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    • 3. 发明公开
    • 비휘발성 메모리에 적용 가능한 터널링 트랜지스터
    • 隧道通道晶体管及其驱动方法
    • KR1020010051175A
    • 2001-06-25
    • KR1020000062099
    • 2000-10-21
    • 파나소닉 주식회사
    • 시마다야스히로하야시신이치로우치야마기요시다나카게이스케
    • H01L29/88
    • H01L29/6684H01L21/28291H01L29/772H01L29/78391
    • PURPOSE: To provide a non-volatile memory which can reflect one of two logical states on the channel current of a tunnel channel transistor and can arbitrarily rewrite the state into any one of the logical states. CONSTITUTION: By utilizing the fact that a depletion layer formed in a source region 3 to be overlapped with a ferrorelectric layer 6 depends on the polarization state of ferroelectric, when a positive bias is applied to a drain region 4 with respect to the source region 3 to inject electrons from the source region 3 into the drain region 4 via an insulator 5, reading of data depending on the number of electrons emitted from the source region 3 is reflected by the polarization state of the ferroelectric layer 6 under a gate electrode 7. Since the polarization state of the layer 6 is spontaneous, the polarization state can be held (stored) and discriminated (read out) by the channel current of the transistor.
    • 目的:提供可以反映隧道通道晶体管的通道电流上的两个逻辑状态之一的非易失性存储器,并且可以任意地将状态重写为任何一个逻辑状态。 构成:通过利用形成在源极区域3中以与铁电体层6重叠的耗尽层取决于铁电体的偏振态的事实,当相对于源极区域3向漏极区域4施加正偏压时 通过绝缘体5将电子从源极区域3注入漏极区域4,根据从源极区域3发射的电子数量的数据的读取被栅电极7下的铁电体层6的偏振状态反射。 由于层6的偏振状态是自发的,所以可以通过晶体管的沟道电流来保持(存储)和鉴别(读出)极化状态。
    • 7. 发明授权
    • 비선형 소자 및 쌍안정 메모리 장치
    • 비선형소자및쌍안정메모리장치
    • KR100389969B1
    • 2003-09-19
    • KR1019960017855
    • 1996-05-25
    • 파나소닉 주식회사
    • 우에노야마다케시구마부치야스히토
    • H01L29/88
    • H01L29/882H01L29/8616H01L45/10H01L45/1206H01L45/1233H01L45/145H01L45/165
    • An n-type diffusion layer (10), an insulating layer (11) and a first aluminum electrode (12) are formed on a p-type silicon substrate. Fe (divalent Fe) having a vacant orbit not filled with an electron is implanted into a region of the insulating layer to form an impurity atom layer (11a). A second aluminum electrode is formed which is in contact with the n-type diffusion layer. A voltage that increases the potential of the first aluminum electrode is applied between the first and second aluminum electrodes. The voltage is increased. In this situation, when the fermi level of the n-type diffusion layer and an impurity level which is the energy level for filling the vacant orbit of the Fe are matched, a resonance tunnelling current flows. Thereafter, when there is a change to the state of non-resonance state, a negative-resistance characteristic is exhibited in which the current decreases as the voltage is increased. Accordingly, the present invention is able to provide a low-power, low-voltage, fast nonlinear element that can well be incorporated into the integrated circuit, and a bistable memory device employing such an improved nonlinear element.
    • 在p型硅衬底上形成n型扩散层(10),绝缘层(11)和第一铝电极(12)。 的Fe< 2+; (2价Fe)注入绝缘层的区域,形成杂质原子层(11a)。 形成与n型扩散层接触的第二铝电极。 在第一和第二铝电极之间施加增加第一铝电极电位的电压。 电压升高。 在这种情况下,当n型扩散层的费米能级和作为填充Fe 2+离子空轨道的能级的杂质能级时, 匹配时,谐振隧穿电流流动。 之后,当非谐振状态的状态发生变化时,表现出电压随着电压增加而减小的负阻特性。 因此,本发明能够提供可以很好地结合到集成电路中的低功率,低电压,快速非线性元件,以及采用这种改进的非线性元件的双稳态存储器件。 <图像>