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    • 1. 发明公开
    • 플라스틱 두께 보정 방법
    • 校正塑料厚度的方法
    • KR1020140059593A
    • 2014-05-16
    • KR1020120126197
    • 2012-11-08
    • 주식회사 아이에스피
    • 박정권
    • G01B15/02G01N23/223
    • G01N23/223G01B15/02G01N33/44G01N2223/076G01N2223/623G01N2223/633
    • The present invention relates to a method for correcting the thickness of plastic, which can obtain an accurate measuring value in the event of a sample not having the same elementary composition or thickness as a standard specimen. The method for correcting the thickness of plastic comprises as follows: a step of radiating X-rays generated from tube voltage at 50 kVP to an object; a step of calculating the thickness of the object based on the intensity of the X-rays; a step of measuring the scattering amount of Compton of an inner filter, and generating a correction curve based on the measurement; and a step of correcting the thickness of the object according to the correction curve.
    • 本发明涉及一种用于校正塑料厚度的方法,其可以在样品不具有与标准样品相同的基本组成或厚度的情况下获得精确的测量值。 用于校正塑料厚度的方法包括以下步骤:将从50kVP的管电压产生的X射线照射到物体上; 基于X射线的强度来计算物体的厚度的步骤; 测量内部滤波器的康普顿的散射量并基于测量产生校正曲线的步骤; 以及根据校正曲线校正物体的厚度的步骤。