检查生物和/或化学样品，除了自动浸没过程在浸入过程结束的同时，实现了显微镜物镜的前镜的自动清洁。在优选使用水作为浸渍液体的方法中，浸渍液同时设置为在浸渍处理结束时自动清洁显微镜物镜的前透镜的清洗液。根据本发明的用于实现该方法的装置包括可放置在显微镜物镜的前透镜上的接收容器。开口设置在接收容器中并且连接到管系统，用于从储存容器提供新鲜的浸没和清洁液体，并将污染的液体排放到接收容器中。

112. 发明授权

US08797645B2 Method and configuration for the optical detection of an illuminated specimen 有权
标题翻译：照明样本的光学检测方法和结构
公开(公告)号：US08797645B2
公开(公告)日：2014-08-05
申请号：US13966714
申请日：2013-08-14
申请人： Carl Zeiss Microscopy GmbH
发明人： Michael Schwertner , Ralf Wolleschensky , Michael Kempe
IPC分类号： G02B21/14
CPC分类号： G02B21/14 , G02B21/0024 , G02B21/06
摘要： A method for the optical detection of an illuminated specimen, wherein the illuminating light impinges in a spatially structured manner in at least one plane on the specimen and several images of the specimen are acquired by a detector in different positions of the structure on the specimen. An optical sectional image and/or an image with enhanced resolution is then calculated. The method includes generating a diffraction pattern in the direction of the specimen in or near the pupil of the objective lens or in a plane conjugate to the pupil. A phase plate with regions of varying phase delays is dedicated to the diffraction pattern in or near the pupil of the objective lens or in a plane conjugate to said pupil, and different phase angles of the illuminating light are set.
摘要翻译：一种用于照射样本的光学检测的方法，其中所述照明光以空间结构的方式照射在所述样本上的至少一个平面中，并且所述样本的多个图像由所述样本上的所述结构的不同位置的检测器获取。然后计算出具有增强的分辨率的光学截面图像和/或图像。该方法包括在物镜的瞳孔中或其附近或在与瞳孔共轭的平面中的样本的方向上产生衍射图案。具有不同相位延迟的区域的相位板专用于物镜的光瞳中或附近的衍射图案或与所述瞳孔共轭的平面，并且设定照明光的不同相位角。

113. 发明授权

US08563912B2 Microscope having focus-holding unit 有权
标题翻译：显微镜具有聚焦保持单元
公开(公告)号：US08563912B2
公开(公告)日：2013-10-22
申请号：US12937970
申请日：2009-04-04
申请人： Reiner Mitzkus , Eugen Wehner , Stefan Steinborn , Gleb Milinovici , Steffen Leidenbach , Peter Westphal
发明人： Reiner Mitzkus , Eugen Wehner , Stefan Steinborn , Gleb Milinovici , Steffen Leidenbach , Peter Westphal
IPC分类号： G02B27/40
CPC分类号： G02B21/241
摘要： The invention relates to a microscope having a stage for supporting a sample to be examined, a recording sensor, an imaging optic for imaging the sample onto the recording sensor, a moving unit by means of which the distance between the stage and the imaging optic can be changed, a control unit for controlling an image recording of the sample and a focus-holding unit for maintaining a prescribed focal position for image recording of the sample at temporal intervals, wherein the focus-holding device comprises at least one hardware element and one software module, wherein the focus-holding unit is fully integrated in the control unit, on both the hardware and software sides.
摘要翻译：本发明涉及一种显微镜，其具有用于支撑待检查样本的台，记录传感器，用于将样本成像到记录传感器上的成像光学元件，移动单元，通过该移动单元，台与成像光学元件之间的距离改变控制单元，用于控制样本的图像记录;以及聚焦保持单元，用于维持用于以时间间隔对样本进行图像记录的规定焦点位置，其中聚焦保持装置包括至少一个硬件元件和一个软件模块，其中聚焦保持单元在硬件和软件两侧完全集成在控制单元中。

