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    • 111. 发明授权
    • Flash memory device
    • 闪存设备
    • US07566927B2
    • 2009-07-28
    • US10840580
    • 2004-05-07
    • Moo-Sung KimYeong-Taek LeeSeung-Jae Lee
    • Moo-Sung KimYeong-Taek LeeSeung-Jae Lee
    • H01L29/788
    • G11C16/10G11C11/5628G11C16/0483H01L27/115
    • A flash memory device may include a memory cell array having a plurality of word lines, bit lines, and memory cells. Each memory cell may be arranged at an intersection of a corresponding word line and a corresponding bit line. The device may include a bit line voltage setting circuit for setting a voltage on a bit line of a given memory cell to be programmed to a variable bit line voltage or to a ground voltage. A variable bit line voltage generating circuit may be provided in the flash memory device for generating the variable bit line voltage. To facilitating programming of the device, a bit line voltage of a given memory cell to be programmed may be set based on a supply voltage of the device, so as to maintain a voltage difference based on the set bit line voltage above a given threshold voltage.
    • 闪存器件可以包括具有多个字线,位线和存储器单元的存储单元阵列。 每个存储单元可以被布置在对应的字线和对应的位线的交叉点处。 该设备可以包括位线电压设置电路,用于将要编程的给定存储器单元的位线上的电压设置为可变位线电压或接地电压。 可变位线电压产生电路可以设置在闪存器件中,用于产生可变位线电压。 为了便于设备的编程,可以基于设备的电源电压来设置要编程的给定存储器单元的位线电压,以便基于设定的位线电压维持高于给定阈值电压的电压差 。