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1. 发明授权

US11945098B2 Friction-based tactile sensor for measuring grip security 有权
公开(公告)号：US11945098B2
公开(公告)日：2024-04-02
申请号：US16638882
申请日：2018-08-14
申请人： Contactile Pty Ltd
发明人： Stephen James Redmond , Heba Khamis , Benjamin Xia
IPC分类号： B25J13/08 , A41D19/015 , A61B5/22 , G01L5/16 , G01L5/166 , G01L5/22 , G01N19/02
CPC分类号： B25J13/083 , A41D19/01541 , A61B5/225 , G01L5/16 , G01L5/226 , G01N19/02 , G01L5/166
摘要： A system for assessing grip security, the system comprising: a contact surface having at least a first contact surface region and a second contact surface region, the first contact surface region being configured to resist slip less than the second contact surface region, a sensor for detecting slip in the first contact region.

2. 发明公开

US20240009857A1 INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM 审中-公开
公开(公告)号：US20240009857A1
公开(公告)日：2024-01-11
申请号：US18005856
申请日：2021-08-06
申请人： Sony Group Corporation
发明人： Satoko NAGAKARI
IPC分类号： B25J13/08 , B25J9/16
CPC分类号： B25J13/083 , B25J9/1612
摘要： An information processing device according to one aspect of the present technology detects a slip generated in an object being gripped by a finger portion constituting a grip portion, and estimates an external force and an external moment applied to the object on the basis of the slip generated in the object. In addition, the information processing device controls the operation of an arm portion on the basis of the estimated external force and external moment to adjust at least one of the position or the posture of the finger portion constituting the grip portion provided in the arm portion. The present technology can be applied to a control device of a robot hand.

3. 发明申请

US20180264660A1 SYSTEMS, DEVICES, ARTICLES, AND METHODS FOR PREHENSION 审中-公开
公开(公告)号：US20180264660A1
公开(公告)日：2018-09-20
申请号：US15912932
申请日：2018-03-06
申请人： Kindred Systems Inc.
发明人： Nicolas Normand Bergeron , Thomas John Hummel
IPC分类号： B25J15/08 , B25J9/04 , B25J9/10 , B25J9/16 , B25J13/08 , B25J15/00 , B25J15/02 , B25J15/06
CPC分类号： B25J15/08 , B25J9/046 , B25J9/1045 , B25J9/1075 , B25J9/1607 , B25J9/1612 , B25J9/1669 , B25J9/1694 , B25J13/083 , B25J13/084 , B25J13/088 , B25J15/0009 , B25J15/008 , B25J15/0085 , B25J15/024 , B25J15/0616 , G01L5/228 , G05B2219/39505 , G05B2219/39543 , G05B2219/40564 , G06F17/12 , G06F17/16
摘要： An end-effector may include a base, a plurality of underactuated fingers coupled to the base; and an adhesion gripper coupled to the base. An end-effector may include a base, an actuator, a first underactuated finger comprising a proximal link and a distal link, the proximal link including a distal end, a guide for a first tendon spaced a first distance away from the distal end of the proximal link and the distal link including a lever arm disposed on a proximal side to the distal pad and which extends in a volar direction from a first axis, and a node disposed on the lever arm sized and shaped to receive a first tendon. The end-effector may include a first revolute joint compliant in a first direction disposed between the base and the proximal link; and a second revolute joint compliant in the first direction disposed between the proximal link and the distal link.

4. 发明授权

US09434071B2 Wafer handling traction control system 有权
公开(公告)号：US09434071B2
公开(公告)日：2016-09-06
申请号：US14864713
申请日：2015-09-24
申请人： Lam Research Corporation
发明人： Matthew J. Rodnick
IPC分类号： G06F7/00 , G06F19/00 , B25J9/16 , H01L21/687 , H01L21/67 , H01L21/66 , B25J13/08 , B25J11/00
CPC分类号： B25J9/1612 , B25J9/1656 , B25J9/1694 , B25J11/0095 , B25J13/083 , G05B2219/39057 , G05B2219/40567 , G05B2219/45031 , H01L21/67259 , H01L21/68707 , H01L22/26 , Y10S901/09 , Y10S901/47
摘要： A wafer handling traction control system is provided that is able to detect slippage of a semiconductor wafer with respect to an end effector and is able to adjust the end effector's movement in order to minimize further slippage. Upon the detection of relative motion of the semiconductor wafer with respect to the end effector past a threshold amount, the end effector's movements are adjusted to minimize slippage of the semiconductor wafer. The wafer handling traction control system may include a sensor that detects relative motion between the semiconductor wafer and the end effector.

