专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US09991190B2 Packaging with interposer frame 有权
公开(公告)号：US09991190B2
公开(公告)日：2018-06-05
申请号：US13475674
申请日：2012-05-18
申请人： Hui-Min Huang , Yen-Chang Hu , Chih-Wei Lin , Ming-Da Cheng , Chung-Shi Liu , Chen-Shien Chen
发明人： Hui-Min Huang , Yen-Chang Hu , Chih-Wei Lin , Ming-Da Cheng , Chung-Shi Liu , Chen-Shien Chen
IPC分类号： H01L23/48 , H01L23/52 , H01L29/40 , H01L23/495 , H01L23/00 , H01L23/31 , H01L21/56 , H01L23/498 , H01L25/10
CPC分类号： H01L23/495 , H01L21/568 , H01L23/3107 , H01L23/3121 , H01L23/3128 , H01L23/49811 , H01L23/49827 , H01L24/19 , H01L25/105 , H01L2224/12105 , H01L2224/16225 , H01L2224/48091 , H01L2224/48247 , H01L2224/48257 , H01L2924/181 , H01L2924/00014 , H01L2924/00012
摘要： The mechanisms of using an interposer frame to package a semiconductor die enables fan-out structures and reduces form factor for the packaged semiconductor die. The mechanisms involve using a molding compound to attach the semiconductor die to the interposer frame and forming a redistribution layer on one or both sides of the semiconductor die. The redistribution layer(s) in the package enables fan-out connections and formation of external connection structures. Conductive columns in the interposer frame assist in thermal management.

2. 发明授权

US10192804B2 Bump-on-trace packaging structure and method for forming the same 有权
公开(公告)号：US10192804B2
公开(公告)日：2019-01-29
申请号：US13544783
申请日：2012-07-09
申请人： Meng-Tse Chen , Wei-Hung Lin , Chih-Wei Lin , Kuei-Wei Huang , Hui-Min Huang , Ming-Da Cheng , Chung-Shi Liu
发明人： Meng-Tse Chen , Wei-Hung Lin , Chih-Wei Lin , Kuei-Wei Huang , Hui-Min Huang , Ming-Da Cheng , Chung-Shi Liu
IPC分类号： H01L29/49 , H01L23/31 , H01L23/00 , H01L23/498
摘要： A device comprises a first package component, and a first metal trace and a second metal trace on a top surface of the first package component. The device further includes a dielectric mask layer covering the top surface of the first package component, the first metal trace and the second metal trace, wherein the dielectric mask layer has an opening therein exposing the first metal trace. The device also includes a second package component and an interconnect formed on the second package component, the interconnect having a metal bump and a solder bump formed on the metal bump, wherein the solder bump contacts the first metal trace in the opening of the dielectric mask layer.

3. 发明授权

US08603911B2 Semiconductor device and fabrication method thereof 有权
标题翻译：半导体器件及其制造方法
公开(公告)号：US08603911B2
公开(公告)日：2013-12-10
申请号：US13105338
申请日：2011-05-11
申请人： Hui-Min Huang , Chun-Tang Lin , Chien-Wei Lee , Yen-Ping Wang
发明人： Hui-Min Huang , Chun-Tang Lin , Chien-Wei Lee , Yen-Ping Wang
IPC分类号： H01L21/44 , H01L23/12 , H01L29/40
CPC分类号： H01L23/522 , H01L23/481 , H01L24/05 , H01L24/13 , H01L2224/02372 , H01L2224/0401 , H01L2224/05548 , H01L2224/0557 , H01L2224/05572 , H01L2224/13022 , H01L2224/131 , H01L2924/00014 , H01L2224/05552
摘要： A semiconductor structure includes a chip, a plurality of metal posts disposed in the chip and a buffer layer disposed on the chip. The chip includes a silicon-based layer having opposite first and second surfaces, and a build-up structure formed on the first surface of the silicon-based layer consisting of at least a metal layer and a low-k dielectric layer alternatively stacked on one another. Each of the metal posts is disposed in the silicon-based layer with one end thereof electrically connected with the metal layer while the other end is exposed from the second surface of the silicon-based layer. The buffer layer is disposed on the build-up structure. By positioning the low-k dielectric layer far from the second surface that is used for connecting to an external electronic component, the present invention reduces the overall thermal stress.
摘要翻译：半导体结构包括芯片，设置在芯片中的多个金属柱和设置在芯片上的缓冲层。该芯片包括具有相对的第一和第二表面的硅基层，以及形成在硅基层的第一表面上的堆积结构，该硅基层至少由至少一层金属层和低k电介质层组成，另一个。每个金属柱设置在硅基层中，其一端与金属层电连接，而另一端从硅基层的第二表面露出。缓冲层设置在积聚结构上。通过将低k电介质层定位成远离用于连接到外部电子部件的第二表面，本发明降低了总的热应力。

