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    • 8. 发明专利
    • Measuring instrument of refractive index
    • 测量指标仪器
    • JPS60188832A
    • 1985-09-26
    • JP4621284
    • 1984-03-08
    • Mitsubishi Electric Corp
    • MIKAMI NOBORUSAWADA TAKAO
    • G01N21/41
    • G01N21/4133
    • PURPOSE:To measure min. polarization with high precision by providing an incident light generating means for polarizing the incident light of a material to be measured, and a means for converting the refracted emitting angle to a light quantity to detect it, and detecting the output on the basis of the oscillation frequency of the incident light. CONSTITUTION:The light from a light source 1 is advanced to an optical scanner 12 through a slit 2, and condensed to the material 4 to be measured from a concave mirror 13 at a fixed period. Next, if the light quantity is measured by a lockin amplifier 16 while intercepting a part of the emitted light by a knifeedge 10, since the incident light is refracted, polarized at the same period as an oscillator 14 and emitted with a varied emitting angle, only the light quantity variation of two times period of a scanner 12 is observed, and the component of the same period disappears. The incident light is oscillated, the emitting angle of the light corresponding thereto is converted to the light quantity to detect it, and the output is detected on the basis of the oscillating frequency of the incident light. In this way, highly precise measurement can be performed in the measurement of min. polarization angle.
    • 目的:测量最小 通过设置用于使待测材料的入射光偏振的入射光发生装置和用于将折射发射角转换为光量以检测其的装置,并且基于振荡来检测输出, 入射光的频率。 构成:来自光源1的光通过狭缝2前进到光学扫描器12,并且以固定的时间从凹面镜13冷凝到待测量的材料4。 接下来,如果光量由锁定放大器16测量,同时通过刀具10截取发射光的一部分,由于入射光被折射,在与振荡器14相同的周期被极化并以不同的发射角度发射, 仅观察到扫描仪12的两倍周期的光量变化,并且相同周期的分量消失。 入射光被振荡,将与其对应的光的发射角转换为光量以检测它,并且基于入射光的振荡频率来检测输出。 以这种方式,可以在最小的测量中进行高精度的测量。 极化角。