5. 发明申请

US20160023353A1 WAFER HANDLING TRACTION CONTROL SYSTEM 审中-公开
公开(公告)号：US20160023353A1
公开(公告)日：2016-01-28
申请号：US14864713
申请日：2015-09-24
申请人： Lam Research Corporation
发明人： Matthew J. Rodnick
IPC分类号： B25J9/16 , H01L21/67 , H01L21/687
CPC分类号： B25J9/1612 , B25J9/1656 , B25J9/1694 , B25J11/0095 , B25J13/083 , G05B2219/39057 , G05B2219/40567 , G05B2219/45031 , H01L21/67259 , H01L21/68707 , H01L22/26 , Y10S901/09 , Y10S901/47
摘要： A wafer handling traction control system is provided that is able to detect slippage of a semiconductor wafer with respect to an end effector and is able to adjust the end effector's movement in order to minimize further slippage. Upon the detection of relative motion of the semiconductor wafer with respect to the end effector past a threshold amount, the end effector's movements are adjusted to minimize slippage of the semiconductor wafer. The wafer handling traction control system may include a sensor that detects relative motion between the semiconductor wafer and the end effector.

6. 发明申请

US20140174204A1 CAPACITIVE SHEAR FORCE SENSOR AND METHOD FOR FABRICATING THEREOF 有权
标题翻译：电力剪切力传感器及其制造方法
公开(公告)号：US20140174204A1
公开(公告)日：2014-06-26
申请号：US13896333
申请日：2013-05-17
申请人： Industrial Technology Research Institute
发明人： Sheng-Jui Chen , Gwo-Jen Wu , Chung-Lin Wu , Jian-Lin Huang
IPC分类号： G01L1/14
CPC分类号： G01L1/142 , B25J13/083 , G01L5/226
摘要： A capacitive shear force sensor and a method for fabricating thereof are provided. The capacitive shear force sensor includes a first electric field shielding layer, a second electric field shielding layer, a driving electrode, a first sensing electrode, a second sensing electrode and a dielectric layer. The second electric field shielding layer is disposed under the first electric field shielding layer. The driving electrode is disposed between the first electric field shielding layer and the second electric field shielding layer. The first and the second sensing electrodes are disposed between the driving electrode and the second electric field shielding layer. The dielectric layer is disposed between the driving electrode and the first sensing electrode, and between the driving electrode and the second sensing electrode. The first sensing electrode and the driving electrode form a first capacitor. The second sensing electrode and the driving electrode form a second capacitor.
摘要翻译：提供了一种电容式剪切力传感器及其制造方法。电容式剪切力传感器包括第一电场屏蔽层，第二电场屏蔽层，驱动电极，第一感测电极，第二感测电极和电介质层。第二电场屏蔽层设置在第一电场屏蔽层的下方。驱动电极设置在第一电场屏蔽层和第二电场屏蔽层之间。第一和第二感测电极设置在驱动电极和第二电场屏蔽层之间。电介质层设置在驱动电极和第一感测电极之间以及驱动电极和第二感测电极之间。第一感测电极和驱动电极形成第一电容器。第二感测电极和驱动电极形成第二电容器。

7. 发明授权

US08401825B2 Methods and systems for data processing and their applications 有权
标题翻译：数据处理方法和系统及其应用
公开(公告)号：US08401825B2
公开(公告)日：2013-03-19
申请号：US12675650
申请日：2008-08-28
申请人： Luca Ascari , Ulisse Bertocchi , Paolo Corradi , Cecilia Laschi , Paolo Dario , Jonas Ambeck-Madsen , Hiromichi Yanagihara
发明人： Luca Ascari , Ulisse Bertocchi , Paolo Corradi , Cecilia Laschi , Paolo Dario , Jonas Ambeck-Madsen , Hiromichi Yanagihara
IPC分类号： G06F11/00
CPC分类号： B25J13/083 , B25J9/1612 , G05B2219/39505
摘要： A method (400) of processing signal outputs of a plurality of topologically distinct sensors in response to stimuli is described. The method comprises obtaining (402) a plurality of temporal sensor outputs in parallel. Thereafter, features are extracted (406), the features having dynamic behavior pattern. The extraction is performed in a topology consistent way by arithmetic processing in parallel of neighboring temporal sensor outputs. Furthermore, a quality of the extracted features is being determined.
摘要翻译：描述了响应于刺激处理多个拓扑不同的传感器的信号输出的方法（400）。该方法包括并行地获得（402）多个时间传感器输出。此后，提取特征（406），特征具有动态行为模式。通过相邻时间传感器输出并行的算术处理，以拓扑一致的方式执行提取。此外，正在确定提取的特征的质量。