4. 发明授权

US08564343B2 Device of phase locked-loop and the method using the same 有权
标题翻译：锁相环装置及其使用方法
公开(公告)号：US08564343B2
公开(公告)日：2013-10-22
申请号：US13422772
申请日：2012-03-16
申请人： Hui-Min Huang
发明人： Hui-Min Huang
IPC分类号： H03L7/06
CPC分类号： H03L7/10 , H03L7/0891
摘要： Nowadays, electronic product designs are aimed at saving, due to the trend to reduce energy consumption and carbon output. Ethernet technology has also been aimed specifically at saving energy; IEEE P802.3az standard (Energy Efficient Ethernet, EEE), for Ethernet released by Broadcom is one example. The disclosure turns off the phase-locked loop when the network communication stops, effectively saving the energy consumption of the network chip under the EEE standard. In the case of network reconnection, the disclosure turns on the phase-locked loop to start the network communication through adjusting the current of current source and the parameters of a low pass filter to increase the charging speed for the reference voltage generation of the low pass filter. The disclosure then shortens the start-up time to quickly output the standard output frequency and phase of the phase-locked loop.
摘要翻译：目前，电子产品设计的目的是为了节约能源，因为降低能耗和碳输出的趋势。以太网技术也专门用于节约能源; Broadcom发布的以太网发布的IEEE P802.3az标准（Energy Efficient Ethernet，EEE）就是一个例子。当网络通信停止时，本公开将关闭锁相环，有效地节省了EEE标准下网络芯片的能耗。在网络重新连接的情况下，本公开通过调节电流源的电流和低通滤波器的参数来开启锁相环以开始网络通信，以增加用于低通的参考电压产生的充电速度过滤。该公开然后缩短启动时间以快速输出锁相环的标准输出频率和相位。

