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    • 7. 发明授权
    • Semiconductor device
    • 半导体器件
    • US07154179B2
    • 2006-12-26
    • US11129794
    • 2005-05-16
    • Kiyotaka TabuchiHideshi MiyajimaHideaki Masuda
    • Kiyotaka TabuchiHideshi MiyajimaHideaki Masuda
    • H01L23/48
    • H01L23/5222H01L23/53295H01L2924/0002H01L2924/00
    • A semiconductor device, wherein an increase of a capacity between wiring layers is suppressed, reliability of wiring and property of withstand voltage of a diffusion prevention insulation film can be improved and the wiring resistance can be maintained low, is provided by comprising an interlayer insulation film formed on a substrate, a wiring formed on a trench pattern formed on the interlayer insulation film, and a diffusion prevention insulation film formed on an upper surfaces of the interlayer insulation film including the wiring and preventing diffusion of metal from the wiring; wherein the diffusion prevention insulation film has a middle layer between a lowermost layer and an uppermost layer, wherein the lowermost layer is formed so as to contact the upper surfaces of the interlayer insulation layer including the wiring, the uppermost layer constitutes an uppermost portion of the diffusion prevention insulation film, and the middle layer has a lower relative dielectric constant than those of the lowermost layer and the uppermost layer.
    • 通过包括层间绝缘膜,能够提高布线层之间的容量增大的布线层的增加,布线的可靠性和扩散防止绝缘膜的耐电压性能得到提高,并且布线电阻可以维持较低 形成在基板上,形成在形成在层间绝缘膜上的沟槽图案上的布线以及形成在包括布线的层间绝缘膜的上表面上并防止金属从布线扩散的防扩散绝缘膜; 其中所述防扩散绝缘膜具有在最下层和最上层之间的中间层,其中所述最下层形成为与包括所述布线的所述层间绝缘层的上表面接触,所述最上层构成所述最上层 扩散防止绝缘膜,并且中间层具有比最下层和最上层更低的相对介电常数。
    • 9. 发明授权
    • Method for production of semiconductor devices
    • 制造半导体器件的方法
    • US07670941B2
    • 2010-03-02
    • US11465502
    • 2006-08-18
    • Koji KawanamiKiyotaka Tabuchi
    • Koji KawanamiKiyotaka Tabuchi
    • H01L21/00
    • H01L21/76877H01L21/02074H01L21/76825H01L21/76826H01L21/76828
    • A method for production of semiconductor devices which includes the steps of forming, on an interlayer insulating film formed on a substrate, a copper-containing conductive layer in such a way that its surface is exposed, performing heat treatment with a reducing gas composed mainly of hydrogen on the surface of the conductive layer, performing plasma treatment with a reducing gas on the surface of the conductive layer, thereby permitting the surface of the conductive layer to be reduced and the hydrogen adsorbed by the heat treatment to be released, and forming an oxidation resistance film that covers the surface of the conductive layer such that the surface of the conductive layer is not exposed to an oxygen-containing atmospheric gas after the plasma treatment.
    • 一种制造半导体器件的方法,包括以下步骤:在基板上形成的层间绝缘膜上形成含铜导电层,使其表面露出,用主要由 在导电层的表面上形成氢气,在导电层的表面进行还原性气体的等离子体处理,由此可以使导电层的表面降低,通过热处理吸附的氢被释放,形成 覆盖导电层的表面的氧化电阻膜,使得导电层的表面在等离子体处理后不暴露于含氧气氛气体。