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1. 发明授权

KR101178795B1 Temperature worst case test system and anti-freeze window included wherein 有权
标题翻译：温度最差的情况测试系统和防冻窗包括在
公开(公告)号：KR101178795B1
公开(公告)日：2012-08-31
申请号：KR20120038222
申请日：2012-04-13
申请人： ISOLUTION CO LTD
发明人： KANG SUNG KWAN , CHA MIN HO
IPC分类号： G01R31/28 , G03B43/00
摘要： PURPOSE: A temperature bad condition test system and a frost blocking window included in the same are provided to test the performance of an electronic appliance under the temperature of bad conditions such as high temperature or low temperature. CONSTITUTION: A chamber controls temperature of inside. A frost blocking window is installed at one side of the chamber. The frost blocking window comprises a main chassis(210), a penetrated hole(215), a front glass(221), and a back glass(223). The main chassis forms a window frame. A first coupling part and a second coupling part are formed in the inner surface of the main chassis. The front glass and the back glass are fixed to the first coupling part and the second coupling part of the main chassis while maintaining regular interval each other.
摘要翻译：目的：提供一个温度不良状况测试系统和包含在其中的防冻窗，用于在不良条件如高温或低温的温度下测试电子设备的性能。规定：室内控制温度。在室的一侧安装防冻窗。防冻窗包括主底盘（210），穿透孔（215），前玻璃（221）和后玻璃（223）。主机架形成一个窗框。第一联接部分和第二联接部分形成在主机架的内表面中。前玻璃和后玻璃固定到主机架的第一联接部分和第二联接部分，同时保持彼此间隔。

2. 发明授权

KR101178796B1 Test chart set and test system for testing wide dynamic range in digital camera device 有权
标题翻译：用于测试数字摄像机中宽动态范围的测试仪表和测试系统
公开(公告)号：KR101178796B1
公开(公告)日：2012-08-31
申请号：KR20120027765
申请日：2012-03-19
申请人： ISOLUTION CO LTD
发明人： KANG SUNG KWAN
IPC分类号： G01J3/52
摘要： PURPOSE: A test chart set and a test system for testing a wide-area backlight correcting function of a digital photographing device are provided to perform a test of a wide-area backlight correcting function of an image photographing device in a quite bright surrounding background such as a case being instantaneously exposed to strong and bright lights. CONSTITUTION: A test chart set for testing a wide-area backlight correcting function of a digital photographing device comprises a normal test chart(100), a high brightness test chart(200), and a low brightness test chart(300). The normal test chart comprises a normal basis and normal annulus patterns. The normal basis is colored with colors of medium-brightness. A plurality of normal annulus patterns in which colors having gradual brightness are colored is arranged in an annulus shape in the normal annulus pattern. The high brightness test chart comprises a high brightness basis and high brightness annulus patterns. The high brightness basis is colored with colors having the brightness brighter than the medium-brightness. The low brightness test chart comprises a low brightness basis and low brightness annulus patterns.
摘要翻译：目的：提供用于测试数字拍摄装置的广域背光校正功能的测试图表和测试系统，以在相当明亮的周围背景中执行图像拍摄装置的广域背光校正功能的测试，例如因为瞬间暴露在强光明亮的情况下。构成：用于测试数字拍摄装置的广域背光校正功能的测试图表包括正常测试图（100），高亮度测试图（200）和低亮度测试图（300）。正常测试图包括正常的基础和正常的环状图案。正常的基础是以中等亮度的颜色着色。以逐渐亮度的颜色着色的多个正常环形图案以正常环形图案中的环形形状布置。高亮度测试图包括高亮度基准和高亮度环形图案。高亮度的基础是以比中等亮度更亮的颜色的颜色着色。低亮度测试图包括低亮度基础和低亮度环形图案。

3. 发明授权

KR101138221B1 Camera test system for testing shading and color balancing 有权
标题翻译：用于测试着色和彩色平衡的相机测试系统
公开(公告)号：KR101138221B1
公开(公告)日：2012-04-24
申请号：KR20120010569
申请日：2012-02-02
申请人： ISOLUTION CO LTD
发明人： KANG SUNG KWAN
IPC分类号： G03B43/00 , G03B15/03 , H04N17/00
CPC分类号： G03B43/00 , G03B15/05 , G03B2215/055 , G03B2215/056 , H04N5/2254 , H04N5/2256
摘要： PURPOSE: A camera test system for testing shading and color balancing is provided to enable test at various color temperatures and angels like practical circumstance using a color temperature filter and a lamp. CONSTITUTION: A camera test system for testing shading and color balancing comprises an integrated booth(100), an irradiation device(300), and a setter lens(SLZ). The integrated booth forms a dark room inside. The irradiation device is installed inside the integrated booth. The irradiation device comprises a color temperature filter(FTC) and a lamp(LP). The color temperature filter transmits the light ray of specific color temperature. The lamp emits the light ray of the specific color through the color temperature filter.
摘要翻译：目的：提供用于测试阴影和色彩平衡的相机测试系统，以便在各种色温和天使下使用色温滤光片和灯进行实际测试。规定：用于测试阴影和颜色平衡的照相机测试系统包括综合展位（100），照射装置（300）和固定镜（SLZ）。综合展位内设黑暗的房间。照射装置安装在综合展位内。照射装置包括色温滤光器（FTC）和灯（LP）。色温滤光片透射特定色温的光线。灯通过色温过滤器发出特定颜色的光线。

