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    • 1. 发明授权
    • Probe block for the semiconductor wafer
    • 用于半导体波形的探测块
    • KR100995978B1
    • 2010-11-22
    • KR20100050456
    • 2010-05-28
    • KTL CO LTD
    • KANG SUNG WOONG
    • H01L21/66
    • G01R1/07307G01R1/06716G01R31/2601
    • PURPOSE: A probe block for a semiconductor wafer is provided to improve the reliability of replacement by maintaining the contact state between probes and the electrode pads of a circuit substrate. CONSTITUTION: A penetration part(11) is formed at the center of a circuit board(10). A lower frame(20) has an opening unit(21) on the top, and the bottom side, and one side. A guide plate(40) includes a plurality of upper slots and lower slots which are equally spaced from each other. A probe(50) has an upper piece and a lower piece. A cover is combined in the open side of the guide plate.
    • 目的:提供用于半导体晶片的探针块,以通过保持探针与电路基板的电极焊盘之间的接触状态来提高替换的可靠性。 构成:在电路板(10)的中心形成穿透部(11)。 下框架(20)在顶部和底侧以及一侧上具有开口单元(21)。 引导板(40)包括彼此相等间隔的多个上槽和下槽。 探针(50)具有上部件和下部件。 在导板的开口侧组合盖。
    • 2. 发明授权
    • Probe block for the lcd
    • 液晶显示器的探头块
    • KR100999864B1
    • 2010-12-09
    • KR20100064600
    • 2010-07-06
    • KTL CO LTD
    • KANG SUNG WOONG
    • G01R1/073
    • PURPOSE: A probe block for inspecting a heterogeneous liquid crystal display panel is provided to efficiently use equipment by simultaneously inspecting different panels using one inspection device. CONSTITUTION: A first probe and a second probe(60) connect a first flexible board and a second flexible board with target panels one by one. A first guide plate(20) elastically supports the first probe. A second upper guide plate(40) and a second lower guide plate(50) elastically support a second probe on the upper and lower sides of the first guide plate. A slit and a hooking protrusion guide the horizontal protrusion(33) of the first probe to be contacted with the first flexible board on the upper side of the first guide plate. A slit for a probe guides the contact between the first probe and a first panel.
    • 目的:提供用于检查异质液晶显示面板的探针块,通过使用一个检测装置同时检查不同的面板来有效地使用设备。 规定:第一个探针和第二个探针(60)将第一个柔性板和第二个柔性板与目标板逐一连接。 第一引导板(20)弹性地支撑第一探针。 第二上引导板(40)和第二下引导板(50)在第一引导板的上侧和下侧上弹性地支撑第二探头。 狭缝和钩挂突起引导第一探针的水平突起(33)与第一引导板的上侧上的第一柔性板接触。 用于探针的狭缝引导第一探针和第一面板之间的接触。
    • 3. 发明授权
    • Probe block for the lcd
    • 液晶显示器的探头块
    • KR100999862B1
    • 2010-12-09
    • KR20100036354
    • 2010-04-20
    • KTL CO LTD
    • KANG SUNG WOONG
    • G01R1/073G02F1/13
    • PURPOSE: A probe block for inspecting a liquid crystal display is provided to prevent the probe block from being entirely replaced by directly replacing a probe in a field. CONSTITUTION: A circuit board(11) is connected to an inspection device on the upper side of a block body(10). A flexible board(12) is connected to the circuit board on the front of the lower side of the block body. A guide plate(20) fixes a plurality of probes(30) on the rear of the lower side of a block body. A probe is contacted with each signal terminal of a display panel one by one.
    • 目的:提供用于检查液晶显示器的探针块,以防止通过直接更换现场探头来完全更换探头块。 构成:电路板(11)与块体(10)的上侧的检查装置连接。 柔性板(12)在块体的下侧的前面连接到电路板。 引导板(20)将多个探针(30)固定在块体的下侧的后部。 探针与显示面板的每个信号端子逐一接触。