专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明公开

KR1020080069647A 집적 회로와 그 테스트 방법 및 장치 无效
标题翻译：具有这种IC的测试布置和测试方法的模拟IC
公开(公告)号：KR1020080069647A
公开(公告)日：2008-07-28
申请号：KR1020087012501
申请日：2006-10-20
申请人： 엔엑스피 비 브이
发明人： 자조아미르 , 베르그벨드헨드릭제이 , 슈테르트로드게르에프 , 피네다드기베즈호세드예수
IPC分类号： G01R31/28
CPC分类号： G01R31/3167 , G01R31/31721 , G01R31/318536 , G01R31/318575
摘要： An integrated circuit (IC) comprises a plurality of analog stages (10a-c), each of the analog stages being conductively coupled to a power supply (20; 20a-c), and being conductively coupled to each other by a signal path (12); and a test arrangement for testing the plurality of analog stages, the test arrangement comprising input means such as an analog bus (40) coupled to a signal path input of each analog stage from the plurality of analog stages, output means such as a further analog bus (50) for communicating a test result to an output of the integrated circuit, switching means such as a plurality of switches (36) in the biasing infrastructure of the IC for selectively disabling an analog stage, and control means such a shift register (60) for controlling the switching means. Consequently, the analog stages of the IC can be tested and debugged in isolation without the need for switches in the signal path through the cores. A current sensor (70) may be present in the power supply to facilitate structural testing of the analog stages in isolation.
摘要翻译：集成电路（IC）包括多个模拟级（10a-c），每个模拟级与电源（20; 20a-c）导电耦合，并且通过信号路径彼此导电耦合 12）; 以及用于测试所述多个模拟级的测试装置，所述测试装置包括输入装置，例如耦合到来自所述多个模拟级的每个模拟级的信号路径输入的模拟总线（40），输出装置用于将测试结果传送到集成电路的输出的总线（50），用于选择性地禁用模拟级的IC的偏置基础设施中的多个开关（36）等开关装置，以及诸如移位寄存器 60），用于控制切换装置。因此，IC的模拟级可以隔离测试和调试，而不需要通过核心的信号路径中的开关。电流传感器（70）可以存在于电源中以便于隔离地对模拟级的结构测试。

IPRDB

热门服务

关于我们

友情链接

联系方式