5. 发明申请

US20130260535A1 METHOD AND APPARATUS FOR REDUCING PACKAGE WARPAGE 有权
标题翻译：减少包装件的方法和装置
公开(公告)号：US20130260535A1
公开(公告)日：2013-10-03
申请号：US13476340
申请日：2012-05-21
申请人： Meng-Tse CHEN , Hui-Min HUANG , Chun-Cheng LIN , Chih-Chun CHIU , Ming-Da CHENG , Chung-Shi LIU
发明人： Meng-Tse CHEN , Hui-Min HUANG , Chun-Cheng LIN , Chih-Chun CHIU , Ming-Da CHENG , Chung-Shi LIU
IPC分类号： H01L21/78 , B29C53/16
CPC分类号： B29C53/18 , H01L21/561 , H01L21/565 , H01L21/566 , H01L23/295 , H01L23/3128 , H01L24/13 , H01L24/14 , H01L24/16 , H01L24/29 , H01L24/32 , H01L24/73 , H01L24/75 , H01L24/94 , H01L24/97 , H01L25/0657 , H01L25/105 , H01L25/50 , H01L2224/13147 , H01L2224/14181 , H01L2224/16145 , H01L2224/16225 , H01L2224/2929 , H01L2224/29387 , H01L2224/32145 , H01L2224/32225 , H01L2224/73204 , H01L2224/75315 , H01L2224/94 , H01L2224/97 , H01L2225/06513 , H01L2225/06541 , H01L2225/1023 , H01L2225/1058 , H01L2225/1088 , H01L2924/1305 , H01L2924/13091 , H01L2924/15311 , H01L2924/15331 , H01L2924/157 , H01L2924/15787 , H01L2924/15788 , H01L2924/1579 , H01L2924/181 , H01L2924/18161 , H01L2924/3511 , H01L2924/3512 , H01L2924/00012 , H01L2224/81 , H01L2924/00
摘要： Embodiments of mechanisms for flattening a packaged structure are provided. The mechanisms involve a flattening apparatus and the utilization of protection layer(s) between the packaged structure and the surface(s) of the flattening apparatus. The protection layer(s) is made of a soft and non-sticking material to allow protecting exposed fragile elements of the packaged structure and easy separation after processing. The embodiments of flattening process involve flattening the warped packaged structure by pressure under elevated processing temperature. Processing under elevated temperature allows the package structure to be flattened within a reasonable processing time.
摘要翻译：提供了用于使封装结构平坦化的机构的实施例。这些机构涉及压平装置以及在封装结构和平坦化装置的表面之间利用保护层。保护层由柔软和不粘的材料制成，以保护封装结构的暴露的易碎元件并且在加工之后易于分离。扁平化过程的实施例涉及在升高的加工温度下通过压力使翘曲的包装结构变平。在高温下进行处理可使包装结构在合理的处理时间内变平。

6. 发明申请

US20120235719A1 DEVICE OF PHASE LOCKED-LOOP AND THE METHOD USING THE SAME 有权
标题翻译：相位锁定装置和使用该锁相环的方法
公开(公告)号：US20120235719A1
公开(公告)日：2012-09-20
申请号：US13422772
申请日：2012-03-16
申请人： Hui-Min HUANG
发明人： Hui-Min HUANG
IPC分类号： H03L7/10
CPC分类号： H03L7/10 , H03L7/0891
摘要： Nowadays, electronic product designs are aimed at saving, due to the trend to reduce energy consumption and carbon output. Ethernet technology has also been aimed specifically at saving energy; IEEE P802.3az standard (Energy Efficient Ethernet, EEE), for Ethernet released by Broadcom is one example. The disclosure turns off the phase-locked loop when the network communication stops, effectively saving the energy consumption of the network chip under the EEE standard. In the case of network reconnection, the disclosure turns on the phase-locked loop to start the network communication through adjusting the current of current source and the parameters of a low pass filter to increase the charging speed for the reference voltage generation of the low pass filter. The disclosure then shortens the start-up time to quickly output the standard output frequency and phase of the phase-locked loop.
摘要翻译：目前，电子产品设计的目的是为了节约能源，因为降低能耗和碳输出的趋势。以太网技术也专门用于节约能源; Broadcom发布的以太网发布的IEEE P802.3az标准（Energy Efficient Ethernet，EEE）就是一个例子。当网络通信停止时，本公开将关闭锁相环，有效地节省了EEE标准下网络芯片的能耗。在网络重新连接的情况下，本公开通过调节电流源的电流和低通滤波器的参数来开启锁相环以开始网络通信，以增加用于低通的参考电压产生的充电速度过滤。该公开然后缩短启动时间以快速输出锁相环的标准输出频率和相位。

