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    • 3. 发明专利
    • Memory circuit
    • 存储器电路
    • JPS59175099A
    • 1984-10-03
    • JP4823783
    • 1983-03-23
    • Nec Corp
    • ISHIKAWA ATSUSHI
    • G01R31/28G06F11/267G11C29/00G11C29/12H01L21/822H01L27/04
    • G06F11/267G11C29/003
    • PURPOSE:To attain the formation of a scan path to a memory circuit and at the same time to realize the test of an adjacent circuit by supplying the shift data corresponding to a digit line of the first stage from outside and using other shift data as the output of an FF of a preceding stage. CONSTITUTION:A switching circuit 10 which accepts the reading data, the shift the from a corresponding digit line and the input data given from outside in response to the memory reading mode, the shift mode and the test mode which are alternatively designated from outside. FF20-2N whose outputs are supplied to outside based on the switching output are provided to each digit line together with said circuit 10. Then the shift data corresponding to the digit line of the first stage is supplied from outside, and other shift data are outputted from FFs of the preceding stages.
    • 目的:为了获得形成到存储器电路的扫描路径,并且同时通过从外部提供对应于第一级的数字线的移位数据并且使用其他移位数据作为相同的电路来实现相邻电路的测试 输出前级的FF。 构成:响应于从外部交替指定的存储器读取模式,移位模式和测试模式,接收读取数据,从相应的数字行移位和从外部给出的输入数据的开关电路10。 FF20-2N的输出根据切换输出提供给外部,与所述电路10一起提供给每个数字线。然后,从外部提供对应于第一级的数字线的移位数据,并输出其他移位数据 从前几个阶段的FF。
    • 4. 发明专利
    • Method for testing magnetic bubble element
    • 用于测试磁性泡沫元件的方法
    • JPS59128463A
    • 1984-07-24
    • JP380583
    • 1983-01-13
    • Nec Corp
    • YAMADA HACHIROU
    • G01R31/28G01R33/12G11C29/00G11C29/04G11C29/56
    • G11C29/003
    • PURPOSE:To attain to enhance the guarantee of the reliability of memory data, by performing disturbance pulse applying sequence prior to reading data. CONSTITUTION:A controller 407 performs writing sequence S1 for writing test data DT in a magnetic bubble element 401 and stores the same therein and subsequently performs disturbance pulse applying sequence S2 for applying a disturbance pulse ISN having amplitude smaller than that of the current pulse in a tolerant variation range to the element 401 in which the data DT is written. In addition, the controller 407 reads the memory data from the element 401 to which the disturbance pulse is applied as reading data and perform a inspection sequence S3 for judging the quality of the element 401 by such a fact that this reading data DR is coincided with the test data DT or not.
    • 目的:通过在读取数据之前执行干扰脉冲施加顺序来提高对存储器数据的可靠性的保证。 构成:控制器407执行用于将测试数据DT写入磁性气泡元件401中的写入序列S1,并将其存储在其中,并且随后执行干扰脉冲施加序列S2,以施加具有小于当前脉冲幅度的振幅的干扰脉冲ISN 容许变化范围到其中写入数据DT的元件401。 此外,控制器407从施加有干扰脉冲的元件401读取存储器数据作为读取数据,并且执行用于通过这样的事实来判断元件401的质量的检查顺序S3:这个读取数据DR与 测试数据DT或不。
    • 5. 发明专利
    • Testing of magnetic bubble element
    • 磁性元件的测试
    • JPS5960270A
    • 1984-04-06
    • JP17073682
    • 1982-09-29
    • Nec Corp
    • YAMADA HACHIROU
    • G01R31/28G01R31/30G01R33/12G11C29/00G11C29/04G11C29/50G11C29/56
    • G11C29/50G11C29/003
    • PURPOSE:To ensure a long-time reliability of a bubble memory by applying a rotary magnetic field containing a ringing to a magnetic bubble element at the start and stop thereof to enable a quick extraction of a semi-defective loop position. CONSTITUTION:A rotary magnetic field is generated with the application of alternate current 90 deg. in the phase difference to an X coil 101 and a Y coil 102 crossing at the right angle and a control circuit 107 controls the start and stop action of the rotary magnetic field and the phase of the coil current. When currect 201 is supplied to the coil 101 with a driver 103 while current 202 to the coil 102 with a driver 105, a rotary magnetic field 210 is applied to a bubble memory chip 108. A driver 104 supplies current 203 to the coil 101 while a driver 106 current 204 to the coil 102. As a result a composite current 205 flows through the coil 102 while a composite current 206 flows through the coil 102. Therefore, an inside-surface disturbed magnetic field is applied to a bubble element superposing a magnetic field 210 during the operation or stoppage of the bubble element.