8. 发明申请

US20120096952A1 DETECTION DEVICE, ELECTRONIC APPARATUS, AND ROBOT 有权
标题翻译：检测装置，电子装置和机器人
公开(公告)号：US20120096952A1
公开(公告)日：2012-04-26
申请号：US13240244
申请日：2011-09-22
申请人： Takahiro AMANO , Tomo IKEBE
发明人： Takahiro AMANO , Tomo IKEBE
IPC分类号： G01L1/04
CPC分类号： G01L1/04 , B25J13/083 , G01L1/02 , G01L1/205 , G01L5/009 , G06F3/0414
摘要： A first substrate that includes pressure sensors which are disposed in plural around a reference point; an approximately hemispherical elastic protrusion that is positioned so that the center of the elastic protrusion is approximately disposed in a position which is overlapped with the reference point, and is elastically deformed by an external force; and a second substrate that is separated from the elastic protrusion and installed on a side which is opposite to the first substrate are provided. When the external force is applied, a predetermined calculation is performed by using a pressure value which is detected through each pressure sensor, and the direction and the intensity of the applied external force are obtained.
摘要翻译：第一基板，其包括在参考点周围多个设置的压力传感器; 大致半球状的弹性突起被定位成使得弹性突起的中心大致设置在与基准点重叠的位置，并且通过外力弹性变形; 并且设置与弹性突起分离并安装在与第一基板相对的一侧的第二基板。当施加外力时，通过使用通过每个压力传感器检测的压力值来执行预定的计算，并且获得所施加的外力的方向和强度。

9. 发明授权

US5417464A Slip-correcting load-clamping system 失效
标题翻译：滑移校正负载夹紧系统
公开(公告)号：US5417464A
公开(公告)日：1995-05-23
申请号：US178121
申请日：1994-01-06
申请人： Richard D. Seaberg , Jeffrey R. Skinner
发明人： Richard D. Seaberg , Jeffrey R. Skinner
IPC分类号： B66F9/22 , B25J13/08 , B66F9/18 , B66F9/24 , B66C1/42 , B25J19/02
CPC分类号： B25J13/083 , B66F9/184 , Y10S294/907
摘要： A load is gripped between a pair of load-engaging surfaces while the magnitude of any slippage between the load and the surfaces is variably sensed. A slip-correcting system variably predetermines an increase in the grip sufficient at least to decelerate the sensed magnitude of slippage, and the grip is automatically variably increased accordingly. Preferably, the magnitude of slippage sensed is a magnitude of relative movement between the load and the load-engaging surfaces, and preferably the magnitude of relative movement is a time-based magnitude such acceleration. The predetermined increase in the grip resulting from the sensed magnitude of slippage is preferably a predetermined increase in the proximity of the load-engaging surfaces, rather than any particular increase in the gripping force applied by the surfaces. A preferred fluid-powered embodiment of the clamp apparatus is disclosed for use on lift trucks in handling paper rolls and the like.
摘要翻译：负载被夹在一对负载接合表面之间，而负载和表面之间的任何滑动的大小被可变地感测。滑移校正系统可变地预先确定至少足以减小感测到的滑动大小的把手的增加，并且把手自动可变地相应增加。优选地，感测到的滑动的大小是负载和负载接合表面之间的相对运动的大小，并且优选地，相对运动的大小是基于时间的幅度这样的加速度。由感测的滑动幅度产生的夹持力的预定增加优选地是在承载接合表面附近的预定增加量，而不是由表面施加的夹紧力的任何特别增加。公开了用于在搬运纸卷等中的起重车上使用的夹紧装置的优选流体动力实施例。

10. 发明授权

US4621331A Control system for grasping force of a manipulator for grasping objects 失效
标题翻译：用于抓握物体的操纵器的抓握力的控制系统
公开(公告)号：US4621331A
公开(公告)日：1986-11-04
申请号：US566396
申请日：1983-12-28
申请人： Kazuhide Iwata
发明人： Kazuhide Iwata
IPC分类号： B25J9/16 , B25J9/18 , B25J13/08 , B25J15/00 , B25J15/02 , B66C1/00
CPC分类号： B25J13/083 , Y10S294/907
摘要： A manipulator having a grasping mechanism for grasping an object and an arm mechanism for lifting the grasped object, is disclosed. A weight detector is provided which detects a force that the top of the arm mechanism receives in the gravitational direction when the grasped object is being lifted. In order to find the minimum grasping force sufficient to lift the object, a grasp detector is provided for detecting, from the output of the weight detector, that the object cannot be lifted up with the present grasping force and a desired grasping force selector for selecting successively a desired value of grasping force starting from a predetermined minimum desired value until it is detected that the object is lifted. A grasping force control circuit controls the grasping force to the selected desired value.
摘要翻译：公开了一种具有用于抓握物体的把持机构和用于提起被抓物体的臂机构的操纵器。提供了一种重量检测器，其检测当所抓握的物体被提起时臂机构的顶部在重力方向上接收的力。为了找到足以抬起物体的最小抓取力，提供了抓握检测器，用于从重量检测器的输出检测物体不能用当前的抓握力提升，并且用于选择所需的抓取力选择器连续地从预定的最小期望值开始到检测到物体被提升之前的把持力的期望值。把持力控制电路将把持力控制到所选择的期望值。

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