114. 发明授权

US08420992B2 Microscope 有权
标题翻译：显微镜
公开(公告)号：US08420992B2
公开(公告)日：2013-04-16
申请号：US12905246
申请日：2010-10-15
申请人： Peter Kuehn , Dietmar Schmidt , Thomas Mehner
发明人： Peter Kuehn , Dietmar Schmidt , Thomas Mehner
IPC分类号： G02B21/06
CPC分类号： G02B21/0044 , G02B21/008
摘要： In microscopes, particularly laser scanning microscopes, for detecting light coming from a sample, it is known to protect detectors from excessively high light outputs by means of shutters in the detection beam path. Further, in order to measure the light output impinging on the detector when the detection beam path is closed, a portion of the light is coupled out of the detection beam path and directed to a monitor diode. Constructions of this kind are complicated and costly. In the microscope according to the invention, a monitor diode is arranged on the shutter in such a way that the monitor diode is situated in the detection beam path when the shutter is closed. This makes it possible in a simple manner to measure the light output in a microscope when the detection beam path is closed even without additionally coupling light out of the detection beam path.
摘要翻译：在显微镜中，特别是用于检测来自样品的光的激光扫描显微镜，已知通过检测光束路径中的百叶窗来保护检测器免受过高的光输出。此外，为了测量当检测光束路径闭合时入射到检测器上的光输出，光的一部分被耦合到检测光束路径外并被引导到监视二极管。这样的建设是复杂和昂贵的。在根据本发明的显微镜中，监视二极管被布置在快门上，使得当快门关闭时，监视二极管位于检测光束路径中。这使得即使没有将光从检测光束路径附加到外部，当检测光束路径闭合时，也可以以简单的方式测量显微镜中的光输出。

115. 发明申请

US20130077160A1 EXCHANGEABLE ALIGNMENT MARKER UNIT 有权
标题翻译：可交换对齐标记单元
公开(公告)号：US20130077160A1
公开(公告)日：2013-03-28
申请号：US13593038
申请日：2012-08-23
申请人： Heino HEISE , Ulrich KOHLHAAS
发明人： Heino HEISE , Ulrich KOHLHAAS
IPC分类号： G02B21/34 , G01B3/00
CPC分类号： G02B21/34 , G01B3/00 , G02B27/32
摘要： An alignment marker unit for an object holder for microscopic imaging of an object with a microscope, wherein the alignment marker unit can be removed from and remounted on the object holder, wherein the alignment marker unit has at least one alignment marker for microscope-supported detection, and wherein the alignment marker is designed to determine a coordinate system for the object holder which allows for the microscope-supported calibration of the object or an area of the object relative to its position to the object holder and the position of the object holder relative to the microscope. Furthermore, an object holder system including an object holder and an alignment marker unit as described above is provided.
摘要翻译：用于用显微镜对物体进行显微成像的物体保持器的对准标记单元，其中对准标记单元可以从物体保持器上移除并重新安装在物体保持器上，其中对准标记单元具有用于显微镜支撑的检测的至少一个对准标记，并且其中所述对准标记被设计成确定所述物体保持器的坐标系，其允许所述物体的显微镜支撑的校准或所述物体的相对于其对所述物体保持器的位置的物体的面积以及所述物体保持器相对的位置到显微镜此外，提供了一种包括物体保持器和如上所述的对准标记单元的物体保持器系统。