7. 发明授权

US09349663B2 Package-on-package structure having polymer-based material for warpage control 有权
标题翻译：包装封装结构，具有用于翘曲控制的聚合物基材料
公开(公告)号：US09349663B2
公开(公告)日：2016-05-24
申请号：US13539136
申请日：2012-06-29
申请人： Meng-Tse Chen , Yu-Chih Liu , Hui-Min Huang , Wei-Hung Lin , Jing Ruei Lu , Ming-Da Cheng , Chung-Shi Liu
发明人： Meng-Tse Chen , Yu-Chih Liu , Hui-Min Huang , Wei-Hung Lin , Jing Ruei Lu , Ming-Da Cheng , Chung-Shi Liu
IPC分类号： H01L23/48 , H01L23/52 , H01L29/40 , H01L23/00 , H01L23/31 , H01L21/56 , H01L25/065
CPC分类号： H01L25/0652 , H01L21/561 , H01L21/563 , H01L23/00 , H01L23/293 , H01L23/3121 , H01L23/562 , H01L24/17 , H01L25/0655 , H01L25/50 , H01L2224/16 , H01L2224/32225 , H01L2224/73204 , H01L2224/92125 , H01L2225/06513 , H01L2225/06517 , H01L2225/06555 , H01L2225/06582 , H01L2924/15311
摘要： A package on package structure providing mechanical strength and warpage control includes a first package component, a second package component, and a first set of conductive elements coupling the first package component to the second package component. A first polymer-comprising material is molded on the first package component and surrounds the first set of conductive elements. The first polymer-comprising material has an opening therein exposing a top surface of the second package component. A third package component and a second set of conductive elements couples the second package component to the third package component.
摘要翻译：提供机械强度和翘曲控制的封装结构的封装包括第一封装元件，第二封装元件和将第一封装元件连接到第二封装元件的第一组导电元件。第一含聚合物的材料被模制在第一包装部件上并包围第一组导电元件。第一含聚合物的材料在其中具有露出第二包装部件的顶表面的开口。第三包装部件和第二组导电元件将第二包装部件耦合到第三包装部件。

8. 发明授权

US08642445B2 Method and apparatus for reducing package warpage 有权
标题翻译：减少包装翘曲的方法和装置
公开(公告)号：US08642445B2
公开(公告)日：2014-02-04
申请号：US13476340
申请日：2012-05-21
申请人： Meng-Tse Chen , Hui-Min Huang , Chun-Cheng Lin , Chih-Chun Chiu , Ming-Da Cheng , Chung-Shi Liu
发明人： Meng-Tse Chen , Hui-Min Huang , Chun-Cheng Lin , Chih-Chun Chiu , Ming-Da Cheng , Chung-Shi Liu
IPC分类号： H01L21/301
CPC分类号： B29C53/18 , H01L21/561 , H01L21/565 , H01L21/566 , H01L23/295 , H01L23/3128 , H01L24/13 , H01L24/14 , H01L24/16 , H01L24/29 , H01L24/32 , H01L24/73 , H01L24/75 , H01L24/94 , H01L24/97 , H01L25/0657 , H01L25/105 , H01L25/50 , H01L2224/13147 , H01L2224/14181 , H01L2224/16145 , H01L2224/16225 , H01L2224/2929 , H01L2224/29387 , H01L2224/32145 , H01L2224/32225 , H01L2224/73204 , H01L2224/75315 , H01L2224/94 , H01L2224/97 , H01L2225/06513 , H01L2225/06541 , H01L2225/1023 , H01L2225/1058 , H01L2225/1088 , H01L2924/1305 , H01L2924/13091 , H01L2924/15311 , H01L2924/15331 , H01L2924/157 , H01L2924/15787 , H01L2924/15788 , H01L2924/1579 , H01L2924/181 , H01L2924/18161 , H01L2924/3511 , H01L2924/3512 , H01L2924/00012 , H01L2224/81 , H01L2924/00
摘要： Embodiments of mechanisms for flattening a packaged structure are provided. The mechanisms involve a flattening apparatus and the utilization of protection layer(s) between the packaged structure and the surface(s) of the flattening apparatus. The protection layer(s) is made of a soft and non-sticking material to allow protecting exposed fragile elements of the packaged structure and easy separation after processing. The embodiments of flattening process involve flattening the warped packaged structure by pressure under elevated processing temperature. Processing under elevated temperature allows the package structure to be flattened within a reasonable processing time.
摘要翻译：提供了用于使封装结构平坦化的机构的实施例。这些机构涉及压平装置以及在封装结构和平坦化装置的表面之间利用保护层。保护层由柔软和不粘的材料制成，以保护封装结构的暴露的易碎元件并且在加工之后易于分离。扁平化过程的实施例涉及在升高的加工温度下通过压力使翘曲的包装结构变平。在高温下进行处理可使包装结构在合理的处理时间内变平。

