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    • 2. 发明授权
    • Method of pattern formation
    • 图案形成方法
    • US4434224A
    • 1984-02-28
    • US343908
    • 1982-01-29
    • Akira YoshikawaAkitsu TakedaOsamu OchiTomoko HisakiYoshihiko Mizushima
    • Akira YoshikawaAkitsu TakedaOsamu OchiTomoko HisakiYoshihiko Mizushima
    • H01L21/306G03F7/00H01L21/027H01L21/266H01L21/302H01L21/3065H01L21/314G03C5/00
    • H01L21/314G03F7/0035H01L21/0271H01L21/266H01L21/302
    • In a method of pattern formation according to this invention, an organic polymer resist material is simultaneously used with an inorganic resist material, i.e., a first desired pattern consisting of the organic polymer resist material layer is formed on a substrate material, then the whole surface thereof is covered with the inorganic resist material layer, a second desired pattern is then formed with the inorganic resist material layer, and then the resulting second desired pattern is transferred to the organic polymer resist material. According to the invention, mask alignment can automatically be effected by detecting reflected light from an alignment mark on the substrate, formation of a relief including large and small patterns is also easily carried out, throughput can also be increased. The method of the invention may be combined with various process steps, so that such combined method is applicable for deep and shallow etching, formation of an interlayer insulation film, and lift-off method.
    • 在根据本发明的图案形成方法中,有机聚合物抗蚀剂材料与无机抗蚀剂材料同时使用,即,由有机聚合物抗蚀剂材料层组成的第一所需图案形成在基底材料上,然后整个表面 用无机抗蚀剂材料层覆盖,然后用无机抗蚀剂材料层形成第二所需图案,然后将得到的第二所需图案转印到有机聚合物抗蚀剂材料上。 根据本发明,通过检测来自基板上的对准标记的反射光可以自动实现掩模对准,也容易进行包括大小图案的浮雕的形成,也可以提高生产量。 本发明的方法可以与各种工艺步骤组合,使得这种组合方法适用于深浅蚀刻,层间绝缘膜的形成和剥离方法。
    • 3. 发明授权
    • Doping from a photoresist layer
    • 从光致抗蚀剂层掺杂
    • US4350541A
    • 1982-09-21
    • US174275
    • 1980-07-31
    • Yoshihiko MizushimaAkitsu TakedaAkira YoshikawaOsamu OchiTomoko Hisaki
    • Yoshihiko MizushimaAkitsu TakedaAkira YoshikawaOsamu OchiTomoko Hisaki
    • G03F7/004H01L21/314H01L21/225
    • H01L21/314G03F7/0044Y10S438/93
    • A method for fabricating semiconductor devices comprising the steps of: forming on the main surface of a semiconductor substrate an inorganic photoresist layer having a first amorphous layer, which contains Se as a matrix component and includes an impurity for providing one conductivity type and a second silver, or a silver containing layer, formed on the first layer; exposing the inorganic photoresist layer with an exposure pattern; developing the exposed inorganic photoresist layer to form a patterned impurity containing inorganic photoresist layer as an impurity source layer; forming a heat resistive overcoating layer on the main surface of the semiconductor substrate, while covering the impurity source layer; and forming a doped region by diffusing impurity from the impurity source layer into a region of the substrate underlying the impurity source layer. The heat resistive overcoating layer may be an insulation layer having a window through which a conductive layer is connected to the doped region and is extended over the overcoating layer. The doped region is formed readily and accurately with relatively few process steps and with a pattern corresponding to an exposure pattern for the inorganic photoresist layer. The diffusion of the impurity from the impurity source layer into the substrate is accurately controlled so as to provide the doped region with a desired impurity concentration. Moreover, the evaporation of the impurity into the atmosphere during processing is minimized.
