专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明公开

KR1020080011088A 정전압 전원 회로 无效
标题翻译：恒定电源电路
公开(公告)号：KR1020080011088A
公开(公告)日：2008-01-31
申请号：KR1020070075091
申请日：2007-07-26
申请人： 가부시키가이샤 리코
发明人： 후지토히로시 , 히라노야스토시
IPC分类号： H02M3/155
摘要： A constant voltage power circuit is provided to reduce the noise of an output voltage by preventing the output voltage from dropping. A constant voltage power circuit includes a constant voltage circuit for heavy load(4), a constant voltage circuit for light load(6), a conversion unit, and an output unit. The constant voltage circuit for light load has a smaller maximum output current than the output current of the constant voltage circuit for heavy load. The conversion unit receives a control signal for operating one of the constant voltage circuit for heavy load and the constant voltage circuit for light load and operates one of the constant voltage circuit for heavy load and the constant voltage circuit for light load. The output unit outputs a constant voltage by the output from any one operating constant voltage circuit. The constant voltage circuit further includes a current detecting circuit(2) for detecting the output current from the output unit.
摘要翻译：提供恒压电源电路以通过防止输出电压下降来降低输出电压的噪声。恒压电源电路包括用于重负载的恒压电路（4），用于轻负载的恒压电路（6），转换单元和输出单元。用于轻负载的恒压电路具有比用于重负载的恒压电路的输出电流更小的最大输出电流。转换单元接收用于操作重负载的恒压电路和轻载的恒压电路中的一个的控制信号，并且操作用于重负载的恒压电路和用于轻负载的恒压电路之一。输出单元通过任何一个工作恒压电路的输出输出恒定电压。恒压电路还包括用于检测来自输出单元的输出电流的电流检测电路（2）。

2. 发明公开

KR1020080005096A 온도 검출 회로, 이 온도 검출 회로를 구비하는 반도체장치 및 온도 검출 방법 无效
标题翻译：温度检测器，具有该温度检测器的半导体器件和用于检测温度的方法
公开(公告)号：KR1020080005096A
公开(公告)日：2008-01-10
申请号：KR1020070067453
申请日：2007-07-05
申请人： 가부시키가이샤 리코
发明人： 히라노야스토시
IPC分类号： G01K7/00 , G11C7/04 , H01L21/66
CPC分类号： G01K1/026 , G01K3/005 , G01K1/022 , G01K2215/00
摘要： A temperature detector, a semiconductor device having the same and a method for detecting a temperature are provided to reduce chip area by restraining an increase of circuit size. A temperature detector includes a plurality of temperature sensors(MTD1,MTD2,STD1,STD2), a memory circuit unit, and a voltage comparison control circuit unit. The temperature sensors generate and output voltage signals corresponding to a temperature. The memory circuit unit memorizes and outputs a signal level of input signal according to a control signal. The memory circuit unit is installed corresponding to each temperature sensor. The voltage comparison control circuit unit selects anyone of the signals output from the temperature sensors and compares the selected output signal with a reference voltage. The voltage comparison control circuit unit successively memorizes the compared result in the memory circuit unit.
摘要翻译：提供温度检测器，具有该温度检测器的半导体器件和用于检测温度的方法以通过抑制电路尺寸的增加来减小芯片面积。温度检测器包括多个温度传感器（MTD1，MTD2，STD1，STD2），存储器电路单元和电压比较控制电路单元。温度传感器产生并输出与温度对应的电压信号。存储电路单元根据控制信号存储并输出输入信号的信号电平。对应于每个温度传感器安装存储器电路单元。电压比较控制电路单元选择从温度传感器输出的任何信号，并将选择的输出信号与参考电压进行比较。电压比较控制电路单元将比较结果连续地存储在存储器电路单元中。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式