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    • 1. 发明公开
    • Sulfuric acid-based copper plating solution for semi-additive and method of manufacturing printed wiring board
    • 用于半自动添加剂的基于硫酸的铜溶液和制造印刷线路板的方法
    • KR20100127170A
    • 2010-12-03
    • KR20100012696
    • 2010-02-11
    • MITSUI MINING & SMELTING CO
    • TANIGUCHI KAZUKONAKAJIMA DAISUKEDOBASHI MAKOTOYAGI TERUAKIISHIKAWA KOHEI
    • C25D3/38C25D7/00H05K3/12
    • C25D3/38H05K3/188
    • PURPOSE: A manufacturing method of sulfate system copper plating liquid for semi-additive and a print circuit board is provided to prevent the property change of a print circuit board due to the remaining metals by processing passivation treatment. CONSTITUTION: A sulfate system copper plating liquid for semi-additive is made from one of 3-mercapto-1-prophansulfon acid or bis(3-sulfopropyl) disulfide. A sprocket hole(2) is formed on both side of a insulation member(10) in a width direction. The sulfate system copper plating liquid for semi-additive includes 4 class ammonium salt polymer and chlorine. 4 class ammonium salt polymer has a ring structure. The copper density of the sulfate system copper plating liquid for semi-additive is 23~55g/L. The sulfate acid concentration of the sulfate system copper plating liquid for semi-additive is 50~250g/L. The concentration of 3-mercapto-1-prophansulfon acid or bis(3-sulfopropyl) disulfide is 8~12mg/L.
    • 目的:提供用于半添加剂和印刷电路板的硫酸盐体系电镀液的制造方法,以通过处理钝化处理来防止由于剩余的金属而导致的印刷电路板的性能变化。 构成:用于半添加剂的硫酸盐系镀铜液由3-巯基-1-前磺酸或双(3-磺丙基)二硫化物之一制成。 在绝缘构件(10)的宽度方向的两侧形成有链轮孔(2)。 用于半添加剂的硫酸盐系镀铜液包括4类铵盐聚合物和氯。 4级铵盐聚合物具有环结构。 用于半添加剂的硫酸盐系镀铜液的铜密度为23〜55g / L。 用于半添加剂的硫酸盐系镀铜液的硫酸浓度为50〜250g / L。 3-巯基-1-前磺酸或双(3-磺丙基)二硫化物的浓度为8〜12mg / L。
    • 2. 发明公开
    • Nickel particle coated with nickel hydroxide and producing the same
    • 含镍氢氧化镍的镍颗粒和生产它们
    • KR20100088528A
    • 2010-08-09
    • KR20100002983
    • 2010-01-13
    • MITSUI MINING & SMELTING CO
    • MUKUNO TAKASHIKOHIRA TOSHIHIRO
    • B22F1/02B22F9/18
    • B22F9/18B22F1/02
    • PURPOSE: Hydroxide nickel coated nickel particles and a preparing method thereof are provided to prevent the increase of sintering temperature or electric resistance even when forming an electrode film by reducing and sintering hydroxide nickel coated nickel particles without removing a hydroxide nickel layer. CONSTITUTION: Hydroxide nickel coated nickel particles(10) are coated on the surface with hydroxide nickel. The hydroxide nickel is combined to be removable by an external force, such as a media mill. The average diameter of first particle is 5~500nm. A method for preparing the hydroxide nickel coated nickel particles(20) comprises the steps of interrupting the reduction of hydroxide nickel particles to form a plurality of micro nickel particles within the hydroxide nickel particles and removing the hydroxide nickel particles to obtain a plurality of hydroxide nickel particles having a hydroxide nickel layer on the surface.
    • 目的:提供氢氧化镍涂覆的镍颗粒及其制备方法,以防止即使在不除去氢氧化镍层的情况下还原和烧结氢氧化镍涂覆的镍颗粒来形成电极膜时也增加烧结温度或电阻。 构成:用氢氧化镍将氢氧化镍镀镍的镍颗粒(10)涂覆在表面上。 氢氧化镍被组合以通过外力来除去,例如介质磨。 第一颗粒的平均直径为5〜500nm。 制备氢氧化镍镀镍的镍颗粒(20)的方法包括以下步骤:中断氢氧化镍颗粒的还原以在氢氧化镍颗粒内形成多个微镍颗粒并除去氢氧化镍颗粒以获得多个氢氧化镍 在表面具有氢氧化镍层的颗粒。
    • 6. 发明公开
    • ITO SINTERED BODY AND ITO SPUTTERING TARGET
    • ITO烧结体和ITO溅射靶
    • KR20070080575A
    • 2007-08-10
    • KR20070012229
    • 2007-02-06
    • MITSUI MINING & SMELTING CO
    • TAKAHASHI SEIICHIROKIYOTO JUNICHIHAYASHI HIROMITSU
    • C23C14/34
    • An ITO sputtering target material and an ITO sputtering target by which a film of a low resistance is obtained although an oxygen partial pressure is changed to some degree during sputtering, and an ITO sintered body suitable for the ITO sputtering target material and the ITO sputtering target are provided. An ITO(Indium-Tin-Oxide) sintered body is characterized in that a mean value of maximum diameters of fine grains existing in a In2O3 parent phase that is a principal grain is less than 0.2 mum. An ITO(Indium-Tin-Oxide) sintered body is characterized in that a mean value of widths of fine grain free zones from grain boundaries of a In2O3 parent phase that is a principal grain is less than 0.3 mum. An ITO(Indium-Tin-Oxide) sintered body(10) is characterized in that a mean value of maximum diameters of fine grains(2) existing in a In2O3 parent phase(1) that is a principal grain is less than 0.2 mum, and a mean value of widths of fine grain free zones(5) from grain boundaries(3) of the In2O3 parent phase is less than 0.3 mum. The ITO sintered body is a sputtering target material. An ITO sputtering target comprises the ITO sintered body, and a backing plate.
    • ITO溅射靶材料和ITO溅射靶,尽管在溅射期间氧分压发生一定程度的变化,但是通过该ITO溅射靶可以获得低电阻的膜,以及适用于ITO溅射靶材料和ITO溅射靶的ITO烧结体 被提供。 ITO(铟锡氧化物)烧结体的特征在于,作为主晶粒的In2O3母相中存在的细晶粒的最大直径的平均值小于0.2μm。 ITO(Indium-Tin-Oxide)烧结体的特征在于,作为主晶粒的In 2 O 3亲本相的晶界的无细晶粒宽度的平均值小于0.3μm。 ITO(铟锡氧化物)烧结体(10)的特征在于,作为主晶粒的In2O3母相(1)中存在的细晶粒(2)的最大直径的平均值小于0.2μm, 并且来自In2O3母相的晶界(3)的无细小颗粒区域(5)的宽度的平均值小于0.3μm。 ITO烧结体是溅射靶材料。 ITO溅射靶包括ITO烧结体和背板。