116. 发明申请

US20130010354A1 ILLUMINATING DEVICE 有权
标题翻译：照明设备
公开(公告)号：US20130010354A1
公开(公告)日：2013-01-10
申请号：US13635255
申请日：2011-02-14
申请人： Alexander Scheps
发明人： Alexander Scheps
IPC分类号： G02B21/06
CPC分类号： G02B21/16 , G02B21/0032 , G02B21/06
摘要： An illuminating device for a microscope may include a holder which carries a plurality of lighting units to be positioned in an illuminating target position. It may also include a pivot system with which the holder can be rotated about a pivot axis such that each lighting unit can be positioned selectively in the illuminating target position, wherein the rotational range of the holder about the pivot axis is less than 360°.
摘要翻译：用于显微镜的照明装置可以包括保持器，该保持器承载要定位在照明目标位置的多个照明单元。它还可以包括枢轴系统，保持器可以围绕枢转轴线旋转，使得每个照明单元可以选择性地定位在照明目标位置，其中保持器围绕枢转轴线的旋转范围小于360°。

117. 发明申请

US20120314208A1 MEASURING METHOD AND DEVICE FOR DETERMINING TRANSMISSION AND/OR REFLECTION PROPERTIES 有权
标题翻译：用于确定传输和/或反射特性的测量方法和装置
公开(公告)号：US20120314208A1
公开(公告)日：2012-12-13
申请号：US13492306
申请日：2012-06-08
申请人： Joerg MARGRAF , Peter LAMPARTER
发明人： Joerg MARGRAF , Peter LAMPARTER
IPC分类号： G01N21/59 , G01N21/55
CPC分类号： G01N21/8901 , G01N21/474 , G01N21/896 , G01N2201/065
摘要： The disclosure relates to optical measuring methods and apparatus for determining the transmission and/or reflection properties of translucent objects with utility for process monitoring and quality inspection in the manufacture of surface-coated substrates. According to the disclosure the transmission and reflection properties are determined in such a way that sequentially: a first large surface of the object is illuminated by a first illuminating device, with a photodetector measuring the total transmittance (Ttotal), a second, large surface of the object, lying opposite and parallel to the first one, is illuminated by a second illuminating device, with a photodetector measuring the diffuse transmittance (Tdiffuse), and optionally the first large surface of the object is illuminated by the first illuminating device, with the photodetector measuring the reflectance, and/or the second large surface of the object is illuminated by the second illuminating device, with the photodetector measuring the reflectance.
摘要翻译：本公开涉及用于确定半透明物体的透射和/或反射特性的光学测量方法和装置，其用于在表面涂覆的基底的制造中用于过程监测和质量检查。根据本公开，透射和反射特性以如下方式确定：顺序地：物体的第一大表面由第一照明装置照射，光电检测器测量总透射率（T total），第二大表面与第一照明装置相对并平行的物体由第二照明装置照射，光电检测器测量漫透射率（Tdiffuse），并且可选地，物体的第一大表面被第一照明装置照射，测量反射率的光电检测器和/或物体的第二大表面由第二照明装置照射，光电检测器测量反射率。

118. 发明授权

US08304745B2 Specimen holder having alignment marks 有权
标题翻译：标本支架具有对准标记
公开(公告)号：US08304745B2
公开(公告)日：2012-11-06
申请号：US13149285
申请日：2011-05-31
申请人： Heino Heise , Andreas Nolte , Christian Thomas , Martin Edelmann , Uwe Wolf , Ulrich Kohlhaas , Dmitry Lysenkov
发明人： Heino Heise , Andreas Nolte , Christian Thomas , Martin Edelmann , Uwe Wolf , Ulrich Kohlhaas , Dmitry Lysenkov
IPC分类号： G02B21/34 , H01J37/20 , H01J37/26
CPC分类号： G02B21/34
摘要： For the microscopy of an object or a specimen with a combination of optical microscopy and particle beam microscopy, an electrically conducting specimen carrier (1) is used which is configured for use in a particle beam microscope as well as in an optical microscope and has at least one alignment mark (2). The alignment mark is configured as a pass-through structure and is detectable from the top and from the bottom of the specimen carrier.
摘要翻译：对于具有光学显微镜和粒子束显微镜组合的物体或样品的显微镜，使用导电的试样载体（1），其配置用于粒子束显微镜以及在光学显微镜中并具有至少一个对准标记（2）。对准标记被配置为直通结构，并且可以从样本载体的顶部和底部检测。

