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    • 91. 发明授权
    • Apparatus for log data collection and analysis
    • 日志数据收集和分析的设备
    • US5819094A
    • 1998-10-06
    • US715401
    • 1996-09-18
    • Yuji SatoNorihisa Murayama
    • Yuji SatoNorihisa Murayama
    • G06F11/32G06F11/34G06F9/45
    • G06F11/323G06F11/3466G06F2201/865
    • An apparatus for log data collection and analysis, which provides a history diagram to visualize program behavior and enhanced tools for analysis by utilizing part-to-part association between the history diagram and a source program. A log data collector collects log records during program execution and stores them in a storage unit. A log data analyzer retrieves and analyzes the records to find the types of program operations and their respective execution time. A diagram generator converts the result of the analysis into a history diagram and outputs it to a display unit. The apparatus further comprises an on-screen position designator and program location analyzer. When a user selects a part of the history diagram, the on-screen position designator obtains its coordinate. The program position analyzer analyzes the coordinate to find a corresponding function and its location in the source program, thus allowing the user to get a function name and line number by simply specifying a part of the history diagram. Moreover, the apparatus comprises a function designator and display position analyzer. When the user specifies a function name and its line number through the function designator, the display position analyzer calculates a corresponding position in the history diagram. Thus, the user can easily locate records of a function of interest in the history diagram.
    • 用于日志数据收集和分析的装置,其提供历史图以便可视化程序行为和增强的用于分析的工具,通过利用历史图和源程序之间的部分到部分的关联。 日志数据收集器在程序执行期间收集日志记录并将它们存储在存储单元中。 日志数据分析器检索和分析记录以查找程序操作的类型及其各自的执行时间。 图表生成器将分析结果转换为历史图表,并将其输出到显示单元。 该装置还包括屏幕上的位置指示符和程序位置分析器。 当用户选择历史图的一部分时,屏幕上的位置指示符获得其坐标。 程序位置分析器分析坐标以在源程序中找到相应的功能及其位置,从而允许用户通过简单地指定历史图的一部分来获取功能名称和行​​号。 此外,该装置包括功能指示器和显示位置分析器。 当用户通过功能指示符指定功能名称及其行号时,显示位置分析仪计算历史图中的相应位置。 因此,用户可以容易地定位历史图中感兴趣的功能的记录。
    • 92. 发明授权
    • Sample evaluation/process observation system and method
    • 样本评估/过程观察系统和方法
    • US5783830A
    • 1998-07-21
    • US873788
    • 1997-06-12
    • Hiroshi HiroseHidemi KoikeShigeto IsakozawaYuji SatoMikio IchihashiMotohide Ukiana
    • Hiroshi HiroseHidemi KoikeShigeto IsakozawaYuji SatoMikio IchihashiMotohide Ukiana
    • H01J37/305H01J37/20
    • H01J37/3056H01J37/265H01J2237/20H01J2237/26
    • A sample evaluation/process observation system includes a common sample stage which accommodates a plurality of samples to be processed. The common sample stage is provided with a processing/observing notch and also with a movement mechanism. The movement mechanism functions to sequentially move the plurality of samples to the notch to cause the samples to be exposed to a predetermined processing beam and observing beam. The system further includes a beam processing device in which the common sample stage can be mounted and which functions to irradiate the predetermined processing beam on the plurality of samples through the notch to thereby sequentially perform beam processing operation over the samples. The system further includes a beam observation device in which the common sample stage can be mounted and which functions to irradiate the predetermined observing beam on the plurality of samples through the notch to sequentially observe and evaluate shapes of the plurality of samples. A mark is formed on one sample by a focused ion beam device so that positioning of the mark realizes automatic processing of a part of the sample to be processed. Further, the common sample stage is used in a high-acceleration transmission electron microscope and a high-acceleration scanning electron microscope and focused ion beam device.
    • 样本评估/过程观察系统包括容纳多个待处理样本的公共样本阶段。 公共样品台具有处理/观察凹口,并且还具有移动机构。 移动机构用于将多个样本顺序地移动到凹口,以使样本暴露于预定的处理束和观察波束。 该系统还包括其中可以安装公共样本台的束处理装置,并且其功能是通过凹口对多个采样上的预定处理光束照射,从而顺序地对采样进行光束处理操作。 该系统还包括其中可以安装公共样品台的束观察装置,并且其功能是通过凹口将多个样品上的预定观察光束照射,以依次观察和评估多个样品的形状。 通过聚焦离子束装置在一个样品上形成标记,使得标记的定位实现待处理样品的一部分的自动处理。 此外,普通样品台用于高加速度透射电子显微镜和高加速度扫描电子显微镜和聚焦离子束装置。