4. 发明授权

KR101186972B1 Image comparison type semiconduct package test system having inner vision camera 有权
标题翻译：具有内在视觉相机的图像比较型半导体封装测试系统
公开(公告)号：KR101186972B1
公开(公告)日：2012-09-28
申请号：KR20120046627
申请日：2012-05-03
申请人： ISOLUTION CO LTD , ANY SOL
发明人： SON SE HYUN , KIM JONG HYUN
IPC分类号： G01R31/26 , G01B11/24
摘要： PURPOSE: A semiconductor package test system is provided to effectively check the presence of a semiconductor package in a test socket. CONSTITUTION: A semiconductor package test system comprises a test block(100), a photographing block(200), an image storing block(300), and an analyzing and determining block(400). The test block comprises a test tray and a package setting unit. The test tray comprises a plurality of sockets in which a semiconductor package is accepted. The package setting unit loads the semiconductor package in the test tray. The test block unloads the semiconductor package from the test tray. The photographing block takes a picture of the plurality of sockets of the test tray and creates a photographing image. The image storing block stores a reference image. The analyzing and determining block compares similarity of the reference image and the photographing image and creates existence information showing accepting state of the semiconductor package in a test socket. [Reference numerals] (100) Test block; (110) Test tray; (120) Package setting unit; (200) Photographing block; (300) Image storing block; (400) Analyzing and determining block; (500) Feedback block
摘要翻译：目的：提供半导体封装测试系统，以有效地检查测试插座中半导体封装的存在。构成：包括测试块（100），拍摄块（200），图像存储块（300）和分析和确定块（400）的半导体封装测试系统。测试块包括测试托盘和包装设置单元。测试托盘包括多个插座，其中半导体封装被接受。封装设置单元将半导体封装加载到测试托盘中。测试块从测试托盘卸载半导体封装。拍摄块拍摄测试托盘的多个插座的图片，并创建拍摄图像。图像存储块存储参考图像。分析和确定块比较参考图像和拍摄图像的相似性，并创建表示测试插座中的半导体封装的接受状态的存在信息。（附图标记）（100）试验块; （110）试盘; （120）包装设定单位; （200）摄影块; （300）图像存储块; （400）分析和确定块; （500）反馈块

5. 发明授权

KR101183197B1 Display test system with easily performing temperature worst case test 有权
标题翻译：显示测试系统，轻松执行温度最差的测试
公开(公告)号：KR101183197B1
公开(公告)日：2012-09-14
申请号：KR20120040795
申请日：2012-04-19
申请人： ISOLUTION CO LTD
发明人： KANG SUNG KWAN
IPC分类号： G01N17/00 , G01M11/00
CPC分类号： G01N17/002 , G01M11/00 , G09G3/006
摘要： PURPOSE: A display test system in which an unfavorable temperature condition test is facilitated is provided to perform an unfavorable temperature condition test of a display in the state that a test operator is not exposed to an extreme temperature environment. CONSTITUTION: A display test system in which an unfavorable temperature condition test is facilitated comprises a chamber(100), a selectively filtering membrane(200), a measuring device(300). Regulating temperature in the inside of the chamber is possible and a display setting member(110) is installed in the inside of the chamber. The display setting member sets a test display(TDS) being tested, thereby controlling the test display to generate images. The selectively filtering membrane is formed in one side of the chamber and a plurality of transmitting windows(WTR) are arranged in the selectively filtering membrane. The plurality of penetration windows transmits the images of the test display to the outside of the chamber. The measuring device is installed in the outside of the chamber and measures the images of the test play being transmitted through the transmitting window of the selectively filtering membrane.
摘要翻译：目的：提供便于进行不利温度条件试验的显示测试系统，以在测试操作者不暴露于极端温度环境的状态下对显示器进行不利的温度条件测试。构成：容易进行不利温度条件试验的显示测试系统包括室（100），选择性过滤膜（200），测量装置（300）。调节室内的温度是可能的，并且显示设定部件（110）安装在室的内部。显示设定部件设定被测试的测试显示（TDS），从而控制测试显示以产生图像。选择性过滤膜形成在室的一侧，并且多个透光窗（WTR）布置在选择性滤膜中。多个穿透窗口将测试显示器的图像发送到腔室的外部。测量装置安装在腔室的外部，并测量通过选择性过滤膜的透射窗口传输的测试图像的图像。

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