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    • 94. 发明申请
    • STRUCTURAL OPTIMIZATION SYSTEM
    • 结构优化系统
    • US20080033703A1
    • 2008-02-07
    • US11834716
    • 2007-08-07
    • Hirohisa EnomotoShigeru Sakamoto
    • Hirohisa EnomotoShigeru Sakamoto
    • G06G7/48
    • G06F17/5018
    • It includes: a part which changes a computer-aided design model according to a design variable and outputs it; a part which calculates and outputs natural vibration modes and natural frequencies; a part which makes a natural vibration mode image; a part which binarizes a natural vibration mode image by a threshold value to make a binary image; a part which extracts pattern information from a binary image and outputs it together with the image; a part for distinguishing natural vibration mode which, using pattern information, distinguishes the natural vibration mode to be tracked from natural vibration modes after deformation and outputs it; and a part for calculating optimum solution which finds a design variable which makes the natural frequency of a natural vibration mode a target value and outputs it. Thereby, the structural optimization system can easily distinguish and track natural vibration modes through computer-aided design model change in structural design.
    • 它包括:根据设计变量改变计算机辅助设计模型并输出的部分; 计算和输出自然振动模式和固有频率的部分; 构成自然振动模式图像的部分; 将自然振动模式图像二值化阈值的部分作为二值图像; 从二进制图像中提取图案信息并与图像一起输出的部分; 用于区分自然振动模式的部分,其使用模式信息,将要跟踪的固有振动模式与变形后的自然振动模式区分开并输出; 以及用于计算最优解的部分,其找到使固有振动模式的固有频率成为目标值的设计变量并输出。 因此,结构优化系统可以通过计算机辅助设计模型改变结构设计,轻松地区分和跟踪自然振动模式。
    • 97. 发明申请
    • Microscope and sample observation method
    • 显微镜和样品观察法
    • US20050190436A1
    • 2005-09-01
    • US10880100
    • 2004-06-30
    • Hirotoshi TeradaIkuo ArataMasaharu TokiwaHiroshi TanabeShigeru Sakamoto
    • Hirotoshi TeradaIkuo ArataMasaharu TokiwaHiroshi TanabeShigeru Sakamoto
    • G02B21/00G02B21/33
    • G02B21/0016G02B21/33Y10S359/90
    • For a semiconductor device S as an inspected object, there are provided an image acquisition part 1, an optical system 2 including an objective lens 20, and a solid immersion lens (SIL) 3 movable between an insertion position including an optical axis from the semiconductor device S to the objective lens 20 and a standby position off the optical axis. Then observation is carried out in two control modes consisting of a first mode in which the SIL 3 is located at the standby position and in which focusing and aberration correction are carried out based on a refractive index no and a thickness to of a substrate of the semiconductor device S, and a second mode in which the SIL 3 is located at the insertion position and in which focusing and aberration correction are carried out based on the refractive index no and thickness t0 of the substrate, and a refractive index n1, a thickness d1, and a radius of curvature R1 of SIL 3. This provides a microscope and a sample observation method capable of readily performing observation of the sample necessary for an analysis of microstructure or the like of the semiconductor device.
    • 对于作为检查对象的半导体装置S,提供了图像获取部分1,包括物镜20的光学系统2和在包括来自半导体的光轴的插入位置之间可移动的固体浸没透镜(SIL)3 装置S到物镜20和离开光轴的待机位置。 然后在两个控制模式中进行观察,该两种控制模式包括SIL 3位于待机位置的第一模式,并且基于第一模式的基板的折射率no和厚度对其执行聚焦和像差校正 半导体器件S和第二模式,其中SIL 3位于插入位置,并且基于衬底的折射率no和厚度t 0 0进行聚焦和像差校正, 和折射率n 1 1,厚度d 1,以及SIL 3的曲率半径R 1 1。 这提供了能够容易地观察对半导体器件的微细结构等的分析所需的样品的显微镜和样品观察方法。
    • 99. 发明授权
    • Method of and apparatus for controlling the operation of variable speed gearing
    • 控制变速传动装置运行的方法和装置
    • US06285533B1
    • 2001-09-04
    • US09459572
    • 1999-12-13
    • Shigeru Sakamoto
    • Shigeru Sakamoto
    • H02H504
    • H02P9/42H02H7/06H02P9/007
    • If an excess current is detected after the current in the secondary circuit of an induction generator-motor has exceeded a preset value, it is determined that a fault has occurred in the transmission line, provided that the current at the neutral point of a main transformer has exceeded a preset value. In this case, the operation of the induction generator-motor is continued. If no excess current is detected, it is determined that a fault has occurred in the secondary circuit of the induction generator-motor, provided that the current at the neutral point of the main transformer has not exceeded the preset value. In this case, the operation of the induction generator-motor is stopped.
    • 如果在感应发电机 - 电动机的二次回路中的电流超过预设值之后检测到过电流,则确定在传输线中发生故障,前提是主变压器中性点处的电流 已超过预设值。 在这种情况下,继续进行感应发电电动机的动作。 如果没有检测到过剩电流,则如果主变压器中性点处的电流没有超过预设值,则确定在感应发电机 - 电动机的次级电路中已经发生故障。 在这种情况下,感应电动机的动作停止。