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    • 101. 发明申请
    • NON-BINARY SUCCESSIVE APPROXIMATION ANALOG TO DIGITAL CONVERTER
    • 非二进制近似逼近模拟数字转换器
    • US20130021181A1
    • 2013-01-24
    • US13188482
    • 2011-07-22
    • Nishit Harshad Shah
    • Nishit Harshad Shah
    • H03M1/12
    • H03M1/0692H03M1/468
    • A successive approximation analog to digital converter (SA-ADC) employs a binary-weighted digital to analog converter (DAC) to perform a non-binary search in determining a digital representation of a sample of an analog signal. In an embodiment, a subset of iterations needed to convert an analog sample to a digital value is performed using non-binary search with a radix of conversion less than two. As a result, search windows in iterations corresponding to the non-binary search overlap, and correction of errors due to a comparator used in the SA-ADC is rendered possible. Error correction being possible due to the non-binary search, the comparator is operated in a low-bandwidth, and hence low-power, mode during the non-binary search. The non-binary search in combination with the binary-weighted architecture of the DAC offer several benefits such as for example, less-complex implementation, shorter conversion time, easier and compact layout and lower power consumption.
    • 逐次逼近模数转换器(SA-ADC)采用二进制加权数模转换器(DAC)来执行非二进制搜索以确定模拟信号样本的数字表示。 在一个实施例中,使用转换小于2的非二进制搜索来执行将模拟样本转换为数字值所需的迭代子集。 结果,对应于非二进制搜索的迭代中的搜索窗口重叠,并且由于在SA-ADC中使用的比较器导致的错误校正成为可能。 由于非二进制搜索可能导致误差校正,比较器在非二进制搜索期间以低带宽,因此低功耗模式运行。 结合DAC的二进制加权架构的非二进制搜索提供了几个好处,例如,较不复杂的实现,较短的转换时间,更简单和紧凑的布局以及更低的功耗。
    • 102. 发明申请
    • SUCCESSIVE APPROXIMATION REGISTER ANALOG TO DIGITAL CONVERTER AND CONVERSION METHOD THEREOF
    • 数字近似寄存器模拟数字转换器及其转换方法
    • US20120326900A1
    • 2012-12-27
    • US13479021
    • 2012-05-23
    • Meng Hsuan WUYung-Hui CHUNG
    • Meng Hsuan WUYung-Hui CHUNG
    • H03M1/38
    • H03M1/0673H03M1/468
    • A SAR ADC is provided. A DAC provides an intermediate analog signal according to an analog input signal, a most significant bit capacitance and a plurality of significant bit capacitances smaller than the most significant bit capacitance. A first switched capacitor array selectively provides the most significant bit capacitance or the significant bit capacitances according to a select signal. Sum of the significant bit capacitances is equal to the most significant bit capacitance. The second switched capacitor array provides the significant bit capacitances when the first switched capacitor array provides the most significant bit capacitance, and provides the most significant bit capacitance when the first switched capacitor array provides the significant bit capacitances. A comparator provides a comparison result according to the intermediate analog signal. A SAR logic provides an digital output signal according to the comparison result.
    • 提供了一个SAR ADC。 DAC根据模拟输入信号,最高有效位电容和小于最高有效位电容的多个有效位电容提供中间模拟信号。 第一开关电容器阵列根据选择信号选择性地提供最高有效位电容或有效位电容。 有效位电容的总和等于最高有效位电容。 当第一开关电容器阵列提供最高有效位电容时,第二开关电容器阵列提供有效位电容,并且当第一开关电容器阵列提供有效位电容时提供最高有效位电容。 比较器根据中间模拟信号提供比较结果。 SAR逻辑根据比较结果提供数字输出信号。
    • 103. 发明申请
    • HIGH SPEED RESISTOR-DAC FOR SAR DAC
    • 用于SAR DAC的高速电阻DAC
    • US20120319886A1
    • 2012-12-20
    • US13164478
    • 2011-06-20
    • Abhijit Kurmar DASKrishnasawamy NAGARAJJoonsung PARK
    • Abhijit Kurmar DASKrishnasawamy NAGARAJJoonsung PARK
    • H03M1/34H03M1/12
    • H03M1/68H03M1/468H03M1/765H03M1/804
    • A singled-ended, successive approximation register analog-to-digital converter convert an analog input voltage to a digital representation comprising m upper order bits and a number of lower order bits. The SAR ADC comprises SAR logic, a resistive network, multiple switches, and first and second LSB capacitors. The switches also comprises two sets of switches coupled to the resistive network, each set of switches is configured to couple a selected tap to each of the first and second LSB capacitors. When determining the lower order bits, the SAR logic is configured to control the sets of switches to change the first and second taps from one cycle in which one of the lower order bits is determined to a next cycle in which the next of the lower order bits is determined so that the voltage of both taps changes by a decreasing amount with each succeeding bit being determined.
