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    • 2. 发明授权
    • Sub wavelength aperture
    • 子波长孔径
    • US08039818B2
    • 2011-10-18
    • US12519800
    • 2007-12-18
    • Maarten M. J. W. Van HerpenDerk J. W. Klunder
    • Maarten M. J. W. Van HerpenDerk J. W. Klunder
    • G01N21/64
    • G01N21/64G01N21/6445
    • There is provided a method of detecting a presence of a luminophore in a detection volume comprising providing excitation radiation in said detection volume. A luminophore is provided in said detection volume being excitable by said excitation radiation. The luminescent radiation is detected to identify the presence of said luminophore in said detection volume. In one aspect of the invention, said luminophore is selected to emit luminescent radiation having a wavelength in said medium that is larger than twice said smallest dimension; and wherein said luminophore is selected to be excitable by excitation radiation having a wavelength in said medium that is smaller than twice said smallest dimension. Accordingly, luminescent radiation is blocked from entering the detector but for the portion present on an interface of the aperture.
    • 提供了一种检测检测体积中的发光体的存在的方法,包括在所述检测体积中提供激发辐射。 在所述检测体积中提供发光体,所述发光体可被所述激发辐射激发。 检测发光辐射以识别所述检测体积中所述发光体的存在。 在本发明的一个方面,所述发光体选择为发射具有大于所述最小尺寸的两倍的所述介质中的波长的发光辐射; 并且其中所述发光体被选择为通过所述介质中具有小于所述最小尺寸的两倍的波长的激发辐射来激发。 因此,阻挡发光辐射进入检测器,但是阻挡存在于孔的界面上的部分。
    • 3. 发明授权
    • Microelectronic sensor device
    • 微电子传感器装置
    • US08158398B2
    • 2012-04-17
    • US12810022
    • 2008-12-18
    • Derk J. W. Klunder
    • Derk J. W. Klunder
    • G01N21/31G01N21/64G02B27/56
    • G01N21/553G01N21/648
    • An optical device provides evanescent radiation, in response to incident radiation, in a detection volume for containing a target component in a medium. The detection volume has at least one in-plane dimension (W1) smaller than a diffraction limit. The diffraction limit is defined by the radiation wavelength and the medium. The evanescent radiation is provided by aperture defining structures having a smallest in plane aperture dimension (W1) smaller than the diffraction limit. The detection volume is provided between the aperture defining structures. The aperture defining structures further define a largest in plane aperture dimension (W2). The largest in plane aperture dimension is larger than the diffraction limit. A source is provided for emitting a beam of radiation having a wavelength incident at the optical device and having a direction of incidence non parallel to an out of plane normal direction, for providing the evanescent radiation in the detection volume, in response to the radiation incident at the optical device. The plane of incidence may be parallel to the largest in plane aperture dimension.
    • 光学装置响应于入射辐射,在用于在介质中容纳目标成分的检测体积中提供ev逝辐射。 检测体积具有小于衍射极限的至少一个面内尺寸(W1)。 衍射极限由辐射波长和介质决定。 ev逝辐射由具有小于衍射极限的最小平面孔径尺寸(W1)的孔限定结构提供。 检测体积设置在孔限定结构之间。 孔限定结构还限定最大的平面孔径尺寸(W2)。 平面孔径尺寸最大,大于衍射极限。 提供源,用于发射具有入射在光学装置处的波长并具有不平行于平面外法线方向的入射方向的辐射束,用于响应于辐射入射而提供检测体积中的ev逝辐射 在光学装置。 入射平面可以平行于最大的平面孔径尺寸。