    • 目的:通过在起动和停止时将含有振铃的旋转磁场施加到磁性气泡元件,以便快速提取半缺陷回路位置,以确保气泡存储器的长时间可靠性。 构成:通过应用交流电90度,产生旋转磁场。 在与直线交叉的X线圈101和Y线圈102的相位差中,控制电路107控制旋转磁场的起动和停止动作以及线圈电流的相位。 当使用驱动器103将线圈101提供给具有驱动器103的线圈101,同时使用驱动器105向线圈102提供电流202时,将旋转磁场210施加到气泡存储器芯片108.驱动器104向线圈101提供电流203,同时 驱动器106电流204到线圈102.结果,复合电流205流过线圈102,同时复合电流206流过线圈102.因此,内表面干扰的磁场被施加到重叠 在气泡元件的操作或停止期间的磁场210。
    • 6. 发明专利
    • Bias clear testing method of magnetic bubble memory device
    • 磁性气体存储器件的偏心测试方法
    • JPS5771566A
    • 1982-05-04
    • JP14654480
    • 1980-10-20
    • Fujitsu Ltd
    • IGARASHI KOUJISATOU YASUSHI
    • G11C11/14G11C29/00
    • G11C29/003
    • PURPOSE:To check by how many Oe of annihilation magnetic field a bubble which has been left in a defective place existing on a garnet thin film can be collapsed, by lowering a bias magnetic field to a strip magnetic field, and subsequently raising it to a collapse magnetic field. CONSTITUTION:A bias magnetic field 3 is lowered to a stripe magnetic field value 5 by decreasing it by 20-40 Oe from a set value, a stripelike magnetic domain is generated on a garnet thin film, and subsequently in case of returning to its original bias magnetic field set value once again, some of a lot of generated magnetic bubbles are caught by a defective place. Subsequently, when a magnetic field of 40-50 Oe is provided, magnetic bubbles which have not been annihilated by 40-50 Oe among those bubbles cauhgt by the defective place are left in the chip as residual bubbles. As for how to detect these residual bubbles, a chip and a device in which a bubble which has not annihilated by a constant magnetic field exist are checked by giving a rotary magnetic field, transferring the residual bubble along a transporting pattern, and detecting it by a bubble detector.
    • 目的:为了检查湮灭磁场中有多少Oe已经留在石榴石薄膜上存在的有缺陷的位置的气泡可能会被折叠,通过将偏磁场降低到带状磁场,随后将其提升到 崩溃磁场。 构成:通过将偏磁场3从设定值减小20-40Oe,将偏磁场3降低到条带磁场值5,在石榴石薄膜上产生带状磁畴,随后在返回原始状态的情况下 再次偏置磁场设定值,一些产生的磁性气泡被有缺陷的地方捕获。 随后,当提供40-50Oe的磁场时,由于缺陷处所产生的气泡中没有被40-50Oe消除的气泡留在芯片中作为残留气泡。 关于如何检测这些残留气泡,通过给出旋转磁场,沿着传送图案传送残留气泡,并且通过以下方式检测残留气泡,检查其中没有通过恒定磁场湮灭的气泡的芯片和装置 气泡检测器
    • 10. 发明专利
    • Test method for magnetic bubble memory element
    • 用于磁性气泡记忆元件的测试方法
    • JPS5782273A
    • 1982-05-22
    • JP15811680
    • 1980-11-12
    • Fujitsu Ltd
    • MORI YUTAKAHOSHI TOSHIHIRO
    • G11C11/14G11C29/00
    • G11C29/003
    • PURPOSE:To reduce the test time, by reversing a rotating magnetic field, and passing through an eraser and a divider and the like earlier, after transferring magnetic bubbles to an information storage loop. CONSTITUTION:In a test method of a magnetic bubble memory element 1, two or more bubbles are produced as a data region with a magnetic bubble generator 2, and after transferring this data region to an information storage loop 6 toward the direction shown in the arrow in solid lines, an external rotating magnetic field is stopped. Next, the external rotating magnetic field is rotated toward the inverse direction, and while the data region is transferred to the inverse direction shown in the arrow in dotted lines, the bubbles in the data region are selectively erased witn an eraser 3 and transfer is kept unitl the data region exceeds a divider 4 for stopping. Further, the rotating magnetic field is again rotated to the normal direction and the data region is transferred to a detector 5 via the divider 4 as shown in the arrow shown in one dotted chain line for the test of each function.
    • 目的:为了减少测试时间,通过反转旋转磁场,并在将磁气泡传送到信息存储回路之后,通过橡皮擦和分隔器等。 构成:在磁性气泡存储元件1的测试方法中,产生两个或更多个气泡作为具有磁性气泡生成器2的数据区域,并且在将该数据区域朝向箭头所示的方向传送到信息存储回路6之后 在实线中,停止外部旋转磁场。 接下来,外部旋转磁场朝向相反方向旋转,并且当数据区域以虚线转移到箭头所示的相反方向时,数据区域中的气泡被选择性地擦除,并且传送被保持 单位数据区域超过分隔线4停止。 此外,旋转磁场再次旋转到正常方向,并且数据区域经由分配器4被传送到检测器5,如一条点划线所示的箭头所示,用于每个功能的测试。