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1. 发明专利

JP5127462B2 Nucleic acid base analysis method in a single molecule 有权
公开(公告)号：JP5127462B2
公开(公告)日：2013-01-23
申请号：JP2007547847
申请日：2005-12-28
申请人：独立行政法人科学技術振興機構
发明人：喜夫梅澤 , 敬人大城
IPC分类号： G01Q60/10 , C12Q1/68 , G01Q60/16 , G01Q80/00
CPC分类号： G01Q60/16 , C12Q1/6816 , C12Q1/6869 , G01Q70/18 , Y10T436/143333 , C12Q2565/601
摘要： A method is herein presented for analyzing nucleobases on a single molecular basis (a single molecule detection), which comprises scanning a molecular tip chemically modified with the complementary nucleobase on the nucleobases, and measuring the tunneling currents between the scanned nucleobases and the molecular tips with scanning tunneling microscopy.

2. 发明专利

JP4940392B2 Method for producing a carbon nano structure material 有权
公开(公告)号：JP4940392B2
公开(公告)日：2012-05-30
申请号：JP2005064060
申请日：2005-03-08
申请人：オリンパス株式会社 , 国立大学法人名古屋工業大学 , 株式会社アルバック
发明人：正志北澤 , 村上　　裕彦 , 眞幸種村 , 竜弘野末 , 阿川　　義昭
IPC分类号： B82B3/00 , B82Y30/00 , B82Y40/00 , C01B31/02 , G01Q60/16 , G01Q60/38 , G01Q70/12 , H01J31/12
摘要： PROBLEM TO BE SOLVED: To provide a method of manufacturing a carbon nano-structural material, irradiating a substrate where a carbon coating is formed on the surface thereof with ions to make a carbon nano-structural material to grow on the tops of micro-projections formed on the surface of the substrate one by one, whereby when the nano-structural materials are obtained separately in the non-dense state on the substrate, a suitable carbon coating to be formed on the surface of the substrate is selected so that the nano-structural materials can be made to grow in the non-dense state by irradiation with ions with a low current density. SOLUTION: A solution of acrylonitrile polymer is coated as an organic polymer solution on the surface of the substrate, subsequently the substrate is burnt at a temperature of 200 to 400°C in an atmosphere containing oxygen to perform preliminary oxidation treatment for the coating of acrylonitrile polymer, and subsequently the substrate is burnt at a temperature of 1000°C in an inert atmosphere to perform the carbonizing treatment for the coating, thereby forming a carbon coating on the surface of the substrate. When the ion irradiation is performed on the surface of the substrate with 70 μA/cm 2 for 100 minutes (embodiment 1), carbon nano-fibers can be obtained in the separate state. COPYRIGHT: (C)2006,JPO&NCIPI

3. 发明专利

JP4681939B2 Method for producing a nanostructure 有权
公开(公告)号：JP4681939B2
公开(公告)日：2011-05-11
申请号：JP2005151340
申请日：2005-05-24
申请人：キヤノン株式会社
发明人：滋市原 , 達也斉藤 , 透田
IPC分类号： B82B3/00 , B29C33/38 , B29C59/02 , B81B1/00 , B81C1/00 , G01Q60/16 , G01Q60/38 , G01Q70/12 , G01Q70/16 , H01J1/304 , H01J29/04

4. 发明专利

JP4076223B2 Joining method of the nanotubes to the Spm probe apex 有权
公开(公告)号：JP4076223B2
公开(公告)日：2008-04-16
申请号：JP2003207652
申请日：2003-08-15
申请人：独立行政法人科学技術振興機構
发明人：則和有馬 , 智彦杉山 , 昭仁松室
IPC分类号： G01Q60/16 , G01Q60/38 , G01Q70/12 , G01Q70/16 , G01Q90/00

5. 发明专利

JP2008026281A Microprobe 审中-公开
标题翻译：微探针
公开(公告)号：JP2008026281A
公开(公告)日：2008-02-07
申请号：JP2006202474
申请日：2006-07-25
申请人： Sumitomo Electric Ind Ltd , 住友電気工業株式会社
发明人： NISHIBAYASHI YOSHIKI , TATSUMI NATSUO , IMAI TAKAHIRO
IPC分类号： G01Q60/16 , G01Q60/38 , G01Q60/40 , G01Q70/00 , G01Q70/10
摘要： PROBLEM TO BE SOLVED: To provide a microprobe having a sharp tip, and enhancing a strength.
SOLUTION: The microprobe comprises: a base 4; an intermediate layer 6 provided on the base 4; and a probe 8 provided on the intermediate layer 6 and formed from diamond. The probe 8 has a root 10 connected to the intermediate layer 6, and the sharp tip 12. A tip diameter D of the probe 8 is 0.5 μm or less. A first aspect ratio T1 of a width L2 of a cross section of the probe 8 at a predetermined distance from the tip 12 of the probe 8 divided by a length L1 from the tip 12 to the cross section is 0.3 or more. A second aspect ratio T2 of a width L4 at the root 10 of the probe 8 divided by a length L3 from the tip 12 of the probe 8 to the root 10 is 0.36 or more.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供具有尖尖的微探针并提高强度。解决方案：微探针包括：基座4; 设置在基座4上的中间层6; 以及设置在中间层6上并由金刚石形成的探针8。探头8具有与中间层6连接的根部10以及尖端12.探针8的尖端直径D为0.5μm以下。探针8的与探针8的尖端12相隔预定距离的横截面的宽度L2的第一宽高比T1除以从尖端12到横截面的长度L1为0.3以上。探针8的根部10处的宽度L4除以从探针8的尖端12到根部10的长度L3的第二宽高比T2为0.36以上。版权所有（C）2008，JPO＆INPIT