    • 单端逐次逼近寄存器模数转换器将模拟输入电压转换成包括m个高位位和多个低位位的数字表示。 SAR ADC包括SAR逻辑,电阻网络,多个开关以及第一和第二LSB电容。 开关还包括耦合到电阻网络的两组开关,每组开关被配置为将所选择的抽头耦合到第一和第二LSB电容器中的每一个。 当确定低阶位时,SAR逻辑被配置为控制开关组,以将第一和第二抽头从其中一个较低位确定的下一个周期改变为下一个较低阶的下一个周期 确定位,使得两个抽头的电压随着每个后续位被确定而减小量。
    • 105. 发明申请
    • Zero-power sampling SAR ADC circuit and method
    • 零功率采样SAR ADC电路及方法
    • US20120280841A1
    • 2012-11-08
    • US13068192
    • 2011-05-04
    • Yan WangTimothy V. KalthoffMichael A. Wu
    • Yan WangTimothy V. KalthoffMichael A. Wu
    • H03M1/12H03M1/00
    • H03M1/1295H03M1/468
    • A switched-capacitor circuit (10, 32 or 32A) samples a first signal (VIN+) onto a first capacitor (C1 or CIN1) by switching a top plate thereof via a summing conductor (13) to a first reference voltage (VSS) and switching a bottom plate thereof to the first signal. A second signal (VIN−) is sampled onto a second capacitor (C3 or CIN3) by switching a top plate thereof to the second signal and switching a bottom plate thereof to the first reference voltage. After the sampling, the top plate of the second capacitor is coupled to the top plate of the first capacitor. The bottom plate of the second capacitor is coupled to the first reference voltage. The bottom plate of the first capacitor is coupled to a second reference voltage (VDD or VREF), to thereby cancel at least a portion of a common mode input voltage component from the first conductor (13), hold the sampled differential charge on the summing conductor and establish a predetermined common mode voltage thereon, and prevent the summing conductor from having a voltage which allows the leakage of charge therefrom. The switched-capacitor circuit may be a SAR, an integrator, or an amplifier.
    • 开关电容器电路(10,32或32A)通过将加法导体(13)的顶板切换到第一参考电压(VSS)而将第一信号(VIN +)采样到第一电容器(C1或CIN1)上,并且 将其底板切换到第一信号。 将第二信号(VIN-)通过将其顶板切换到第二信号并将其底板切换到第一参考电压而被采样到第二电容器(C3或CIN3)上。 在采样之后,第二电容器的顶板耦合到第一电容器的顶板。 第二电容器的底板耦合到第一参考电压。 第一电容器的底板耦合到第二参考电压(VDD或VREF),从而从第一导体(13)消除共模输入电压分量的至少一部分,将采样的差分电荷保持在求和 并在其上建立预定的共模电压,并且防止求和导体具有允许从其中泄漏电荷的电压。 开关电容电路可以是SAR,积分器或放大器。
    • 107. 发明申请
    • D/A CONVERSION CIRCUIT, A/D CONVERSION CIRCUIT AND ELECTRONIC APPARATUS
    • D / A转换电路,A / D转换电路和电子设备
    • US20120212357A1
    • 2012-08-23
    • US13401485
    • 2012-02-21
    • Hideo HANEDATakemi YONEZAWA
    • Hideo HANEDATakemi YONEZAWA
    • H03M1/66H03M1/12
    • H03M1/066H03M1/468H03M1/687H03M1/804H03M1/806
    • A D/A conversion circuit includes a first D/A converting section which is connected with an output node, a first serial capacitor which is disposed between the output node and a first node, a second D/A converting section which is connected with the first node, and a control circuit. The first D/A converting section includes a first capacitor array section and a first switch array section. The second D/A converting section includes a second capacitor array section and a second switch array section. The control circuit performs a switch control for dynamically changing allocation of the capacitors to the respective bits of input digital data for the first switch array section of the first D/A converting section.
    • AD / A转换电路包括与输出节点连接的第一D / A转换部分,布置在输出节点和第一节点之间的第一串行电容器,与第一D / A转换部分连接的第二D / A转换部分 节点和控制电路。 第一D / A转换部分包括第一电容器阵列部分和第一开关阵列部分。 第二D / A转换部分包括第二电容器阵列部分和第二开关阵列部分。 控制电路执行用于动态地改变电容器的分配到第一D / A转换部分的第一开关阵列部分的输入数字数据的各个位的开关控制。