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    • 95. 发明申请
    • SCAN FLIP-FLOP DEVICE
    • 扫描FLIP-FLOP设备
    • US20090300448A1
    • 2009-12-03
    • US12466600
    • 2009-05-15
    • Yoshihiro TomitaYukinori Uchino
    • Yoshihiro TomitaYukinori Uchino
    • G01R31/3177G06F11/25
    • G01R31/318541
    • A scan flip-flop device has a scan flip-flop, a Nch insulated gate field effect transistor and a Pch insulated gate field effect transistor. The Nch insulated gate field effect transistor is located on an output side the scan flip-flop. The Nch insulated gate field effect transistor turns off and dose not output a signal when a test enable signal is in a disable mode. The Pch insulated gate field effect transistor is located between a higher voltage source and an output side of the Nch insulated gate field effect transistor. The Pch insulated gate field effect transistor turns on when a test enable signal is in a disable mode. The Pch insulated gate field effect transistor sets a SO port at a high level voltage.
    • 扫描触发器装置具有扫描触发器,Nch绝缘栅场效应晶体管和Pch绝缘栅场效应晶体管。 Nch绝缘栅场效应晶体管位于扫描触发器的输出侧。 当测试使能信号处于禁用模式时,Nch绝缘栅场效应晶体管截止并且不输出信号。 Pch绝缘栅场效应晶体管位于Nch绝缘栅场效应晶体管的较高电压源和输出侧之间。 当测试使能信号处于禁止模式时,Pch绝缘栅场效应晶体管导通。 Pch绝缘栅场效应晶体管将SO端口设置在高电平电压。