119. 发明授权

US08294897B2 Method for imaging a sample using a microscope, and microscope and data storage center 有权
标题翻译：使用显微镜对样品进行成像的方法，以及显微镜和数据存储中心
公开(公告)号：US08294897B2
公开(公告)日：2012-10-23
申请号：US12576596
申请日：2009-10-09
申请人： Christopher Power
发明人： Christopher Power
IPC分类号： G01N21/25
CPC分类号： G02B21/0064 , G01N21/6458 , G02B21/0032 , G02B21/0076 , G02B21/008
摘要： The invention relates to a method for imaging a sample using a microscope, in particular a scanning microscope, in which the sample is illuminated with excitation light via an illuminating beam path, and light emitted from the sample is recorded via a detection beam path, wherein at least one adjustable beam splitter having an adjustable threshold wavelength is arranged in the detection beam path or/and in the illuminating beam path, and wherein light emitted from the sample is detected in at least one detection channel. According to the inventive method, for at least one predetermined sample region, a signal intensity of light detected in the at least one detection channel is recorded for a plurality of threshold wavelengths set at the adjustable beam splitter to obtain a signal/threshold-dependency of the predetermined sample region.
摘要翻译：本发明涉及一种使用显微镜，特别是扫描显微镜对样品成像的方法，其中通过照明光束路径用激发光照射样品，并且经由检测光束路径记录从样品发射的光，其中在检测光束路径中或/和照明光束路径中布置具有可调阈值波长的至少一个可调分束器，并且其中在至少一个检测通道中检测从样品发射的光。根据本发明的方法，对于至少一个预定采样区域，在设置在可调分束器处的多个阈值波长中记录在至少一个检测通道中检测到的光的信号强度，以获得信号/阈值依赖性预定的样品区域。

120. 发明授权

US08253093B2 Optoelectronic detector assembly and method of operating same 有权
标题翻译：光电检测器组件及其操作方法
公开(公告)号：US08253093B2
公开(公告)日：2012-08-28
申请号：US12849967
申请日：2010-08-04
申请人： Mirko Liedtke , Matthias John
发明人： Mirko Liedtke , Matthias John
IPC分类号： H01J7/24 , G01J5/02 , G01N19/00 , G01N7/00 , F24F3/14
CPC分类号： G02B21/362 , G01J1/02 , G01J1/0252 , G02B7/008 , G02B21/28
摘要： An optoelectronic detector and method of using same. In order to avoid any condensation on a surface, it has been known to heat such a surface. However, heating an optoelectronic detector will create a stronger hissing noise due to the greater dark current that is caused thereby. The invention is intended to avoid any condensation on an optoelectronic detector without airtight encapsulation. To this end, the detector is cooled and equipped with a sensor for the determination of a current value of one of the variables ambient humidity and ambient dew point temperature and a control unit that is connected with the sensor and designed to control the cooling device in dependence of such a value. By taking into account the ambient humidity or, respectively, the dew point temperature in the control of the cooling device, condensation on the detector can be avoided. An airtight encapsulation of the detector and the cooling device is not required.
摘要翻译：一种光电检测器及其使用方法。为了避免表面上的任何冷凝，已知加热这种表面。然而，由于由此引起的较大的暗电流，加热光电检测器将产生更强的嘶嘶声。本发明旨在避免在没有气密封装的情况下在光电检测器上的任何冷凝。为此，检测器被冷却并配备有用于确定环境湿度和环境露点温度之一的变量的当前值的传感器，以及与传感器连接并被设计成控制冷却装置的控制单元这种价值的依赖。通过考虑环境湿度或分别控制冷却装置的露点温度，可以避免检测器上的冷凝。不需要检测器和冷却装置的气密封装。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式