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    • 9. 发明公开
    • 접촉 돌기를 구비한 접촉 구조물
    • 接触结构
    • KR1020010076322A
    • 2001-08-11
    • KR1020010002780
    • 2001-01-18
    • 가부시키가이샤 어드밴티스트에디슨 웰딩 인스티튜트, 인코포레이티드
    • 코우리테어도어에이.프레츠팀
    • H01R12/00
    • G01R1/06772G01R1/06716G01R1/07342H01L2924/0002H01L2924/00
    • PURPOSE: A contact structure is provided to achieve an improved radio frequency bandwidth, increased number of pins and high contact performed, by arranging the contact structure electrically contacting a contact target. CONSTITUTION: A plurality of contactors(30) that are formed by a conductive lead(35) are provided, and each conductive lead composes a micro strip line by combining a ground surface(37) and a dielectric layer(36) while the conductive lead is in a flat shape, thus establishing a specific characteristic impedance. The tip part of the conductive lead is formed by a hard conductive material. Further, a support substrate for forming a communication path from the tip part to an area to the external element of the contact structure. When the contact structure is pressed against a substrate(300) to be tested, a contact spring force is generated by the bent part of the contactor, thus enabling a contact bump at the tip part of the conductive lead to exhibit rubbing and scraping effects.
    • 目的:通过将接触结构与接触目标电接触来提供接触结构以实现改进的射频带宽,增加的引脚数量和高接触性。 构成:提供由导电引线(35)形成的多个接触器(30),并且每个导电引线通过组合地表面(37)和介电层(36)构成微带线,同时导电引线 处于平坦的形状,从而建立特定的阻抗。 导电引线的尖端部分由硬质导电材料形成。 此外,用于形成从接头结构的顶部到外部元件的区域的连通路径的支撑基板。 当接触结构被压靠在待测试的基板(300)上时,接触器的弯曲部分产生接触弹簧力,从而使得导电引线的尖端处的接触凸块出现摩擦和刮擦效果。