    • 一种制造半导体器件的方法,包括以下步骤:在半导体衬底的主表面上形成具有第一非晶层的无机光致抗蚀剂层,所述第一非晶层包含Se作为基质成分并且包括用于提供一种导电类型的杂质和第二银 或含银层,形成在第一层上; 以曝光图案曝光无机光致抗蚀剂层; 显影曝光的无机光致抗蚀剂层以形成含有无机光致抗蚀剂层作为杂质源层的图案化杂质; 在半导体衬底的主表面上形成耐热性外涂层,同时覆盖杂质源层; 以及通过将杂质从杂质源层扩散到位于杂质源层下面的衬底的区域中而形成掺杂区域。 耐热外涂层可以是具有窗口的绝缘层,导电层通过该窗口连接到掺杂区域并且在外涂层上延伸。 通过相对较少的工艺步骤并且具有对应于无机光致抗蚀剂层的曝光图案的图案容易且准确地形成掺杂区域。 将杂质从杂质源层扩散到衬底中被精确地控制,以便为掺杂区域提供所需的杂质浓度。 此外,在处理期间将杂质蒸发到大气中被最小化。
    • 8. 发明授权
    • Optical disk control device with focal point movement control
    • 具有焦点运动控制的光盘控制装置
    • US07480218B2
    • 2009-01-20
    • US10553616
    • 2004-04-16
    • Akira YoshikawaShin-ichi Yamada
    • Akira YoshikawaShin-ichi Yamada
    • G11B7/09
    • G11B7/08511G11B2007/0013
    • The present invention provides an optical disk control device that can perform focus pulling in a short time for a target information surface of an optical disk having a plurality of information surfaces. An objective lens (23) is moved toward an optical disk (1) having a plurality of information surfaces (1A, 1B) by the output signal of a driving signal generating circuit (42B), passage of an initial focused focal position is detected by a focal point passage detecting circuit (44), and when the objective lens moves past that position only a predetermined amount closer to the optical disk, an n-rotation delay circuit (70) outputs a reversal instruction f. After changing directions and moving the objective lens away from the optical disk, a focus pulling-in circuit (32B) switches a signal “a” that is output to an actuator driving circuit (21) from the output signal of the driving signal generating circuit to the output signal of the control circuit, activates a control circuit and performs focus pulling-in.
    • 本发明提供一种光盘控制装置,其可以在具有多个信息表面的光盘的目标信息表面上在短时间内执行聚焦拉动。 物镜(23)通过驱动信号发生电路(42B)的输出信号向具有多个信息表面(1A,1B)的光盘(1)移动,初始聚焦焦点位置的通过被 焦点通过检测电路(44),并且当物镜仅靠近光盘的预定量移动超过该位置时,n旋转延迟电路(70)输出反转指令f。 在改变方向并将物镜移动离开光盘之后,聚焦拉入电路(32B)从驱动信号发生电路的输出信号切换输出到致动器驱动电路(21)的信号“a” 到控制电路的输出信号,激活控制电路并进行聚焦拉入。
    • 10. 发明申请
    • Zno single crystal as super high speed scintillator...
    • Zno单晶作为超高速闪烁体
    • US20070193499A1
    • 2007-08-23
    • US11569350
    • 2005-05-20
    • Tsuguo FukudaAkira YoshikawaHiraku Ogino
    • Tsuguo FukudaAkira YoshikawaHiraku Ogino
    • H01L21/322
    • G21K4/00C09K11/565C09K11/595C09K11/623C09K11/642C09K11/662C09K11/7702C30B29/16C30B33/00
    • To find out a crystalline material for a high speed scintillator in place of BaF2 and the like, and a method for producing the material at a low cost. A single crystal of (Zn1−xMx)O1+x (M: Al, Ga, In, Y, Sc, La, Gd, Lu) (x=0 to 0.0500), (Zn1−xM′x)O1+2x(M′: Si, Ge, Sn, Pb)(x=0 to 0.0250) or (Zn1−xCdx)O (x=0 to 0.0500) is used as a scintillator. Defects of a ZnO single crystal can be reduced by using a platinum inner cylinder in order for a solution not to directly contact with an autoclave, for reducing impurities in the ZnO single crystal and precluding impurities interfering with scintillation, and by using LiOH and KOH as a mineralizer. ZnO can be doped with Al2O3, Ga2O3, In2O3, Si, Cd or the like by adding those materials to a starting material for the hydrothermal synthesis. The doping amounts can be controlled by changing charging amounts thereof. The doping of those elements inhibits the emission of visible lights, which results in the efficient transformation of the excitation energy to the luminescence from a free exciton.
    • 找出代替BaF 2等的高速闪烁体的结晶材料,以及低成本地制造材料的方法。 (Zn 1-x M x O)O 1 + x(M:Al,Ga,In,Y,Sc, La,Gd,Lu)(x = 0〜0.0500),(Zn 1-x M'x X)O 1 + 2x(M 使用Si,Ge,Sn,Pb)(x = 0〜0.0250)或(Zn 1-x S x x x)O(x = 0〜0.0500) 作为闪烁体。 可以通过使用铂内筒来降低ZnO单晶的缺陷,以使溶液不与高压釜直接接触,以减少ZnO单晶中的杂质并排除杂质干扰闪烁,并且通过使用LiOH和KOH作为 矿化剂 ZnO可以掺杂有Al 2 O 3,Ga 2 O 3 3,In 2 O 3, 通过将这些材料加入到用于水热合成的起始材料中,将其加入到Si 3 O 3,Si 3,Cd 3等中。 可以通过改变其充电量来控制掺杂量。 这些元素的掺杂抑制可见光的发射,这导致激发能量有效地从游离激子转变为发光。