9. 发明申请

US20130309621A1 METHOD AND APPARATUS FOR ADJUSTING WAFER WARPAGE 有权
标题翻译：调整波纹的方法和装置
公开(公告)号：US20130309621A1
公开(公告)日：2013-11-21
申请号：US13475790
申请日：2012-05-18
申请人： Hui-Min HUANG , Chih-Wei LIN , Wen-Hsiung LU , Ming-Da CHENG , Chung-Shi LIU
发明人： Hui-Min HUANG , Chih-Wei LIN , Wen-Hsiung LU , Ming-Da CHENG , Chung-Shi LIU
IPC分类号： H01L21/687 , F27D19/00 , F27D5/00
CPC分类号： H01L21/67288 , H01L21/6838
摘要： A method for adjusting the warpage of a wafer, includes providing a wafer having a center portion and edge portions and providing a holding table having a holding area thereon for holding the wafer. The wafer is placed onto the holding table with the center portion higher than the edge portions and thereafter pressed onto the holding area such that the wafer is attracted to and held onto the holding table by self-suction force. The wafer is heated at a predetermined temperature and for a predetermined time in accordance with an amount of warpage of the wafer in order to achieve a substantially flat wafer or a predetermined wafer level.
摘要翻译：一种用于调整晶片翘曲的方法，包括提供具有中心部分和边缘部分的晶片，并提供其上具有用于保持晶片的保持区域的保持台。将晶片放置在保持台上，其中心部分高于边缘部分，然后按压到保持区域上，使得晶片通过自吸力被吸引并保持在保持台上。根据晶片的翘曲量将晶片在预定温度下加热预定时间，以便实现基本上平坦的晶片或预定的晶片级。

10. 发明申请

US20120223425A1 SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF 有权
标题翻译：半导体器件及其制造方法
公开(公告)号：US20120223425A1
公开(公告)日：2012-09-06
申请号：US13105338
申请日：2011-05-11
申请人： Hui-Min Huang , Chun-Tang Lin , Chien-Wei Lee , Yen-Ping Wang
发明人： Hui-Min Huang , Chun-Tang Lin , Chien-Wei Lee , Yen-Ping Wang
IPC分类号： H01L23/498 , H01L21/768
CPC分类号： H01L23/522 , H01L23/481 , H01L24/05 , H01L24/13 , H01L2224/02372 , H01L2224/0401 , H01L2224/05548 , H01L2224/0557 , H01L2224/05572 , H01L2224/13022 , H01L2224/131 , H01L2924/00014 , H01L2224/05552
摘要： A semiconductor structure includes a chip, a plurality of metal posts disposed in the chip and a buffer layer disposed on the chip. The chip includes a silicon-based layer having opposite first and second surfaces, and a build-up structure formed on the first surface of the silicon-based layer consisting of at least a metal layer and a low-k dielectric layer alternatively stacked on one another. Each of the metal posts is disposed in the silicon-based layer with one end thereof electrically connected with the metal layer while the other end is exposed from the second surface of the silicon-based layer. The buffer layer is disposed on the build-up structure. By positioning the low-k dielectric layer far from the second surface that is used for connecting to an external electronic component, the present invention reduces the overall thermal stress.
摘要翻译：半导体结构包括芯片，设置在芯片中的多个金属柱和设置在芯片上的缓冲层。该芯片包括具有相对的第一和第二表面的硅基层，以及形成在硅基层的第一表面上的堆积结构，该硅基层至少由至少一层金属层和低k电介质层组成，另一个。每个金属柱设置在硅基层中，其一端与金属层电连接，而另一端从硅基层的第二表面露出。缓冲层设置在积聚结构上。通过将低k电介质层定位成远离用于连接到外部电子部件的第二表面，本发明降低了总的热应力。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式