6. 发明专利

JP4032932B2 Sample surface measuring device 有权
公开(公告)号：JP4032932B2
公开(公告)日：2008-01-16
申请号：JP2002324972
申请日：2002-11-08
申请人：カシオ計算機株式会社
发明人：道也山口
IPC分类号： G01B7/34 , G01N23/225 , G01N23/227 , G01Q30/02 , G01Q60/02 , G01Q60/10 , G01Q60/16
摘要： PROBLEM TO BE SOLVED: To measure irregularities on the sample surface and the kind of an element constituting a sample by one device. SOLUTION: When measuring the irregularities on the sample 1 surface, the tip part of a probe 3 provided movably into/from the inside of a cylindrical extraction electrode 4 is projected from the lead electrode 4, and the projected tip part of the probe 3 is drawn close to the sample 1 surface, and a tunnel current between them is detected, to thereby measure the irregularities on the sample 1 surface. On the other hand, When measuring the kind of the element constituting the sample 1, the whole probe 3 is stored in the lead electrode 4, and an extraction voltage of about 3.5-4.5 kV is applied between the probe 3 and the lead electrode 4 from an extraction voltage application circuit 13, and the sample 1 surface is irradiated with electron beams emitted by field emission from the tip part of the probe 3, and a characteristic X-ray emitted from the sample 1 surface is detected, to thereby measure the kind of the element constituting the sample 1 based on the detection result. COPYRIGHT: (C)2004,JPO

7. 发明专利

JP2007271358A Probe holder and scanning probe microscope 审中-公开
标题翻译：探测器和扫描探针显微镜
公开(公告)号：JP2007271358A
公开(公告)日：2007-10-18
申请号：JP2006095150
申请日：2006-03-30
申请人： Sii Nanotechnology Inc , エスアイアイ・ナノテクノロジー株式会社
发明人： KITAJIMA SHU , SHIGENO MASAJI , NOSAKA NAOKATSU
IPC分类号： G01B21/30 , G01Q60/16 , G01Q60/22 , G01Q60/38 , G01Q70/02
摘要： PROBLEM TO BE SOLVED: To provide a probe holder for performing probe change simply and in a short time without troubling a worker and being applicable also to a small-sized scanning probe microscope.
SOLUTION: This probe holder 3 is disposed opposite to a specimen S and used for thereon fixing a plurality of probes 2 each having a probe 2b on an end of a lever part 2a with the base end side of the lever part supported in a cantilevered state on a body part 2c. This probe holder 3 is equipped with a fixation plate 10 comprising an opposite surface 10a standing opposite to a specimen surface S1 for fixing the plurality of probes severally removably on the opposite surface via the body part, a holder body 11 for movably supporting the fixation plate, and a movable means 12 for moving the fixation plate while positioning any selected probe among the plurality of probes at an observation position P.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：为了简单且短时间地提供用于执行探针变化的探针保持器，而不会使工作人员困扰，并且也适用于小型扫描探针显微镜。解决方案：该探针支架3与样本S相对设置，用于将多个探针2固定在杠杆部分2a的端部上，探针2b在杠杆部分2a的端部固定，杆部的基端侧被支撑在身体部分2c上的悬臂状态。该探针支架3配备有固定板10，固定板10包括与试样表面S1相对的相对表面10a，用于经由主体部分将多个探头分别可拆卸地固定在相对的表面上;保持器主体11，用于可移动地支撑固定板，以及可移动装置12，用于在观察位置P的多个探针之间定位任何选择的探针的同时移动固定板。（C）2008，JPO＆INPIT

8. 发明专利

JP3950610B2 Scanning probe microscope 有权
公开(公告)号：JP3950610B2
公开(公告)日：2007-08-01
申请号：JP2000014814
申请日：2000-01-24
申请人：日本電子株式会社
发明人：槻正志岩
IPC分类号： G01Q60/10 , G01Q60/16 , G01Q60/24 , G01Q60/38 , G01Q70/04 , G01Q90/00

9. 发明专利

JP2006189276A Monoatomic chip and its preparation method 审中-公开
标题翻译：单体芯片及其制备方法
公开(公告)号：JP2006189276A
公开(公告)日：2006-07-20
申请号：JP2005000194
申请日：2005-01-04
申请人： Academia Sinica , 中央研究院
发明人： KO EIKETSU , KAKU KOGI , TEI TENSA , FU SOI
IPC分类号： G01Q60/16 , H01J1/304 , H01J9/02
摘要： PROBLEM TO BE SOLVED: To provide a simple and inexpensive monoatomic chip, and to provide its preparation method. SOLUTION: The monoatomic chip is prepared by a step for preparing a metal chip 1, a step for washing the metal chip 1, a step for applying a small amount of a noble metal to the metal chip 1 by electroplating and a step for forming a pyramidal structure terminated by a small number of atoms to the apex of the metal chip 1. COPYRIGHT: (C)2006,JPO&NCIPI

10. 发明专利

JP3753701B2 Production method of a scanning probe microscope tip 有权
公开(公告)号：JP3753701B2
公开(公告)日：2006-03-08
申请号：JP2003074375
申请日：2003-03-18
申请人：独立行政法人科学技術振興機構
发明人：正彦富取 , 豊子新井
IPC分类号： G01Q60/16 , G01Q60/38 , G01Q70/14 , G01Q70/16

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