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    • 7. 发明专利
    • Ultraviolet erasable semiconductor memory
    • ULTRAVIOLET可擦除半导体存储器
    • JP2005243127A
    • 2005-09-08
    • JP2004050362
    • 2004-02-25
    • Sanyo Electric Co Ltd三洋電機株式会社
    • KUMAGAI YUKIHISA
    • G11C16/04G11C5/00G11C8/00G11C11/34G11C11/42G11C16/00G11C16/06G11C16/18H01L21/8247H01L27/10H01L27/115H01L29/78H01L29/788H01L29/792
    • G11C16/18G11C8/00
    • PROBLEM TO BE SOLVED: To solve the problem that, in constitution, such as that an EPROM memory cell is equipped with two MOSFETs and data is read by detecting the difference of currents of these MOSFETs, when the data is erased with irradiation of ultraviolet rays, the output of a differential amplifier becomes uncertainty and confirmation of an initialization state is not easy. SOLUTION: In this ultraviolet erasable semiconductor memory, the channel width W A of a MOSFET of one side of the two MOSFETs constituting the memory cell is formed narrower than the channel width W B of the MOSFET of another side. As a result, the current value I HA of the data signal of the MOSFET having the channel width W A becomes smaller than the current value I HB of the MOSFET having the channel width W B in the initialization state in which the memory is irradiated with the ultraviole rays. Thus, the output of the differential amplifier is decided according to the magnitude relation of currents being I HA HB and a data value "0" is defined. On the other hand, in writing of data "1", the MOSFET is turned in an OFF state by by raising a threshold Vt while pouring charges into the floating gate electrode 36 of the MOSFET having the channel width W B . COPYRIGHT: (C)2005,JPO&NCIPI
    • 解决的问题为了解决在EPROM存储单元配置有两个MOSFET的结构中,通过检测这些MOSFET的电流差来读取数据的问题,当数据被照射时被擦除 的紫外线,差分放大器的输出变得不确定,并且初始化状态的确认是不容易的。 解决方案:在该紫外线可擦除半导体存储器中,构成存储单元的两个MOSFET的一侧的MOSFET的沟道宽度W A 形成为窄于沟道宽度W SB 另一侧的MOSFET的。 结果,具有沟道宽度W A 的MOSFET的数据信号的电流值I HA 变得小于当前值I SB SB >在存储器被紫外线照射的初始化状态下具有通道宽度W B 的MOSFET。 因此,根据电流的大小关系决定差分放大器的输出,并且定义数据值“0”。 另一方面,在写入数据“1”时,通过在将电荷注入具有沟道宽度W B的MOSFET的浮置栅电极36中的同时提高阈值Vt来将MOSFET转变为截止状态, SB>。 版权所有(C)2005,JPO&NCIPI